Excelitas offers a comprehensive range of PCO® scientific CMOS (sCMOS), CCD, and high-speed imaging cameras used across a broad array of applications including scientific and industrial research, automotive testing, quality control, and metrology. With state-of-the-art sCMOS and high-speed imaging technology, PCO cameras are world-renowned for advanced imaging capabilities with fast image acquisition, minimal readout noise, and a wide dynamic range.
pco.panda Series Features
- Ultra compact and optimized for fast, low-light imaging applications
- Innovative sCMOS technology captures even the smallest details in microscopy and life science applications
- Optional features such as low-light mode, light-sheet scanning mode, and double-shutter technology further expand imaging capabilities
pco.edge Series Features
- Suitable for precise low-light imaging and high quantum efficiency
- Temperature-stabilized, high-performance sCMOS image sensors
- Extremely low readout noise, a wide dynamic range, high frame rates, and high resolution over a large field of view
- Optional features are available to further expand imaging capabilities
pco.dimax Series Features
- Extremely high frame rates at resolutions up to 4 megapixels
- Outstanding light sensitivity, leading image quality, and excellent color reproduction
- Compact, lightweight, and rugged to withstand harsh and demanding conditions such as crash testing for onboard and off-board use
pco.pixelfly Series Features
- High-performance imaging designed to meet the demands of industrial applications
- Intuitive interfaces for power supply and data transfer
- Wide spectral range: typically between 400 nm and 1700 nm
- Seamlessly integrates into industrial systems
- Versatile for use in a wide range of applications from low-light imaging to industrial inspection, material analysis, and scientific research
Applications
- 3D metrology
- Bioluminescence
- Crash tests (automotive)
- High-speed bright-field ratio imaging
- Image intensifier imaging
- Industrial quality inspection
- Lightsheet fluorescence microscopy (LSFM)
- Particle tracking velocimetry (PTV)
- Photovoltaic inspection
- Spinning disk confocal microscopy
- Structured illumination microscopy (SIM)
- Total internal reflection microscopy
- Wafer inspection
- Digital pathology