i.MX RT1010, Consumer Datasheet by NXP USA Inc.

NXP Semiconductors
Data Sheet: Technical Data
Document Number: IMXRT1010CEC
Rev. 0, 09/2019
MIMXRT1011DAE5A
Package Information
Plastic Package
80-Pin LQFP, 12 x 12 mm, 0.5 mm pitch
Ordering Information
See Table 1 on page 4
NXP reserves the right to change the production detail specifications as may be required
to permit improvements in the design of its products.
1 i.MX RT1010 introduction
The i.MX RT1010 is a member of i.MX RT real-time
processor family based on the Arm® Cortex®-M7 core,
which operates at speeds up to 500 MHz to provide high
CPU performance and best real-time response.
The i.MX RT1010 processor has 128 KB on-chip RAM,
which can be flexibly configured as TCM or
general-purpose on-chip RAM. The i.MX RT1010
integrates advanced power management module with
DCDC and LDO that reduces complexity of external
power supply and simplifies power sequencing. The
i.MX RT1010 also provides various memory interfaces,
including Quad SPI, and a wide range of connectivity
interfaces, including UART, SPI, I2C, and USB; for
connecting peripherals including WLAN, Bluetooth™,
and GPS. The i.MX RT1010 also has rich audio features,
including SPDIF and I2S audio interface. Various analog
IP integration, including ADC, temperature sensor, and
etc.
i.MX RT1010 Crossover
Processors Data Sheet
for Consumer Products
1. i.MX RT1010 introduction . . . . . . . . . . . . . . . . . . . . . . . . 1
1.1. Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
1.2. Ordering information . . . . . . . . . . . . . . . . . . . . . . . 4
2. Architectural overview . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
2.1. Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
3. Modules list . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
3.1. Special signal considerations . . . . . . . . . . . . . . . 12
3.2. Recommended connections for unused analog
interfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
4. Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . 15
4.1. Chip-level conditions . . . . . . . . . . . . . . . . . . . . . . 15
4.2. System power and clocks . . . . . . . . . . . . . . . . . . 21
4.3. I/O parameters . . . . . . . . . . . . . . . . . . . . . . . . . . 27
4.4. System modules . . . . . . . . . . . . . . . . . . . . . . . . . 30
4.5. External memory interface . . . . . . . . . . . . . . . . . 34
4.6. Audio . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
4.7. Analog . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
4.8. Communication interfaces . . . . . . . . . . . . . . . . . . 49
4.9. Timers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
5. Boot mode configuration . . . . . . . . . . . . . . . . . . . . . . . . 55
5.1. Boot mode configuration pins . . . . . . . . . . . . . . . 55
5.2. Boot device interface allocation . . . . . . . . . . . . . . 55
6. Package information and contact assignments . . . . . . . 57
6.1. 12 x 12 mm package information . . . . . . . . . . . . 57
7. Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
2NXP Semiconductors
i.MX RT1010 introduction
The i.MX RT1010 is specifically useful for applications, such as:
• Audio
• Industrial
Motor Control
Home Appliance
•IoT
1.1 Features
The i.MX RT1010 processors are based on Arm Cortex-M7 MPCore™ Platform, which has the
following features:
Supports single Arm® Cortex®-M7 with:
16 KB L1 Instruction Cache
8 KB L1 Data Cache
Full featured Floating Point Unit (FPU) with support of the VFPv5 architecture
Support the Armv7-M Thumb instruction set, defined in the ARM v7-M architecture
Integrated MPU, up to 16 individual protection regions
Up to 128 KB I-TCM and D-TCM in total
Up to 500 MHz frequency
• Cortex® M7 CoreSight™ components integration for debug
Frequency of the core, as per Table 9, "Operating ranges," on page 16.
The SoC-level memory system consists of the following additional components:
Boot ROM (64 KB)
On-chip RAM (128 KB)
Configurable RAM size up to 128 KB shared with CM7 TCM
External memory interfaces:
SPI NOR FLASH
Single/Dual channel Quad SPI FLASH with XIP support and on-the-fly decryption
Octal flash
Timers and PWMs:
Two General Programmable Timers (GPT)
4-channel generic 32-bit resolution timer for each
Each support standard capture and compare operation
Periodical Interrupt Timer (PIT)
Generic 32-bit resolution timer
Periodical interrupt generation
—FlexPWM
Up to 4 submodules
i.MX RT1010 introduction
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 3
16-bit resolution PWM suitable for Motor Control applications
Each i.MX RT1010 processor enables the following interfaces to external devices (some of them are
muxed and not available simultaneously):
• Audio:
SPDIF input and output
Two synchronous audio interface (SAI) modules, which support I2S, AC97, TDM, and
codec/DSP interfaces
MQS interface for medium quality audio via GPIO pads
• Connectivity:
One USB 2.0 OTG controller with integrated PHY interface
Four universal asynchronous receiver/transmitter (UART) modules
Two I2C modules
Two SPI modules
GPIO and Pin Multiplexing:
General-purpose input/output (GPIO) modules with interrupt capability
Input/output multiplexing controller (IOMUXC) to provide centralized pad control
44 GPIOs for 80-pin LQFP package
— FlexIO
The i.MX RT1010 processors integrate advanced power management unit and controllers:
Full PMIC integration, including on-chip DCDC and LDOs
Temperature sensor with programmable trim points
GPC hardware power management controller
The i.MX RT1010 processors support the following system debug:
•Arm
® Cortex®-M7 CoreSight debug and trace architecture
Trace Port Interface Unit (TPIU) to support off-chip real-time trace
Support for 5-pin JTAG and SWD debug interfaces1
Security functions are enabled and accelerated by the following hardware:
High Assurance Boot (HAB)
Data Co-Processor (DCP):
AES-128, ECB, and CBC mode
SHA-1 and SHA-256
— CRC-32
FlexSPI with On-The-Fly AES Decryption (OTFAD)
AES-128, CTR mode
On-the-fly QSPI Flash decryption
True random number generation (TRNG)
1. SWD is the default debug interface.
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
4NXP Semiconductors
i.MX RT1010 introduction
Secure Non-Volatile Storage (SNVS)
Secure real-time clock (RTC)
Zero Master Key (ZMK)
Secure JTAG Controller (SJC)
NOTE
The actual feature set depends on the part numbers as described in Table 1.
Functions such as connectivity interfaces, and security features are not
offered on all derivatives.
1.2 Ordering information
Table 1 provides orderable part numbers covered by this data sheet.
Figure 1 describes the part number nomenclature so that characteristics of a specific part number can be
identified (for example, cores, frequency, temperature grade, fuse options, and silicon revision). The
primary characteristic which describes which data sheet applies to a specific part is the temperature grade
(junction) field.
Ensure to have the proper data sheet for specific part by verifying the temperature grade (junction) field
and matching it to the proper data sheet. If there are any questions, visit the web page nxp.com/IMXRT or
contact an NXP representative for details.
Table 1. Ordering information
Part Number Features Package
Junction
Temperature
Tj (C)
MIMXRT1011DAE5A 500 MHz, consumer
grade for general
purpose
DMA
Boot ROM (64KB)
On-chip RAM
(128KB)
USB OTG x1
SAI x2
SPDIF x1
MQS x1
GPT x2
PWM x1
4-channel PIT
WDOG x4
UART x4
I2C x2
SPI x2
KPP
ADC x1
FlexSPI
FLEXIO
GPIO
HAB/DCP/OTFAD
TRNG
SNVS
SJC
DCDC
Temperature sensor
GPC hardware power
management
controller
12 x 12 mm 80-pin LQFP, 0.5
mm pitch
0 to 95
i.MX RT1010 introduction
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 5
Figure 1. Part number nomenclature—i.MX RT1010
Temperature
+
Consumer: 0 to + 95 °C D
Industrial: -40 to +105 °C C
Frequency $
400 MHz 4
500 MHz 5
600 MHz 6
700 MHz 7
800 MHz 8
1000 MHz A
VV Package Type
AE 80-pin LQFP, 12 x 12 mm, 0.5 mm pitch
Qualification Level M
Prototype Samples P
Mass Production M
Special S
Part # series XX
i.MX RT RT
Silicon Rev A
A0 A
Tie %
1 Standard Feature General Purpose
5 Enhanced Feature
MIMX X X @%+VV $A
Family @
First Generation RT family 1
Reserved 2
3
4
5
6
7
8
##
Sub-Family ##
01 RT1010
02 RT1020
05 RT1050
06 RT1060
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
6NXP Semiconductors
Architectural overview
2 Architectural overview
The following subsections provide an architectural overview of the i.MX RT1010 processor system.
2.1 Block diagram
Figure 2 shows the functional modules in the i.MX RT1010 processor system1.
.
Figure 2. i.MX RT1010 system block diagram
1. Some modules shown in this block diagram are not offered on all derivatives. See Ta ble 1 for details.
Power Management
External Memory
Connectivity
4 x 4 Keypad
Security
I2C x2
UART x4
GPIO
SPI x2
Internal Memory
System Control
Security JTAG
PLL / OSC
RTC and Reset
Embedded DMA
IOMUX
GP Timer x3
CPU Platform
ARM Cortex-M7
16 KB I-cache 8 KB D-cache
FPU
Dual-Channel Quad-SPI
Octal/Hyper Flash/RAM
FlexSPI with on-the-fly AES decryption
MPU
NVIC
128K I-TCM and D-TCM
64 KB ROM
HAB
FlexPWM x1
Watch Dog x4
DCDC
LDO
I2S / SAI x2
Ciphers RNG
SPDIF Tx/Rx
HSGPIO
MQS
USB2.0 OTG with PHY x1
128 KB SRAM shared with TCM
FlexIO
Secure RTC eFuse
Temp Monitor
ADC
ADC (15-ch) x1
Modules list
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NXP Semiconductors 7
3 Modules list
The i.MX RT1010 processors contain a variety of digital and analog modules. Table 2 describes these
modules in alphabetical order.
Table 2. i.MX RT1010 modules list
Block mnemonic Block name Subsystem Brief description
ADC1 Analog to Digital
Converter
Analog The ADC is a 12-bit general purpose analog to digital
converter.
ADC_ETC ADC External Trigger
Control
Analog The ADC_ETC enables multiple users to share an ADC
module in a Time-Division-Multiplexing (TDM) way.
AOI And-Or-Inverter Cross Trigger The AOI provides a universal boolean function
generator with using a four team sum of products
expression, for each product term containing true or
complement values of the four selected inputs (A, B, C,
D).
Arm Arm Platform Arm The Arm Core Platform includes 1x Cortex-M7 core. It
also includes associated sub-blocks, such as Nested
Vectored Interrupt Controller (NVIC), Floating-Point
Unit (FPU), Memory Protection Unit (MPU), and
CoreSight debug modules.
CCM
GPC
SRC
Clock Control Module,
General Power
Controller, System Reset
Controller
Clocks, Resets, and
Power Control
These modules are responsible for clock and reset
distribution in the system, and also for the system
power management.
CSU Central Security Unit Security The Central Security Unit (CSU) is responsible for
setting comprehensive security policy within the i.MX
RT1010 platform.
DAP Debug Access Port System Control
Peripherals
The DAP provides real-time access for the debugger
without halting the core to:
System memory and peripheral registers
All debug configuration registers
The DAP also provides debugger access to JTAG scan
chains. The DAP module is internal to the Cortex-M7
Core Platform.
DCDC DCDC Converter Analog The DCDC module is used for generating power supply
for core logic. Main features are:
Adjustable high efficiency regulator
Supports 3.3 V input voltage
Supports nominal run and low power standby modes
Supports at 0.9 ~ 1.3 V output in run mode
Supports at 0.9 ~ 1.0 V output in standby mode
Over current and over voltage detection
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
8NXP Semiconductors
Modules list
eDMA enhanced Direct Memory
Access
System Control
Peripherals
There is an enhanced DMA (eDMA) engine and
DMA_MUX.
The eDMA is a 16-channel DMA engine, which is
capable of performing complex data transfers with
minimal intervention from a host processor.
The DMA_MUX is capable of multiplexing up to 128
DMA request sources to the 16 DMA channels of
eDMA.
EWM External Watchdog
Monitor
Timer Peripherals The EWM modules is designed to monitor external
circuits, as well as the software flow. This provides a
back-up mechanism to the internal WDOG that can
reset the system. The EWM differs from the internal
WDOG in that it does not reset the system. The EWM,
if allowed to time-out, provides an independent trigger
pin that when asserted resets or places an external
circuit into a safe mode.
FlexIO1 Flexible Input/output Connectivity and
Communications
The FlexIO is capable of supporting a wide range of
protocols including, but not limited to: UART, I2C, SPI,
I2S, camera interface, display interface, PWM
waveform generation, etc. The module can remain
functional when the chip is in a low power mode
provided the clock it is using remain active.
FlexPWM1 Pulse Width Modulation Timer Peripherals The pulse-width modulator (PWM) contains four PWM
sub-modules, each of which is set up to control a single
half-bridge power stage. Fault channel support is
provided. The PWM module can generate various
switching patterns, including highly sophisticated
waveforms.
FlexRAM RAM Memories The i.MX RT1010 has 128 KB of on-chip RAM which
could be flexible allocated to I-TCM, D-TCM, and
on-chip RAM (OCRAM) in a 32 KB granularity. The
FlexRAM is the manager of the 128 KB on-chip RAM
array. Major functions of this blocks are: interfacing to
I-TCM and D-TCM of Arm core and OCRAM controller;
dynamic RAM arrays allocation for I-TCM, D-TCM, and
OCRAM.
FlexSPI Quad Serial Peripheral
Interface
Connectivity and
Communications
FlexSPI acts as an interface to one or two external
serial flash devices, each with up to four bidirectional
data lines.
GPIO1
GPIO2
GPIO5
General Purpose I/O
Modules
System Control
Peripherals
Used for general purpose input/output to external ICs.
Each GPIO module supports up to 32 bits of I/O.
Table 2. i.MX RT1010 modules list (continued)
Block mnemonic Block name Subsystem Brief description
Modules list
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 9
GPT1
GPT2
General Purpose Timer Timer Peripherals Each GPT is a 32-bit “free-running” or “set and forget”
mode timer with programmable prescaler and compare
and capture register. A timer counter value can be
captured using an external event and can be configured
to trigger a capture event on either the leading or trailing
edges of an input pulse. When the timer is configured to
operate in “set and forget” mode, it is capable of
providing precise interrupts at regular intervals with
minimal processor intervention. The counter has output
compare logic to provide the status and interrupt at
comparison. This timer can be configured to run either
on an external clock or on an internal clock.
KPP Keypad Port Human Machine
Interfaces
The KPP is a 16-bit peripheral that can be used as a
keypad matrix interface or as general purpose
input/output (I/O). It supports 8 x 8 external key pad
matrix. Main features are:
Multiple-key detection
Long key-press detection
Standby key-press detection
Supports a 2-point and 3-point contact key matrix
LPI2C1
LPI2C2
Low Power
Inter-integrated Circuit
Connectivity and
Communications
The LPI2C is a low power Inter-Integrated Circuit (I2C)
module that supports an efficient interface to an I2C bus
as a master.
The I2C provides a method of communication between
a number of external devices. More detailed
information, see Section 4.8.2, "LPI2C module timing
parameters".
LPSPI1
LPSPI2
Low Power Serial
Peripheral Interface
Connectivity and
Communications
The LPSPI is a low power Serial Peripheral Interface
(SPI) module that support an efficient interface to an
SPI bus as a master and/or a slave.
It can continue operating while the chip is in stop
mode, if an appropriate clock is available.
Designed for low CPU overhead, with DMA off
loading of FIFO register access.
LPUART1
LPUART2
LPUART3
LPUART4
UART Interface Connectivity
Peripherals
Each of the UART modules support the following serial
data transmit/receive protocols and configurations:
7- bit or 8-bit data words, 1 or 2 stop bits,
programmable parity (even, odd or none)
Programmable baud rates up to 5 Mbps.
OTFAD On-the-Fly AES
Decryption
Security OTFAD co-works with FlexSPI to provide superior
cryptographic decryption capabilities without
compromising system performance.
PIT Periodical Interrupt Timer Timer Peripherals The PIT features 32-bit counter timer, programmable
count modules, clock division, interrupt generation, and
a slave mode to synchronize count enable for multiple
PITs.
MQS Medium Quality Sound Multimedia
Peripherals
MQS is used to generate 2-channel medium quality
PWM-like audio via two standard digital GPIO pins.
Table 2. i.MX RT1010 modules list (continued)
Block mnemonic Block name Subsystem Brief description
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
10 NXP Semiconductors
Modules list
ROMCP ROM Controller with
Patch
Memories and
Memory Controllers
The ROMCP acts as an interface between the Arm
advanced high-performance bus and the ROM. The
on-chip ROM is only used by the Cortex-M7 core during
boot up. Size of the ROM is 64 KB.
RTC OSC Real Time Clock
Oscillator
Clock Sources and
Control
The RTC OSC provides the clock source for the
Real-Time Clock module. The RTC OSC module, in
conjunction with an external crystal, generates a 32.678
kHz reference clock for the RTC.
RTWDOG Watch Dog Timer Peripherals The RTWDG module is a high reliability independent
timer that is available for system to use. It provides a
safety feature to ensure software is executing as
planned and the CPU is not stuck in an infinite loop or
executing unintended code. If the WDOG module is not
serviced (refreshed) within a certain period, it resets the
MCU. Windowed refresh mode is supported as well.
SAI1
SAI3
Synchronous Audio
Interface
Multimedia
Peripherals
The SAI module provides a synchronous audio
interface (SAI) that supports full duplex serial interfaces
with frame synchronization, such as I2S, AC97, TDM,
and codec/DSP interfaces.
SA-TRNG Standalone True Random
Number Generator
Security The SA-TRNG is hardware accelerator that generates
a 512-bit entropy as needed by an entropy consuming
module or by other post processing functions.
SJC Secure JTAG Controller System Control
Peripherals
The SJC provides JTAG interface, which complies with
JTAG TAP standards, to internal logic. The i.MX
RT1010 processors use JTAG port for production,
testing, and system debugging. In addition, the SJC
provides BSR (Boundary Scan Register) standard,
which complies with IEEE1149.1 and IEEE1149.6.
The JTAG port is accessible during platform initial
laboratory bring-up, for manufacturing tests and
troubleshooting, as well as for software debugging by
authorized entities. The i.MX RT1010 SJC incorporates
three security modes for protecting against
unauthorized accesses. Modes are selected through
eFUSE configuration.
SNVS Secure Non-Volatile
Storage
Security Secure Non-Volatile Storage, including Secure Real
Time Clock, Security State Machine, and Master Key
Control.
SPDIF Sony Philips Digital
Interconnect Format
Multimedia
Peripherals
A standard audio file transfer format, developed jointly
by the Sony and Phillips corporations. It has Transmitter
and Receiver functionality.
Temp Monitor Temperature Monitor Analog The temperature sensor implements a temperature
sensor/conversion function based on a
temperature-dependent voltage to time conversion.
Table 2. i.MX RT1010 modules list (continued)
Block mnemonic Block name Subsystem Brief description
Modules list
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 11
USB 2.0 Universal Serial Bus 2.0 Connectivity
Peripherals
USB 2.0 (USB OTG1) contains:
One high-speed OTG 2.0 module with integrated HS
USB PHY
Support eight Transmit (TX) and eight Receive (RX)
endpoints, including endpoint 0
WDOG1
WDOG2
WDOG3
Watch Dog Timer Peripherals The Watch Dog Timer supports two comparison points
during each counting period. Each of the comparison
points is configurable to evoke an interrupt to the Arm
core, and a second point evokes an external event on
the WDOG line.
XBAR Cross BAR Cross Trigger Each crossbar switch is an array of muxes with shared
inputs. Each mux output provides one output of the
crossbar. The number of inputs and the number of
muxes/outputs are user configurable and registers are
provided to select which of the shared inputs are routed
to each output.
Table 2. i.MX RT1010 modules list (continued)
Block mnemonic Block name Subsystem Brief description
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
12 NXP Semiconductors
Modules list
3.1 Special signal considerations
Table 3 lists special signal considerations for the i.MX RT1010 processors. The signal names are listed in
alphabetical order.
The package contact assignments can be found in Section 6, "Package information and contact
assignments".” Signal descriptions are provided in the i.MX RT1010 Reference Manual
(IMXRT1010RM).
Table 3. Special signal considerations
Signal name Remarks
DCDC_PSWITCH PAD is in DCDC_IN domain and connected the ground to bypass DCDC.
To enable DCDC function, assert to DCDC_IN with at least 1 ms delay for DCDC_IN rising edge.
RTC_XTALI/RTC_XTALO If the user wishes to configure RTC_XTALI and RTC_XTALO as an RTC oscillator, a 32.768 kHz
crystal, (100 k ESR, 10 pF load) should be connected between RTC_XTALI and RTC_XTALO.
Keep in mind the capacitors implemented on either side of the crystal are about twice the crystal
load capacitor. To hit the exact oscillation frequency, the board capacitors need to be reduced to
account for board and chip parasitics. The integrated oscillation amplifier is self biasing, but
relatively weak. Care must be taken to limit parasitic leakage from RTC_XTALI and RTC_XTALO
to either power or ground (>100 M). This will debias the amplifier and cause a reduction of
startup margin. Typically RTC_XTALI and RTC_XTALO should bias to approximately 0.5 V.
If it is desired to feed an external low frequency clock into RTC_XTALI, the RTC_XTALO pin must
remain unconnected or driven with a complimentary signal. The logic level of this forcing clock
should not exceed VDD_SNVS_CAP level and the frequency should be <100 kHz under typical
conditions.
In case when high accuracy real time clock are not required, system may use internal low
frequency ring oscillator. It is recommended to connect RTC_XTALI to GND and keep
RTC_XTALO unconnected.
XTALI/XTALO A 24.0 MHz crystal should be connected between XTALI and XTALO. External load capacitance
value depends on the typical load capacitance of crystal used and PCB design.
The crystal must be rated for a maximum drive level of 250 W. An ESR (equivalent series
resistance) of typical 80 is recommended. NXP SDK software requires 24 MHz on
XTALI/XTALO.
The crystal can be eliminated if an external 24 MHz oscillator is available in the system. In this
case, XTALO must be directly driven by the external oscillator and XTALI mounted with 18 pF
capacitor. The logic level of this forcing clock cannot exceed NVCC_PLL level.
If this clock is used as a reference for USB, then there are strict frequency tolerance and jitter
requirements. See OSC24M chapter and relevant interface specifications chapters for details.
If driving the chip with an external clock source, then a 24 MHz oscillator can be driven in one of
three configurations using a nominal 1.1 V source.
A single ended external clock source can be used to overdrive the output of the amplifier
(XTALO). Since the oscillation sensing amplifier is differential, the XTALI pin should be
externally floating and capacitively loaded. The combination of the internal biasing resistor and
the external capacitor will filter the signal applied to the XTALO pin and develop a rough
reference for the sensing amplifier to compare.
A single ended external clock source can be used to drive XTALI. In this configuration, XTALO
should be left externally unconnected.
A differential external clock source can be used to drive both XTALI and XTALO.
Generally, second configuration is anticipated to be the most used configuration, but all three
configurations may be utilized.
GPANAIO This signal is reserved for NXP manufacturing use only. This output must remain unconnected.
k9 S2 S2 S2 k9
Modules list
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 13
3.2 Recommended connections for unused analog interfaces
Table 5 shows the recommended connections for unused analog interfaces.
JTAG_nnnn The JTAG interface is summarized in Ta b le 4. Use of external resistors is unnecessary. However,
if external resistors are used, the user must ensure that the on-chip pull-up/down configuration is
followed. For example, do not use an external pull down on an input that has on-chip pull-up.
JTAG_TDO is configured with a keeper circuit such that the non-connected condition is eliminated
if an external pull resistor is not present. An external pull resistor on JTAG_TDO is detrimental and
should be avoided.
JTAG_MOD is referenced as SJC_MOD in the i.MX RT1010 reference manual. Both names refer
to the same signal. JTAG_MOD must be externally connected to GND for normal operation.
Termination to GND through an external pull-down resistor (such as 1 k) is allowed. JTAG_MOD
set to hi configures the JTAG interface to mode compliant with IEEE1149.1 standard. JTAG_MOD
set to low configures the JTAG interface for common SW debug adding all the system TAPs to the
chain.
NC These signals are No Connect (NC) and should be disconnected by the user.
POR_B This cold reset negative logic input resets all modules and logic in the IC.
May be used in addition to internally generated power on reset signal (logical AND, both internal
and external signals are considered active low).
ONOFF ONOFF can be configured in debounce, off to on time, and max time-out configurations. The
debounce and off to on time configurations supports 0, 50, 100, and 500 ms. Debounce is used to
generate the power off interrupt. While in the ON state, if ONOFF button is pressed longer than
the debounce time, the power off interrupt is generated. Off to on time supports the time it takes
to request power on after a configured button press time has been reached. While in the OFF
state, if ONOFF button is pressed longer than the off to on time, the state will transition from OFF
to ON. Max time-out configuration supports 5, 10, 15 seconds, and disable. Max time-out
configuration supports the time it takes to request power down after ONOFF button has been
pressed for the defined time.
TEST_MODE TEST_MODE is for NXP factory use. The user must tie this pin directly to GND.
Table 4. JTAG controller interface summary
JTAG I/O type On-chip termination
JTAG_TCK Input 100 kpull-down
JTAG_TMS Input 47 kpull-up
JTAG_TDI Input 47 kpull-up
JTAG_TDO 3-state output Keeper
JTAG_TRSTB Input 47 kpull-up
JTAG_MOD Input 100 kpull-down
Table 3. Special signal considerations (continued)
Signal name Remarks
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14 NXP Semiconductors
Modules list
Table 5. Recommended connections for unused analog interfaces
Module Pad name Recommendations
if unused
USB USB_OTG1_CHD_B, USB_OTG1_DN, USB_OTG1_DP, USB_OTG1_VBUS Not connected
ADC VDDA_ADC_3P3 VDDA_ADC_3P3
must be powered
even if the ADC is
not used.
Electrical characteristics
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 15
4 Electrical characteristics
This section provides the device and module-level electrical characteristics for the i.MX RT1010
processors.
4.1 Chip-level conditions
This section provides the device-level electrical characteristics for the IC. See Table 6 for a quick reference
to the individual tables and sections.
4.1.1 Absolute maximum ratings
CAUTION
Stress beyond those listed under Table 7 may cause permanent damage to the device. These are stress
ratings only. Functional operation of the device at these or any other conditions beyond those indicated
under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated
conditions for extended periods may affect device reliability.
Table 7 shows the absolute maximum operating ratings.
Table 6. i.MX RT1010 chip-Level conditions
For these characteristics Topic appears
Absolute maximum ratings on page 15
Thermal resistance on page 16
Operating ranges on page 16
External clock sources on page 18
Maximum supply currents on page 18
Low power mode supply currents on page 20
USB PHY current consumption on page 20
Table 7. Absolute maximum ratings
Parameter Description Symbol Min Max Unit
Core supplies input voltage VDD_SOC_IN -0.3 1.6 V
VDD_HIGH_IN supply voltage VDD_HIGH_IN -0.3 3.7 V
Power for DCDC DCDC_IN -0.3 3.6 V
Supply input voltage to Secure Non-Volatile Storage
and Real Time Clock
VDD_SNVS_IN -0.3 3.6 V
USB VBUS supply USB_OTG1_VBUS 5.5 V
Supply for 12-bit ADC VDDA_ADC -0.3 3.6 V
IO supply for GPIO bank (3.3 V mode) NVCC_GPIO -0.3 3.6 V
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16 NXP Semiconductors
Electrical characteristics
4.1.2 Thermal resistance
Following sections provide the thermal resistance data.
4.1.2.1 Package thermal characteristics
Table 8 displays the 12 x 12 mm LQFP package thermal resistance data.
4.1.3 Operating ranges
Table 9 provides the operating ranges of the i.MX RT1010 processors. For details on the chip's power
structure, see the “Power Management Unit (PMU)” chapter of the i.MX RT1010 Reference Manual
(IMXRT1010RM).
ESD Damage Immunity:
Human Body Model (HBM)
Charge Device Model (CDM)
Vesd
1000
500
V
Input/Output Voltage range Vin/Vout -0.5 OVDD + 0.31V
Storage Temperature range TSTORAGE -40 150 o C
1OVDD is the I/O supply voltage.
Table 8. 12 x 12 mm package thermal resistance data
Rating Board type1
1Thermal test board meets JEDEC specification for this package (JESD51-9)
Symbol Value Unit
Junction to Ambient
Thermal Resistance2
2Determined in accordance to JEDEC JESD51-2A natural convection environment. Thermal resistance data in this report is
solely for a thermal performance comparison of one package to another in a standardized specified environment. It is not
meant to predict the performance of a package in an application-specific environment.
JESD51-9, 2s2p RJA 46.5 oC/W
Junction to Package Top
Thermal Resistance2
JESD51-9, 2s2p JT 2.0 oC/W
Junction to Case Thermal Resistance3
3Junction-to-Case thermal resistance determined using an isothermal cold plate. Case temperature refers to the mold surface
temperature at the package top side dead centre.
JESD51-9, 1s RJC 22.1 oC/W
Table 9. Operating ranges
Parameter
Description Symbol Operating
Conditions Min Typ Max1Unit Comment
Table 7. Absolute maximum ratings (continued)
Electrical characteristics
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NXP Semiconductors 17
Run Mode VDD_SOC_IN Overdrive 1.25 1.3 V
VDD_SOC_IN M7 core at 396
MHz
1.15 — 1.3 V
M7 core at 132
MHz
1.15 — 1.3
M7 core at 24
MHz
0.925 — 1.3
IDLE Mode VDD_SOC_IN M7 core
operation at 396
MHz or below
1.15 — 1.3 V
SUSPEND (DSM)
Mode
VDD_SOC_IN 0.925 1.3 V Refer to Table 12 Low power mode
current and power consumption
SNVS Mode VDD_SOC_IN 0 1.3 V
Power for DCDC DCDC_IN 3.0 3.3 3.6
VDD_HIGH
internal regulator
VDD_HIGH_IN2 3.0 3.6 V Must match the range of voltages
that the rechargeable backup
battery supports.
Backup battery
supply range
VDD_SNVS_IN3 2.40 3.6 V Can be combined with
VDDHIGH_IN, if the system does
not require keeping real time and
other data on OFF state.
USB supply
voltages
USB_OTG1_VBUS — 4.40 5.5 V
A/D converter VDDA_ADC_3P3 3.0 3.3 3.6 V VDDA_ADC_3P3 must be
powered even if the ADC is not
used.
VDDA_ADC_3P3 cannot be
powered when the other SoC
supplies (except VDD_SNVS_IN)
are off.
Temperature Operating Ranges
Junction
temperature
Tj Standard
Commercial
0—95
oC See the application note, i.MX
RT1010 Product Lifetime Usage
Estimates for information on
product lifetime (power-on years)
for this processor.
1Applying the maximum voltage results in maximum power consumption and heat generation. NXP recommends a voltage set
point = (Vmin + the supply tolerance). This result in an optimized power/speed ratio.
2Applying the maximum voltage results in shorten lifetime. 3.6 V usage limited to < 1% of the use profile. Reset of profile limited
to below 3.49 V.
3In setting VDD_SNVS_IN voltage with regards to Charging Currents and RTC, refer to the i.MX RT1010 Hardware
Development Guide (IMXRT1010HDG).
Table 9. Operating ranges (continued)
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18 NXP Semiconductors
Electrical characteristics
4.1.4 External clock sources
Each i.MX RT1010 processor has two external input system clocks: a low frequency (RTC_XTALI) and
a high frequency (XTALI).
The RTC_XTALI is used for low-frequency functions. It supplies the clock for wake-up circuit,
power-down real time clock operation, slow system and watch-dog counters. The clock input can be
connected to either external oscillator or a crystal using internal oscillator amplifier. Additionally, there is
an internal ring oscillator, which can be used instead of the RTC_XTALI if accuracy is not important.
The system clock input XTALI is used to generate the main system clock. It supplies the PLLs and other
peripherals. The system clock input can be connected to either external oscillator or a crystal using internal
oscillator amplifier.
Table 10 shows the interface frequency requirements.
The typical values shown in Table 10 are required for use with NXP SDK to ensure precise time keeping
and USB operation. For RTC_XTALI operation, two clock sources are available.
External crystal oscillator with on-chip support circuit:
At power up, ring oscillator is utilized. After crystal oscillator is stable, the clock circuit
switches over to the crystal oscillator automatically.
Higher accuracy than ring oscillator
If no external crystal is present, then the ring oscillator is utilized
The decision of choosing a clock source should be taken based on real-time clock use and precision
time-out.
4.1.5 Maximum supply currents
The data shown in Table 11 represent a use case designed specifically to show the maximum current
consumption possible. All cores are running at the defined maximum frequency and are limited to L1
cache accesses only to ensure no pipeline stalls. Although a valid condition, it would have a very limited
practical use case, if at all, and be limited to an extremely low duty cycle unless the intention was to
specifically show the worst case power consumption.
Table 10. External input clock frequency
Parameter Description Symbol Min Typ Max Unit
RTC_XTALI Oscillator1,2
1External oscillator or a crystal with internal oscillator amplifier.
2The required frequency stability of this clock source is application dependent. For recommendations, see the Hardware
Development Guide for i.MX RT1010 Crossover Processors (IMXRT1010HDG).
fckil —32.768
3/32.0
3Recommended nominal frequency 32.768 kHz.
—kHz
XTALI Oscillator2,4
4External oscillator or a fundamental frequency crystal with internal oscillator amplifier.
fxtal —24MHz
Electrical characteristics
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NXP Semiconductors 19
See the i.MX RT1010 Power Consumption Measurement Application Note for more details on typical
power consumption under various use case definitions.
Table 11. Maximum supply currents
Power Rail Conditions Max Current Unit
DCDC_IN Max power for chip at 125 oC200 mA
VDD_HIGH_IN Include internal loading in analog 75 mA
VDD_SNVS_IN 57.5 A
USB_OTG1_VBUS 25 mA for each active USB interface 25 mA
VDDA_ADC_3P3 3.3 V power supply for 12-bit ADC, 600
A typical, 750 A max, for each ADC.
100 Ohm max loading for touch panel,
cause 33 mA current.
34.5 mA
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Electrical characteristics
4.1.6 Low power mode supply currents
Table 12 shows the current core consumption (not including I/O) of i.MX RT1010 processors in selected
low power modes.
4.1.7 USB PHY current consumption
4.1.7.1 Power down mode
In power down mode, everything is powered down, including the USB VBUS valid detectors in typical
condition. Table 13 shows the USB interface current consumption in power down mode.
Table 12. Low power mode current and power consumption
Mode Test Conditions Supply Typical1
1The typical values shown here are for information only and are not guaranteed. These values are average values measured
on a typical process wafer at 25oC.
Units
SYSTEM IDLE SOC_VDD_IN set to 1.1 V for SOG and ARM
CPU in WFI, CPU clock gated
24 MHz XTAL is ON
System PLL is active, other PLLs are power down
Peripheral clock gated, but remain powered
DCDC_IN (3.3 V) 2.09 mA
VDD_HIGH_IN (3.3 V) 6.58
VDD_SNVS_IN (3.3 V) 0.019
Total 28.67 mW
LOW POWER IDLE SOC_VDD_IN set to Weak mode
CPU in Power Gate mode
All PLLs are power down
24 MHz XTAL is off, 24 MHz RCOSC used as
clock source
Peripheral are powered off
DCDC_IN (3.3 V) 0.778 mA
VDD_HIGH_IN (3.3 V) 0.245
VDD_SNVS_IN (3.3 V) 0.042
Total 3.51 mW
SUSPEND
(DSM)
SOC_VDD_IN is shut off
CPU in Power Gate mode
All PLLs are power down
24 MHz XTAL is off, 24 MHz RCOSC is off
All clocks are shut off, except 32 kHz RTC
Peripheral are powered off
DCDC_IN (3.3 V) 0.10 mA
VDD_HIGH_IN (3.3 V) 0.02
VDD_SNVS_IN (3.3 V) 0.015
Total 0.45 mW
SNVS (RTC) All SOC digital logic, analog module are shut off
32 kHz RTC is alive
DCDC_IN (0 V) 0 mA
VDD_HIGH_IN (0 V) 0
VDD_SNVS_IN (3.3 V) 0.015
Total 0.05 mW
Table 13. USB PHY current consumption in power down mode
VDD_USB_CAP (3.0 V) VDD_HIGH_CAP (2.5 V) NVCC_PLL (1.1 V)
Current 5.1 A 1.7 A < 0.5 A
Electrical characteristics
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NXP Semiconductors 21
NOTE
The currents on the VDD_HIGH_CAP and VDD_USB_CAP were
identified to be the voltage divider circuits in the USB-specific level
shifters.
4.2 System power and clocks
This section provide the information about the system power and clocks.
4.2.1 Power supplies requirements and restrictions
The system design must comply with power-up sequence, power-down sequence, and steady state
guidelines as described in this section to guarantee the reliable operation of the device. Any deviation
from these sequences may result in the following situations:
Excessive current during power-up phase
Prevention of the device from booting
Irreversible damage to the processor (worst-case scenario)
Figure 3. Power sequence
4.2.1.1 Power-up sequence
The below restrictions must be followed:
VDD_SNVS_IN supply must be turned on before any other power supply or be connected
(shorted) with VDD_HIGH_IN supply.
If a coin cell is used to power VDD_SNVS_IN, then ensure that it is connected before any other
supply is switched on.
When internal DCDC is enabled, external delay circuit is required to delay the
“DCDC_PSWITCH” signal at least 1 ms after DCDC_IN is stable.
POR_B should be held low during the entire power up sequence.
Run Mode <-> SNVS ModeRun Mode <-> Standby ModePower On
VDD_SNVS_IN
DCDC_IN
POR_B
PMIC_ON_REQ
ON_OFF
VDD_SOC_IN
DCDC_OK
DCDC_PSWITCH
VDD_HIGH_CAP
NVCC_PLL
VDD_SNVS_CAP
PMIC_STBY_REQ
T
StbyExt
T
SNVSDly
T
DCDCSetup
1ms
1ms
Signal in VDD_SOC power
domain
Signal in DCDC_IN power
domain
Signal in VDD_SNVS_CAP
power domain
VDD_SOC power rail DCDC_IN power rail VDD_SNVS_CAP power rail VDDA_2P5_CAP power rail
VDDA_1P1_CAP power rail
VDD_SNVS_IN power railDCDC_LP power rail
LEGEND
Signal Floating
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22 NXP Semiconductors
Electrical characteristics
NOTE
The POR_B input (if used) must be immediately asserted at power-up and
remain asserted until after the last power rail reaches its working voltage. In
the absence of an external reset feeding the POR_B input, the internal POR
module takes control. It is recommended to reset IC. See the i.MX RT1010
Reference Manual (IMXRT1010RM) for further details and to ensure that
all necessary requirements are being met.
NOTE
Need to ensure that there is no back voltage (leakage) from any supply on
the board towards the 3.3 V supply (for example, from the external
components that use the 3.3 V supply).
NOTE
USB_OTG1_VBUS and VDDA_ADC_3P3 are not part of the power
supply sequence and may be powered at any time.
4.2.1.2 Power-down sequence
The following restrictions must be followed:
VDD_SNVS_IN supply must be turned off after any other power supply or be connected (shorted)
with VDD_HIGH_IN supply.
If a coin cell is used to power VDD_SNVS_IN, then ensure that it is removed after any other supply
is switched off.
4.2.1.3 Power supplies usage
All I/O pins should not be externally driven while the I/O power supply for the pin (NVCC_xxx) is OFF.
This can cause internal latch-up and malfunctions due to reverse current flows. For information about I/O
power supply of each pin, see “Power Rail” columns in pin list tables of Section 6, "Package information
and contact assignments".”
4.2.2 Integrated LDO voltage regulator parameters
Various internal supplies can be powered ON from internal LDO voltage regulators. All the supply pins
named *_CAP must be connected to external capacitors. The onboard LDOs are intended for internal use
only and should not be used to power any external circuitry. See the i.MX RT1010 Reference Manual
(IMXRT1010RM) for details on the power tree scheme.
NOTE
The *_CAP signals should not be powered externally. These signals are
intended for internal LDO operation only.
Electrical characteristics
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NXP Semiconductors 23
4.2.2.1 Digital regulators (LDO_SNVS)
There are one digital LDO regulator (“Digital”, because of the logic loads that they drive, not because of
their construction). The advantages of the regulator is to reduce the input supply variation because of its
input supply ripple rejection and its on-die trimming. This translates into more stable voltage for the
on-chip logics.
The regulator has two basic modes:
Power Gate. The regulation FET is switched fully off limiting the current draw from the supply.
The analog part of the regulator is powered down here limiting the power consumption.
Analog regulation mode. The regulation FET is controlled such that the output voltage of the
regulator equals the programmed target voltage. The target voltage is fully programmable in 25 mV
steps.
For additional information, see the i.MX RT1010 Reference Manual (IMXRT1010RM).
4.2.2.2 Regulators for analog modules
4.2.2.2.1 LDO_1P1
The LDO_1P1 regulator implements a programmable linear-regulator function from VDD_HIGH_IN (see
Table 9 for minimum and maximum input requirements). Typical Programming Operating Range is 1.0 V
to 1.2 V with the nominal default setting as 1.1 V. The LDO_1P1 supplies the USB Phy, and PLLs. A
programmable brown-out detector is included in the regulator that can be used by the system to determine
when the load capability of the regulator is being exceeded to take the necessary steps. Current-limiting
can be enabled to allow for in-rush current requirements during start-up, if needed. Active-pull-down can
also be enabled for systems requiring this feature.
For information on external capacitor requirements for this regulator, see the Hardware Development
Guide for i.MX RT1010 Crossover Processors (IMXRT1010HDG).
For additional information, see the i.MX RT1010 Reference Manual (IMXRT1010RM).
4.2.2.2.2 LDO_2P5
The LDO_2P5 module implements a programmable linear-regulator function from VDD_HIGH_IN (see
Table 9 for minimum and maximum input requirements). Typical Programming Operating Range is 2.25 V
to 2.75 V with the nominal default setting as 2.5 V. LDO_2P5 supplies the USB PHY, E-fuse module, and
PLLs. A programmable brown-out detector is included in the regulator that can be used by the system to
determine when the load capability of the regulator is being exceeded, to take the necessary steps.
Current-limiting can be enabled to allow for in-rush current requirements during start-up, if needed.
Active-pull-down can also be enabled for systems requiring this feature. An alternate self-biased
low-precision weak-regulator is included that can be enabled for applications needing to keep the output
voltage alive during low-power modes where the main regulator driver and its associated global bandgap
reference module are disabled. The output of the weak-regulator is not programmable and is a function of
the input supply as well as the load current. Typically, with a 3 V input supply the weak-regulator output
is 2.525 V and its output impedance is approximately 40 .
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Electrical characteristics
For information on external capacitor requirements for this regulator, see the Hardware Development
Guide for i.MX RT1010 Crossover Processors (IMXRT1010HDG).
For additional information, see the i.MX RT1010 Reference Manual (IMXRT1010RM).
4.2.2.2.3 LDO_USB
The LDO_USB module implements a programmable linear-regulator function from the USB VUSB
voltages (4.4 V–5.5 V) to produce a nominal 3.0 V output voltage. A programmable brown-out detector
is included in the regulator that can be used by the system to determine when the load capability of the
regulator is being exceeded, to take the necessary steps. This regulator has a built in power-mux that allows
the user to select to run the regulator from either USB VBUS supply, when both are present. If only one
of the USB VBUS voltages is present, then, the regulator automatically selects this supply. Current limit
is also included to help the system meet in-rush current targets.
For information on external capacitor requirements for this regulator, see the Hardware Development
Guide for i.MX RT1010 Crossover Processors (IMXRT1010HDG).
For additional information, see the i.MX RT1010 Reference Manual (IMXRT1010RM).
4.2.2.2.4 DCDC
DCDC can be configured to operate on power-save mode when the load current is less than 50 mA. During
the power-save mode, the converter operates with reduced switching frequency in PFM mode and with a
minimum quiescent current to maintain high efficiency.
DCDC can detect the peak current in the P-channel switch. When the peak current exceeds the threshold,
DCDC will give an alert signal, and the threshold can be configured. By this way, DCDC can roughly
detect the current loading.
DCDC also includes the following protection functions:
Over current protection. In run mode, DCDC shuts down when detecting abnormal large current in
the P-type power switch. In power save mode, DCDC stop charging inductor when detecting large
current in the P-type power switch. The threshold is also different in run mode and in power save
mode: the former is 1 A–2A, and the latter is 200 mA–250 mA.
Over voltage protection. DCDC shuts down when detecting the output voltage is too high.
Low voltage detection. DCDC shuts down when detecting the input voltage is too low.
NOTE
It is recommended that using the internal DCDC as core supply for cost
solution.
If the DCDC bypass mode is used, it is not recommended to switch back to
the internal DCDC mode.
For additional information, see the i.MX RT1010 Reference Manual (IMXRT1010RM).
Electrical characteristics
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NXP Semiconductors 25
4.2.3 PLL’s electrical characteristics
This section provides PLL electrical characteristics.
4.2.3.1 Audio PLL’s electrical parameters
4.2.3.2 System PLL
4.2.3.3 Ethernet PLL
4.2.3.4 USB PLL
Table 14. Audio PLL’s electrical parameters
Parameter Value
Clock output range 650 MHz ~1.3 GHz
Reference clock 24 MHz
Lock time < 11250 reference cycles
Table 15. System PLL’s electrical parameters
Parameter Value
Clock output range 528 MHz PLL output
Reference clock 24 MHz
Lock time < 11250 reference cycles
Table 16. Ethernet PLL’s electrical parameters
Parameter Value
Clock output range 1 GHz
Reference clock 24 MHz
Lock time < 11250 reference cycles
Table 17. USB PLL’s electrical parameters
Parameter Value
Clock output range 480 MHz PLL output
Reference clock 24 MHz
Lock time < 383 reference cycles
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Electrical characteristics
4.2.4 On-chip oscillators
4.2.4.1 OSC24M
This block implements an amplifier that when combined with a suitable quartz crystal and external load
capacitors implement an oscillator. The oscillator is powered from NVCC_PLL.
The system crystal oscillator consists of a Pierce-type structure running off the digital supply. A straight
forward biased-inverter implementation is used.
4.2.4.2 OSC32K
This block implements an amplifier that when combined with a suitable quartz crystal and external load
capacitors implement a low power oscillator. It also implements a power mux such that it can be powered
from either a ~3 V backup battery (VDD_SNVS_IN) or VDD_HIGH_IN such as the oscillator consumes
power from VDD_HIGH_IN when that supply is available and transitions to the backup battery when
VDD_HIGH_IN is lost.
In addition, if the clock monitor determines that the OSC32K is not present, then the source of the 32 K
will automatically switch to a crude internal ring oscillator. The frequency range of this block is
approximately 10–45 kHz. It highly depends on the process, voltage, and temperature.
The OSC32k runs from VDD_SNVS_CAP supply, which comes from the
VDD_HIGH_IN/VDD_SNVS_IN. The target battery is a ~3 V coin cell. Proper choice of coin cell type
is necessary for chosen VDD_HIGH_IN range. Appropriate series resistor (Rs) must be used when
connecting the coin cell. Rs depends on the charge current limit that depends on the chosen coin cell. For
example, for Panasonic ML621:
Average Discharge Voltage is 2.5 V
Maximum Charge Current is 0.6 mA
For a charge voltage of 3.2 V, Rs = (3.2-2.5)/0.6 m = 1.17 k.
Table 18. OSC32K main characteristics
Min Typ Max Comments
Fosc 32.768 KHz This frequency is nominal and determined mainly by the crystal selected.
32.0 K would work as well.
Current consumption 4 A—The 4 A is the consumption of the oscillator alone (OSC32k). Total supply
consumption will depend on what the digital portion of the RTC consumes.
The ring oscillator consumes 1 A when ring oscillator is inactive, 20 A
when the ring oscillator is running. Another 1.5 A is drawn from vdd_rtc in
the power_detect block. So, the total current is 6.5 A on vdd_rtc when the
ring oscillator is not running.
Bias resistor 14 M This integrated bias resistor sets the amplifier into a high gain state. Any
leakage through the ESD network, external board leakage, or even a
scope probe that is significant relative to this value will debias the amp. The
debiasing will result in low gain, and will impact the circuit's ability to start
up and maintain oscillations.
Crystal Properties
H1": or non_ _ _ predriver i uvdd pmos (an) pad Voh min
Electrical characteristics
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NXP Semiconductors 27
4.3 I/O parameters
This section provide parameters on I/O interfaces.
4.3.1 I/O DC parameters
This section includes the DC parameters of the following I/O types:
XTALI and RTC_XTALI (Clock Inputs) DC Parameters
General Purpose I/O (GPIO)
NOTE
The term ‘NVCC_XXXX’ in this section refers to the associated supply rail
of an input or output.
Figure 4. Circuit for parameters Voh and Vol for I/O cells
4.3.1.1 XTALI and RTC_XTALI (clock inputs) DC parameters
Table 19 shows the DC parameters for the clock inputs.
Cload 10 pF Usually crystals can be purchased tuned for different Cloads. This Cload
value is typically 1/2 of the capacitances realized on the PCB on either side
of the quartz. A higher Cload will decrease oscillation margin, but
increases current oscillating through the crystal.
ESR 50 k 100 kEquivalent series resistance of the crystal. Choosing a crystal with a higher
value will decrease the oscillating margin.
Table 19. XTALI and RTC_XTALI DC parameters1
Parameter Symbol Test Conditions Min Max Unit
XTALI high-level DC input voltage Vih 0.8 x NVCC_PLL NVCC_PLL V
XTALI low-level DC input voltage Vil 0 0.2 V
Table 18. OSC32K main characteristics
Min Typ Max Comments
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Electrical characteristics
4.3.1.2 Single voltage general purpose I/O (GPIO) DC parameters
Table 20 shows DC parameters for GPIO pads. The parameters in Table 20 are guaranteed per the
operating ranges in Table 9, unless otherwise noted.
RTC_XTALI high-level DC input voltage Vih 0.8 x NVCC_PLL NVCC_PLL V
RTC_XTALI low-level DC input voltage Vil 0 0.2 V
1The DC parameters are for external clock input only.
Table 20. Single voltage GPIO DC parameters
Parameter Symbol Test Conditions Min Max Units
High-level output voltage1VOH Ioh= -0.1mA (ipp_dse=001,010)
Ioh= -1mA
(ipp_dse=011,100,101,110,111)
NVCC_XXXX -
0.2
–V
Low-level output voltage1VOL Iol= 0.1mA (ipp_dse=001,010)
Iol= 1mA
(ipp_dse=011,100,101,110,111)
–0.2V
High-Level input voltage1,2 VIH 0.7 x
NVCC_XXXX
NVCC_XXXX V
Low-Level input voltage1,2 VIL 0 0.3 x
NVCC_XXXX
V
Input Hysteresis
(NVCC_XXXX=3.3V)
VHYS_High
VDD
NVCC_XXXX=3.3V 250 — mV
Schmitt trigger VT+2,3 VTH+ 0.5 x
NVCC_XXXX
—mV
Schmitt trigger VT-2,3 VTH- 0.5 x
NVCC_XXXX
mV
Pull-up resistor (22_k PU) RPU_22K Vin=0V 212 A
Pull-up resistor (22_k PU) RPU_22K Vin=NVCC_XXXX 1 A
Pull-up resistor (47_k PU) RPU_47K Vin=0V 100 A
Pull-up resistor (47_k PU) RPU_47K Vin=NVCC_XXXX 1 A
Pull-up resistor (100_k PU) RPU_100K Vin=0V 48 A
Pull-up resistor (100_k PU) RPU_100K Vin=NVCC_XXXX 1 A
Pull-down resistor (100_k PD) RPD_100K Vin=NVCC_XXXX 48 A
Pull-down resistor (100_k PD) RPD_100K Vin=0V 1 A
Input current (no PU/PD) IIN VI = 0, VI = NVCC_XXXX -1 1 A
Keeper Circuit Resistance R_Keeper VI =0.3 x NVCC_XXXX, VI = 0.7
x NVCC_XXXX
105 175 k
Table 19. XTALI and RTC_XTALI DC parameters1 (continued)
Parameter Symbol Test Conditions Min Max Unit
«+1
Electrical characteristics
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 29
4.3.2 I/O AC parameters
This section includes the AC parameters of the following I/O types:
General Purpose I/O (GPIO)
Figure 5 shows load circuit for output, and Figure 6 show the output transition time waveform.
Figure 5. Load circuit for output
Figure 6. Output transition time waveform
4.3.2.1 General purpose I/O AC parameters
The I/O AC parameters for GPIO are presented in the Table 21, respectively. Note that the fast or slow I/O
behavior is determined by the appropriate control bits in the IOMUXC control registers.
1Overshoot and undershoot conditions (transitions above NVCC_XXXX and below GND) on switching pads must be held
below 0.6 V, and the duration of the overshoot/undershoot must not exceed 10% of the system clock cycle. Overshoot/
undershoot must be controlled through printed circuit board layout, transmission line impedance matching, signal line
termination, or other methods. Non-compliance to this specification may affect device reliability or cause permanent damage
to the device.
2To maintain a valid level, the transition edge of the input must sustain a constant slew rate (monotonic) from the current DC
level through to the target DC level, Vil or Vih. Monotonic input transition time is from 0.1 ns to 1 s.
3Hysteresis of 250 mV is guaranteed over all operating conditions when hysteresis is enabled.
Table 21. General purpose I/O AC parameters 3.3 V mode
Parameter Symbol Test condition Min Typ Max Unit
Output Pad Transition Times, rise/fall
(Max Drive, ipp_dse=101)
tr, tf 15 pF Cload, slow slew rate
15 pF Cload, fast slew rate —— 1.70/1.79
1.06/1.15
ns
ns
Output Pad Transition Times, rise/fall
(High Drive, ipp_dse=011)
tr, tf 15 pF Cload, slow slew rate
15 pF Cload, fast slew rate —— 2.35/2.43
1.74/1.77
Output Pad Transition Times, rise/fall
(Medium Drive, ipp_dse=010)
tr, tf 15 pF Cload, slow slew rate
15 pF Cload, fast slew rate —— 3.13/3.29
2.46/2.60
Output Pad Transition Times, rise/fall
(Low Drive. ipp_dse=001)
tr, tf 15 pF Cload, slow slew rate
15 pF Cload, fast slew rate —— 5.14/5.57
4.77/5.15
Input Transition Times1trm — — 25 ns
Test Point
From Output
Under Test
CL
CL includes package, probe and fixture capacitance
0V
OVDD
20%
80% 80%
20%
tr tf
Output (at pad)
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Electrical characteristics
4.4 System modules
This section contains the timing and electrical parameters for the modules in the i.MX RT1010 processor.
4.4.1 Reset timings parameters
Figure 7 shows the reset timing and Table 22 lists the timing parameters.
Figure 7. Reset timing diagram
4.4.2 WDOG reset timing parameters
Figure 8 shows the WDOG reset timing and Table 23 lists the timing parameters.
Figure 8. WDOGn_B timing diagram
NOTE
RTC_XTALI is approximately 32 kHz. RTC_XTALI cycle is one period or
approximately 30 s.
NOTE
WDOGn_B output signals (for each one of the Watchdog modules) do not
have dedicated pins, but are muxed out through the IOMUX. See the IOMUX
manual for detailed information.
1Hysteresis mode is recommended for inputs with transition times greater than 25 ns.
Table 22. Reset timing parameters
ID Parameter Min Max Unit
CC1 Duration of POR_B to be qualified as valid. 1 RTC_XTALI cycle
Table 23. WDOGn_B timing parameters
ID Parameter Min Max Unit
CC3 Duration of WDOGn_B Assertion 1 RTC_XTALI cycle
WDOGn_B
CC3
(Output)
w 33%
Electrical characteristics
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NXP Semiconductors 31
4.4.3 Secure JTAG Controller (SJC) timing parameters
Figure 9 depicts the SJC test clock input timing. Figure 10 depicts the SJC boundary scan timing.
Figure 11 depicts the SJC test access port. Signal parameters are listed in Table 24.
Figure 9. Test clock input timing diagram
Figure 10. Boundary secure (JTAG) timing diagram
JTAG_TCK
(Input) VM VM
VIH
VIL
SJ1
SJ2 SJ2
SJ3
SJ3
JTAG_TCK
(Input)
Data
Inputs
Data
Outputs
Data
Outputs
Data
Outputs
VIH
VIL
Input Data Valid
Output Data Valid
Output Data Valid
SJ4 SJ5
SJ6
SJ7
SJ6
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Electrical characteristics
Figure 11. Test access port timing diagram
Figure 12. JTAG_TRST_B timing diagram
Table 24. JTAG timing
ID Parameter1,2
All frequencies
Unit
Min Max
SJ0 JTAG_TCK frequency of operation 1/(3•TDC)10.001 22 MHz
SJ1 JTAG_TCK cycle time in crystal mode 45 ns
SJ2 JTAG_TCK clock pulse width measured at VM222.5 — ns
SJ3 JTAG_TCK rise and fall times 3 ns
SJ4 Boundary scan input data set-up time 5 ns
SJ5 Boundary scan input data hold time 24 ns
SJ6 JTAG_TCK low to output data valid 40 ns
SJ7 JTAG_TCK low to output high impedance 40 ns
SJ8 JTAG_TMS, JTAG_TDI data set-up time 5 ns
JTAG_TCK
(Input)
JTAG_TDI
(Input)
JTAG_TDO
(Output)
JTAG_TDO
(Output)
JTAG_TDO
(Output)
VIH
VIL
Input Data Valid
Output Data Valid
Output Data Valid
JTAG_TMS
SJ8 SJ9
SJ10
SJ11
SJ10
JTAG_TCK
(Input)
JTAG_TRST_B
(Input)
SJ13
SJ12
Electrical characteristics
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4.4.4 Debug trace timing specifications
Figure 13. ARM_TRACE_CLK specifications
SJ9 JTAG_TMS, JTAG_TDI data hold time 25 ns
SJ10 JTAG_TCK low to JTAG_TDO data valid 44 ns
SJ11 JTAG_TCK low to JTAG_TDO high impedance 44 ns
SJ12 JTAG_TRST_B assert time 100 ns
SJ13 JTAG_TRST_B set-up time to JTAG_TCK low 40 ns
1TDC = target frequency of SJC
2VM = mid-point voltage
Table 25. Debug trace operating behaviors
Symbol Description Min Max Unit
T1 ARM_TRACE_CLK frequency of operation 70 MHz
T2 ARM_TRACE_CLK period 1/T1 s
T3 Low pulse width 6 ns
T4 High pulse width 6 ns
T5 Clock and data rise time 1 ns
T6 Clock and data fall time 1 ns
T7 Data setup 2 ns
T8 Data hold 0.7 ns
Table 24. JTAG timing (continued)
ID Parameter1,2
All frequencies
Unit
Min Max
!2-?42!#%?#,+
4
T4
T6
4
4
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Electrical characteristics
Figure 14. Trace data specifications
4.4.5 Power mode transition operating behaviors
Table 26 shows the power mode transition operating behaviors.
4.5 External memory interface
The following sections provide information about external memory interfaces.
4.5.1 FlexSPI parameters
Measurements are with a load 15 pf and input slew rate of 1 V/ns.
4.5.1.1 FlexSPI input/read timing
There are three sources for the internal sample clock for FlexSPI read data:
Dummy read strobe generated by FlexSPI controller and looped back internally
(FlexSPIn_MCR0[RXCLKSRC] = 0x0)
Dummy read strobe generated by FlexSPI controller and looped back through the
DQS pad (FlexSPIn_MCR0[RXCLKSRC] = 0x1)
Read strobe provided by memory device and input from DQS pad
(FlexSPIn_MCR0[RXCLKSRC] = 0x3)
The following sections describe input signal timing for each of these four internal sample clock sources.
Table 26. Power mode transition operating behaviors1
1Typical value is the average value of total test.
Description System clock Core, memory
frequency (MHz) Min. Typ.2
2The temperature is at 25oC.
Max. Unit
SUSPEND to RUN3
3The code runs in the ITCM.
ENET PLL 0, 0 ->500, 500 532.04 s
T8
T7 T7 T8
ARM_TRACE_CLK
ARM_TRACE0-3
H H
Electrical characteristics
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NXP Semiconductors 35
4.5.1.1.1 SDR mode with FlexSPIn_MCR0[RXCLKSRC] = 0x0, 0x1
Figure 15. FlexSPI input timing in SDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0X0, 0X1
NOTE
Timing shown is based on the memory generating read data on the SCK
falling edge, and FlexSPI controller sampling read data on the falling edge.
4.5.1.1.2 SDR mode with FlexSPIn_MCR0[RXCLKSRC] = 0x3
There are two cases when the memory provides both read data and the read strobe in SDR mode:
A1Memory generates both read data and read strobe on SCK rising edge (or falling
edge)
A2Memory generates read data on SCK falling edge and generates read strobe on
SCK rising edgeSCK rising edge
Table 27. FlexSPI input timing in SDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0X0
Symbol Parameter Min Max Unit
Frequency of operation 60 MHz
TIS Setup time for incoming data 8.67 ns
TIH Hold time for incoming data 0 ns
Table 28. FlexSPI input timing in SDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0X1
Symbol Parameter Min Max Unit
Frequency of operation 133 MHz
TIS Setup time for incoming data 2 ns
TIH Hold time for incoming data 1 ns
T
IS
T
IH
SCK
SIO[0:7]
T
IS
T
IH
Internal Sample Clock
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Electrical characteristics
Figure 16. FlexSPI input timing in SDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0X3 (Case A1)
NOTE
Timing shown is based on the memory generating read data and read strobe
on the SCK rising edge. The FlexSPI controller samples read data on the
DQS falling edge.
Table 29. FlexSPI input timing in SDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0x3 (Case A1)
Symbol Parameter
Value
Unit
Min Max
Frequency of operation 133 MHz
TSCKD Time from SCK to data valid ns
TSCKDQS Time from SCK to DQS ns
TSCKD - TSCKDQS Time delta between TSCKD and TSCKDQS -2 2 ns
Table 30. FlexSPI input timing in SDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0x3 (Case A2)
Symbol Parameter
Value
Unit
Min Max
Frequency of operation 133 MHz
TSCKD Time from SCK to data valid ns
TSCKDQS Time from SCK to DQS ns
TSCKD - TSCKDQS Time delta between TSCKD and TSCKDQS -2 2 ns
T
SCKDQS
SCK
SIO[0:7]
DQS
T
SCKD
T
SCKDQS
T
SCKD
Electrical characteristics
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NXP Semiconductors 37
Figure 17. FlexSPI input timing in SDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0X3 (Case A2)
NOTE
Timing shown is based on the memory generating read data on the SCK
falling edge and read strobe on the SCK rising edge. The FlexSPI controller
samples read data on a half cycle delayed DQS falling edge.
4.5.1.1.3 DDR mode with FlexSPIn_MCR0[RXCLKSRC] = 0x0, 0x1
Figure 18. FlexSPI input timing in DDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0x0, 0x1
Table 31. FlexSPI input timing in DDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0x0
Symbol Parameter Min Max Unit
Frequency of operation 30 MHz
TIS Setup time for incoming data 8.67 ns
TIH Hold time for incoming data 0 ns
Table 32. FlexSPI input timing in DDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0x1
Symbol Parameter Min Max Unit
Frequency of operation 66 MHz
TIS Setup time for incoming data 2 ns
TIH Hold time for incoming data 1 ns
TSCKDQS
TSCKD
SCK
SIO[0:7]
DQS
Internal Sample Clock
TSCKDQS
TSCKD
TSCKDQS
TSCKD
T
IS
T
IH
T
IS
T
IH
SCLK
SIO[0:7]
Internal Sample Clock
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Electrical characteristics
4.5.1.1.4 DDR mode with FlexSPIn_MCR0[RXCLKSRC] = 0x3
There are two cases when the memory provides both read data and the read strobe in DDR mode:
B1Memory generates both read data and read strobe on SCK edge
B2Memory generates read data on SCK edge and generates read strobe on SCK2
edge
Figure 19. FlexSPI input timing in DDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0x3 (Case B1)
Table 33. FlexSPI input timing in DDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0x3 (Case B1)
Symbol Parameter Min Max Unit
Frequency of operation 133 MHz
TSCKD Time from SCK to data valid ns
TSCKDQS Time from SCK to DQS ns
TSCKD - TSCKDQS Time delta between TSCKD and TSCKDQS -1 1 ns
Table 34. FlexSPI input timing in DDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0x3 (Case B2)
Symbol Parameter Min Max Unit
Frequency of operation 133 MHz
TSCKD Time from SCK to data valid ns
TSCKD - TSCKDQS Time delta between TSCKD and TSCKDQS -1 1 ns
TSCKD
TSCKDQS
SIO[0:7]
DQS
SCK
LU— _\_H F H 5 mm + H H H H H M w
Electrical characteristics
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 39
Figure 20. FlexSPI input timing in DDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0x3 (Case B2)
4.5.1.2 FlexSPI output/write timing
The following sections describe output signal timing for the FlexSPI controller including control signals
and data outputs.
4.5.1.2.1 SDR mode
NOTE
TCSS and TCSH are configured by the FlexSPIn_FLSHAxCR1
register, the default values are shown above. Please refer to the i.MX
RT1010 Reference Manual (IMXRT1010RM) for more details.
Figure 21. FlexSPI output timing in SDR mode
Table 35. FlexSPI output timing in SDR mode
Symbol Parameter Min Max Unit
Frequency of operation 1331
1The actual maximum frequency supported is limited by the FlexSPIn_MCR0[RXCLKSRC] configuration used. Please refer to the FlexSPI SDR input timing
specifications.
MHz
Tck SCK clock period 6.0 ns
TDVO Output data valid time 1 ns
TDHO Output data hold time -1 ns
TCSS Chip select output setup time 3 x TCK -1 ns
TCSH Chip select output hold time 3 x TCK + 2 ns
T
SCKD
T
SCK2DQS
SCK2
SIO[0:7]
DQS
SCK
T
CSS
T
CK TCSH
T
DVO
T
DHO
T
DVO
T
DHO
SCK
CS
SIO[0:7]
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40 NXP Semiconductors
Electrical characteristics
4.5.1.2.2 DDR mode
NOTE
TCSS and TCSH are configured by the FlexSPIn_FLSHAxCR1
register, the default values are shown above. Please refer to the i.MX
RT1010 Reference Manual (IMXRT1010RM) for more details.
Figure 22. FlexSPI output timing in DDR mode
4.6 Audio
This section provide information about SAI/I2S and SPDIF.
4.6.1 SAI/I2S switching specifications
This section provides the AC timings for the SAI in master (clocks driven) and slave (clocks input) modes.
All timings are given for non-inverted serial clock polarity (SAI_TCR[TSCKP] = 0, SAI_RCR[RSCKP]
= 0) and non-inverted frame sync (SAI_TCR[TFSI] = 0, SAI_RCR[RFSI] = 0). If the polarity of the clock
and/or the frame sync have been inverted, all the timings remain valid by inverting the clock signal
(SAI_BCLK) and/or the frame sync (SAI_FS) shown in the figures below.
Table 36. FlexSPI output timing in DDR mode
Symbol Parameter Min Max Unit
Frequency of operation1
1The actual maximum frequency supported is limited by the FlexSPIn_MCR0[RXCLKSRC] configuration used. Please refer to the FlexSPI SDR input timing
specifications.
—133MHz
Tck SCK clock period (FlexSPIn_MCR0[RXCLKSRC] = 0x0) 6.0 ns
TDVO Output data valid time 2.2 ns
TDHO Output data hold time 0.8 ns
TCSS Chip select output setup time 3 x TCK / 2 - 0.7 ns
TCSH Chip select output hold time 3 x TCK / 2 + 0.8 ns
T
CSS
T
CK
T
DVO
T
DHO
T
DVO
T
DHO
T
CSH
SCK
CS
SIO[0:7]
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Electrical characteristics
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 41
Figure 23. SAI timing—master modes
Table 37. Master mode SAI timing
Num Characteristic Min Max Unit
S1 SAI_MCLK cycle time 2 x tsys —ns
S2 SAI_MCLK pulse width high/low 40% 60% MCLK period
S3 SAI_BCLK cycle time 4 x tsys —ns
S4 SAI_BCLK pulse width high/low 40% 60% BCLK period
S5 SAI_BCLK to SAI_FS output valid 15 ns
S6 SAI_BCLK to SAI_FS output invalid 0 ns
S7 SAI_BCLK to SAI_TXD valid 15 ns
S8 SAI_BCLK to SAI_TXD invalid 0 ns
S9 SAI_RXD/SAI_FS input setup before SAI_BCLK 15 ns
S10 SAI_RXD/SAI_FS input hold after SAI_BCLK 0 ns
Table 38. Slave mode SAI timing
Num Characteristic Min Max Unit
S11 SAI_BCLK cycle time (input) 4 x tsys —ns
S12 SAI_BCLK pulse width high/low (input) 40% 60% BCLK period
S13 SAI_FS input setup before SAI_BCLK 10 ns
S14 SAI_FA input hold after SAI_BCLK 2 ns
S15 SAI_BCLK to SAI_TXD/SAI_FS output valid 20 ns
S16 SAI_BCLK to SAI_TXD/SAI_FS output invalid 0 ns
IZSABCLK (Input) Izsjs (ompull IZSAFS (Input) IZSATXD IZSARXD i *Imf a H 1 L a A r 'HT': H \— sm—H F‘: 3113—! . -x- u »
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42 NXP Semiconductors
Electrical characteristics
Figure 24. SAI timing—slave modes
4.6.2 SPDIF timing parameters
The Sony/Philips Digital Interconnect Format (SPDIF) data is sent using the bi-phase marking code. When
encoding, the SPDIF data signal is modulated by a clock that is twice the bit rate of the data signal.
Table 39 and Figure 25 and Figure 26 show SPDIF timing parameters for the Sony/Philips Digital
Interconnect Format (SPDIF), including the timing of the modulating Rx clock (SPDIF_SR_CLK) for
SPDIF in Rx mode and the timing of the modulating Tx clock (SPDIF_ST_CLK) for SPDIF in Tx mode.
S17 SAI_RXD setup before SAI_BCLK 10 ns
S18 SAI_RXD hold after SAI_BCLK 2 ns
Table 39. SPDIF timing parameters
Characteristics Symbol
Timing parameter range
Unit
Min Max
SPDIF_IN Skew: asynchronous inputs, no specs apply 0.7 ns
SPDIF_OUT output (Load = 50pf)
Skew
Transition rising
Transition falling
1.5
24.2
31.3
ns
SPDIF_OUT1 output (Load = 30pf)
Skew
Transition rising
Transition falling
1.5
13.6
18.0
ns
Modulating Rx clock (SPDIF_SR_CLK) period srckp 40.0 ns
Table 38. Slave mode SAI timing
Num Characteristic Min Max Unit
Electrical characteristics
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 43
Figure 25. SPDIF_SR_CLK timing diagram
Figure 26. SPDIF_ST_CLK timing diagram
4.7 Analog
The following sections provide information about analog interfaces.
4.7.1 DCDC
Table 40 introduces the DCDC electrical specification.
SPDIF_SR_CLK high period srckph 16.0 ns
SPDIF_SR_CLK low period srckpl 16.0 ns
Modulating Tx clock (SPDIF_ST_CLK) period stclkp 40.0 ns
SPDIF_ST_CLK high period stclkph 16.0 ns
SPDIF_ST_CLK low period stclkpl 16.0 ns
Table 40. DCDC electrical specifications
Mode Buck mode only, one output Notes
Input voltage 3.3 V ± 10%
Output voltage 1.1 V Configurable 0.8 ~ 1.575 with 25 mV one step
Max loading 500 mA
Loading in low power modes 200 A ~ 30 mA
Efficiency 90% max @150 mA
Table 39. SPDIF timing parameters (continued)
Characteristics Symbol
Timing parameter range
Unit
Min Max
SPDIF_SR_CLK
(Output)
VMVM
srckp
srckph
srckpl
SPDIF_ST_CLK
(Input)
VMVM
stclkp
stclkph
stclkpl
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Electrical characteristics
4.7.2 A/D converter
This section introduces information about A/D converter.
4.7.2.1 12-bit ADC electrical characteristics
The section provide information about 12-bit ADC electrical characteristics.
4.7.2.1.1 12-bit ADC operating conditions
Low power mode Open loop mode Ripple is about 15 mV
Run mode Always continuous mode
Support discontinuous mode
Configurable by register
Inductor 4.7 H—
Capacitor 33 F—
Over voltage protection 1.6 V Detect VDDSOC, when the voltage is higher
than 1.6 V, shutdown DCDC.
Over Current protection 1 A Detect the peak current
Run mode: when the current is larger than
1 A, shutdown DCDC.
Stop mode: when the current is larger than
250 mA, stop charging the inductor.
Low battery detection 2.6 V Detect the battery, when battery is lower than
2.6 V, shutdown DCDC.
Table 41. 12-bit ADC operating conditions
Characteristic Conditions Symb Min Typ1Max Unit Comment
Supply voltage Absolute VDDA 3.0 - 3.6 V
Delta to VDD
(VDD-VDDA)2
VDDA -100 0 100 mV
Ground voltage Delta to VSS
(VSS-VSSAD)
VSSAD -100 0 100 mV
Ref Voltage High VDDA 1.13 VDDA VDDA V
Ref Voltage Low VSS VSS VSS VSS V
Input Voltage VADIN VSS —V
DDA V
Input Capacitance 8/10/12 bit modes CADIN —1.52 pF
Input Resistance ADLPC=0, ADHSC=1 RADIN —5 7 kohms
ADLPC=0, ADHSC=0 12.5 15 kohms
ADLPC=1, ADHSC=0 25 30 kohms
Table 40. DCDC electrical specifications (continued)
Mode Buck mode only, one output Notes
Simplified irpul pin equivalem cimuil ,_ __________ ‘ ZADIN : Pad 1 r> lea a ' Simplified chan nsl 2‘3 : dug I ' saladcimuit ( | n 1 : input 1 l r} ******* As | protection I ADN I 4, E '1 $ : 0/0 ' VADIN' I : : V C i — : I : . ' I I I : I : I L» f f I f I j i ‘ l ___________ A I : I RADN ‘4 g—f’vvv—O/ Inpulpln : Rum . I lnpulpln : Rum Inpu1 pin
Electrical characteristics
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 45
Figure 27. 12-bit ADC input impedance equivalency diagram
Analog Source
Resistance
12 bit mode fADCK =
40MHz ADLSMP=0,
ADSTS=10, ADHSC=1
RAS 1 kohms Tsamp=150
ns
RAS depends on Sample Time Setting (ADLSMP, ADSTS) and ADC Power Mode (ADHSC, ADLPC). See charts for Minimum
Sample Time vs RAS
ADC Conversion Clock
Frequency
ADLPC=0, ADHSC=1
12 bit mode
fADCK 4 40 MHz
ADLPC=0, ADHSC=0
12 bit mode
4 30 MHz
ADLPC=1, ADHSC=0
12 bit mode
4 20 MHz
1Typical values assume VDDAD = 3.0 V, Temp = 25°C, fADCK=20 MHz unless otherwise stated. Typical values are for reference
only and are not tested in production.
2DC potential differences
Table 41. 12-bit ADC operating conditions (continued)
Characteristic Conditions Symb Min Typ1Max Unit Comment
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46 NXP Semiconductors
Electrical characteristics
12-bit ADC characteristics
Table 42. 12-bit ADC characteristics (VREFH = VDDA, VREFL = VSSAD)
Characteristic Conditions1Symb Min Typ2Max Unit Comment
Supply Current ADLPC=1,
ADHSC=0
IDDA 250 µA ADLSMP = 0, ADSTS
= 10, ADCO = 1
ADLPC=0,
ADHSC=0
350
ADLPC=0,
ADHSC=1
400
Supply Current Stop, Reset, Module
Off
IDDA —0.010.8µA
ADC Asynchronous
Clock Source
ADHSC=0 fADACK 10 MHz tADACK = 1/fADACK
ADHSC=1 20
Sample Cycles ADLSMP=0,
ADSTS=00
Csamp 2 cycles
ADLSMP=0,
ADSTS=01
4
ADLSMP=0,
ADSTS=10
6
ADLSMP=0,
ADSTS=11
8
ADLSMP=1,
ADSTS=00
12
ADLSMP=1,
ADSTS=01
16
ADLSMP=1,
ADSTS=10
20
ADLSMP=1,
ADSTS=11
24
Electrical characteristics
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 47
Conversion Cycles ADLSMP=0
ADSTS=00
Cconv 28 cycles
ADLSMP=0
ADSTS=01
30
ADLSMP=0
ADSTS=10
32
ADLSMP=0
ADSTS=11
34
ADLSMP=1
ADSTS=00
38
ADLSMP=1
ADSTS=01
42
ADLSMP=1
ADSTS=10
46
ADLSMP=1,
ADSTS=11
50
Conversion Time ADLSMP=0
ADSTS=00
Tconv 0.7 µs Fadc = 40 MHz
ADLSMP=0
ADSTS=01
0.75
ADLSMP=0
ADSTS=10
0.8
ADLSMP=0
ADSTS=11
0.85
ADLSMP=1
ADSTS=00
0.95
ADLSMP=1
ADSTS=01
1.05
ADLSMP=1
ADSTS=10
1.15
ADLSMP=1,
ADSTS=11
1.25
Total Unadjusted
Error
12 bit mode TUE 3.4 LSB
1 LSB =
(VREFH -
VREFL)/2
N
AVGE = 1, AVGS = 11
10 bit mode 1.5
8 bit mode 1.2
Differential
Non-Linearity
12 bit mode DNL 0.76 LSB AVGE = 1, AVGS = 11
10bit mode 0.36
8 bit mode 0.14
Table 42. 12-bit ADC characteristics (VREFH = VDDA, VREFL = VSSAD) (continued)
Characteristic Conditions1Symb Min Typ2Max Unit Comment
1200 «we 8 o m gamma Twme ms! 8 B o o / ‘ ‘ ‘ 4 6 a 10 Has won ms‘ — HSQIJPQO — H564) LPCao — Hsao. LP&1
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
48 NXP Semiconductors
Electrical characteristics
NOTE
The ADC electrical spec is met with the calibration enabled configuration.
Figure 28. Minimum Sample Time Vs Ras (Cas = 2 pF)
Integral Non-Linearity 12 bit mode INL 2.78 LSB AVGE = 1, AVGS = 11
10bit mode 0.61
8 bit mode 0.14
Zero-Scale Error 12 bit mode EZS -1.14 LSB AVGE = 1, AVGS = 11
10bit mode -0.25
8 bit mode -0.19
Full-Scale Error 12 bit mode EFS -1.06 LSB AVGE = 1, AVGS = 11
10bit mode -0.03
8 bit mode -0.02
Effective Number of
Bits
12 bit mode ENOB 10.1 10.7 Bits AVGE = 1, AVGS = 11
Signal to Noise plus
Distortion
See ENOB SINAD SINAD = 6.02 x ENOB + 1.76 dB AVGE = 1, AVGS = 11
1All accuracy numbers assume the ADC is calibrated with VREFH=VDDAD
2Typical values assume VDDAD = 3.0 V, Temp = 25°C, Fadck=20 MHz unless otherwise stated. Typical values are for reference
only and are not tested in production.
Table 42. 12-bit ADC characteristics (VREFH = VDDA, VREFL = VSSAD) (continued)
Characteristic Conditions1Symb Min Typ2Max Unit Comment
Mln Samph Time ms) Mln same Tlme (n3) 4 s museums) 4 s Hummus) — H5121, chgn — HSC-O. LPG-0 — HEM. LPCs1 — H56:1.LPC=D _ Hsc=o,LPc=n — HEM. LFC=1
Electrical characteristics
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 49
Figure 29. Minimum Sample Time Vs Ras (Cas = 5 pF)
Figure 30. Minimum Sample Time Vs Ras (Cas = 10 pF)
4.8 Communication interfaces
The following sections provide the information about communication interfaces.
4.8.1 LPSPI timing parameters
The Low Power Serial Peripheral Interface (LPSPI) provides a synchronous serial bus with master and
slave operations. Many of the transfer attributes are programmable. The following tables provide timing
characteristics for classic LPSPI timing modes.
All timing is shown with respect to 20% VDD and 80% VDD thresholds, unless noted, as well as input
signal transitions of 3 ns and a 30 pF maximum load on all LPSPI pins.
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
50 NXP Semiconductors
Electrical characteristics
Figure 31. LPSPI Master mode timing (CPHA = 0)
Table 43. LPSPI Master mode timing
Number Symbol Description Min. Max. Units Note
1f
SCK Frequency of operation fperiph / 2 MHz 1
1Absolute maximum frequency of operation (fop) is 30 MHz. The clock driver in the LPSPI module for fperiph must be
guaranteed this limit is not exceeded.
2t
SCK SCK period 2 x tperiph —µs
2
2tperiph = 1000 / fperiph
3t
Lead Enable lead time 1 tperiph
4t
Lag Enable lag time 1 tperiph
5t
WSCK Clock (SCK) high or low time tSCK / 2 - 3 ns
6t
SU Data setup time (inputs) 10 ns
7t
HI Data hold time (inputs) 2 ns
8t
VData valid (after SCK edge) 8 ns
9t
HO Data hold time (outputs) 0 ns
(OUTPUT)
2
8
6 7
MSB IN2
LSB IN
MSB OUT2LSB OUT
9
5
5
3
(CPOL=0)
4
SCK
SCK
(CPOL=1)
2. LSBF = 0. For LSBF = 1, bit order is LSB, bit 1, ..., bit 6, MSB.
1. If configured as an output.
PCS1
(OUTPUT)
(OUTPUT)
SOUT
(OUTPUT)
SIN
(INPUT)
BIT 6 . . . 1
BIT 6 . . . 1
Electrical characteristics
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 51
Figure 32. LPSPI Master mode timing (CPHA = 1)
sTable 44. LPSPI Slave mode timing
Number Symbol Description Min. Max. Units Note
1f
SCK Frequency of operation 0 fperiph / 2 MHz 1
1Absolute maximum frequency of operation (fop) is 30 MHz. The clock driver in the LPSPI module for fperiph must be
guaranteed this limit is not exceeded.
2t
SCK SCK period 2 x tperiph —µs
2
2tperiph = 1000 / fperiph
3t
Lead Enable lead time 1 tperiph
4t
Lag Enable lag time 1 tperiph
5t
WSCK Clock (SCK) high or low time tSCK / 2 - 5 ns
6t
SU Data setup time (inputs) 2.7 ns
7t
HI Data hold time (inputs) 3.8 ns
8t
aSlave access time tperiph ns 3
3Time to data active from high-impedance state
9t
dis Slave MISO disable time tperiph ns 4
4Hold time to high-impedance state
10 tVData valid (after SCK edge) 14.5 ns
11 tHO Data hold time (outputs) 0 ns
2
6 7
MSB IN2
BIT 6 . . . 1
MASTER MSB OUT2MASTER LSB OUT
5
5
8
PORT DATA
PORT DATA
34
1.If configured as output
2. LSBF = 0. For LSBF = 1, bit order is LSB, bit 1, ..., bit 6, MSB.
9
(OUTPUT)
(CPOL=0)
SCK
SCK
(CPOL=1)
PCS1
(OUTPUT)
(OUTPUT)
SOUT
(OUTPUT)
SIN
(INPUT)
LSB IN
BIT 6 . . . 1
HF OTTO a r0 (Lg, $01
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
52 NXP Semiconductors
Electrical characteristics
Figure 33. LPSPI Slave mode timing (CPHA = 0)
Figure 34. LPSPI Slave mode timing (CPHA = 1)
2
10
6 7
MSB IN
BIT 6 . . . 1
SLAVE MSB
SLAVE LSB OUT
11
5
5
3
8
4
11
SEE
NOTE
9
see
note
(INPUT)
(CPOL=0)
SCK
SCK
(CPOL=1)
PCS
(INPUT)
(INPUT)
SOUT
(INPUT)
SIN
(OUTPUT)
LSB IN
BIT 6 . . . 1 NOTE: Not defined
2
6 7
MSB IN
BIT 6 . . . 1
MSB OUT SLAVE LSB OUT
5
5
10
3
4
SLAVE
8
9
see
note
(INPUT)
(CPOL=0)
SCK
SCK
(CPOL=1)
PCS
(INPUT)
(INPUT)
SOUT
(INPUT)
SIN
(OUTPUT)
11
LSB IN
BIT 6 . . . 1
NOTE: Not defined
Electrical characteristics
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 53
4.8.2 LPI2C module timing parameters
This section describes the timing parameters of the LPI2C module.
4.8.3 LPUART electrical specifications
Please refer to Section 4.3.2.1, "General purpose I/O AC parameters".
4.8.4 USB PHY parameters
This section describes the USB-OTG PHY parameters.
The USB PHY meets the electrical compliance requirements defined in the Universal Serial Bus Revision
2.0 OTG with the following amendments.
USB ENGINEERING CHANGE NOTICE
Title: 5V Short Circuit Withstand Requirement Change
Applies to: Universal Serial Bus Specification, Revision 2.0
Errata for USB Revision 2.0 April 27, 2000 as of 12/7/2000
USB ENGINEERING CHANGE NOTICE
Title: Pull-up/Pull-down resistors
Applies to: Universal Serial Bus Specification, Revision 2.0
USB ENGINEERING CHANGE NOTICE
Title: Suspend Current Limit Changes
Applies to: Universal Serial Bus Specification, Revision 2.0
USB ENGINEERING CHANGE NOTICE
Title: USB 2.0 Phase Locked SOFs
Applies to: Universal Serial Bus Specification, Revision 2.0
On-The-Go and Embedded Host Supplement to the USB Revision 2.0 Specification
Revision 2.0 plus errata and ecn June 4, 2010
Battery Charging Specification (available from USB-IF)
Table 45. LPI2C module timing parameters
Symbol Description Min Max Unit Notes
fSCL SCL clock frequency Standard mode (Sm) 0 100 kHz 1, 2
1Hs-mode is only supported in slave mode.
2See General switching specifications.
Fast mode (Fm) 0 400
Fast mode Plus (Fm+) 0 1000
Ultra Fast mode (UFm) 0 5000
High speed mode (Hs-mode) 0 3400
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
54 NXP Semiconductors
Electrical characteristics
Revision 1.2, December 7, 2010
Portable device only
4.9 Timers
This section provide information on timers.
4.9.1 Pulse Width Modulator (PWM) characteristics
This section describes the electrical information of the PWM.
Table 46. PWM timing parameters
Parameter Symbo Min Typ Max Unit
PWM Clock Frequency 132 MHz
Power-up Time tpu —25s
Boot mode configuration
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 55
5 Boot mode configuration
This section provides information on boot mode configuration pins allocation and boot devices interfaces
allocation.
5.1 Boot mode configuration pins
Table 47 provides boot options, functionality, fuse values, and associated pins. Several input pins are also
sampled at reset and can be used to override fuse values, depending on the value of BT_FUSE_SEL fuse.
The boot option pins are in effect when BT_FUSE_SEL fuse is ‘0’ (cleared, which is the case for an
unblown fuse). For detailed boot mode options configured by the boot mode pins, see the i.MX RT1010
Fuse Map document and the System Boot chapter in i.MX RT1010 Reference Manual (IMXRT1010RM).
5.2 Boot device interface allocation
The following tables list the interfaces that can be used by the boot process in accordance with the specific
boot mode configuration. The tables also describe the interface’s specific modes and IOMUXC allocation,
which are configured during boot when appropriate.
Table 47. Fuses and associated pins used for boot
Pad Default setting on reset eFuse name Details
GPIO_SD_04 100 K pull-down src.BOOT_MODE[0]
GPIO_SD_03 100 K pull-down src.BOOT_MODE[1]
GPIO_SD_02 100 K pull-down src.BT_CFG[0] Boot Options, Pin value overrides fuse
settings for BT_FUSE_SEL = ‘0’.
Signal Configuration as Fuse Override
Input at Power Up.
These are special I/O lines that control
the boot up configuration during
product development. In production,
the boot configuration can be
controlled by fuses.
GPIO_SD_01 100 K pull-down src.BT_CFG[1]
GPIO_SD_00 100 K pull-down src.BT_CFG[2]
Table 48. Boot through FlexSPI
PAD Name IO Function Mux Mode Comments
GPIO_SD_04 flexspi.B_DATA[3] ALT 0
GPIO_SD_02 flexspi.B_DATA[2] ALT 0
GPIO_SD_01 flexspi.B_DATA[1] ALT 0
GPIO_SD_03 flexspi.B_DATA[0] ALT 0
GPIO_SD_13 flexspi.B_SCLK ALT 0
GPIO_00 flexspi.B_DQS ALT 0
GPIO_SD_00 flexspi.B_SS0_B ALT 0
GPIO_SD_12 flexspi.A_DQS ALT 0
GPIO_SD_06 flexspi.A_SS0_B ALT 0
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
56 NXP Semiconductors
Boot mode configuration
GPIO_SD_05 flexspi.A_SS1_B ALT 0
GPIO_SD_10 flexspi.A_SCLK ALT 0
GPIO_SD_09 flexspi.A_DATA[0] ALT 0
GPIO_SD_07 flexspi.A_DATA[1] ALT 0
GPIO_SD_08 flexspi.A_DATA[2] ALT 0
GPIO_SD_11 flexspi.A_DATA[3] ALT 0
Table 49. FlexSPI reset
PAD Name IO Function Mux Mode Comments
GPIO_13 gpiomux.IO[13] ALT 5
Table 50. Boot through UART1
PAD Name IO Function Mux Mode Comments
GPIO_10 lpuart1.TX ALT 0
GPIO_09 lpuart1.RX ALT 0
GPIO_08 lpuart1.CTS_B ALT 6
GPIO_07 lpuart1.RTS_B ALT 6
Table 48. Boot through FlexSPI (continued)
PAD Name IO Function Mux Mode Comments
Package information and contact assignments
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 57
6 Package information and contact assignments
This section includes the contact assignment information and mechanical package drawing.
6.1 12 x 12 mm package information
6.1.1 12 x 12 mm, 0.5 mm pitch, ball matrix
Figure 35 shows the top, bottom, and side views of the 12 x 12 mm LQFP package.
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i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
58 NXP Semiconductors
Package information and contact assignments
Figure 35. 12 x 12 mm LQFP, case x package top and side views
Package information and contact assignments
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 59
6.1.2 12 x 12 mm supplies contact assignments and functional contact
assignments
Table 51 shows the device connection list for ground, sense, and reference contact signals.
Table 52 shows an alpha-sorted list of functional contact assignments for the 12 x 12 mm package.
Table 51. 12 x 12 mm supplies contact Assignment
Supply Rail Name Pin(s) Position(s) Remark
DCDC_IN 18
DCDC_IN_Q 17
DCDC_GND 20
DCDC_LP 19
DCDC_PSWITCH 15
NGND_KEL0 34
NVCC_GPIO 7, 50, 63, 71
NVCC_PLL 40
VDDA_ADC_3P3 42
VDD_HIGH_CAP 35
VDD_HIGH_IN 39
VDD_SNVS_CAP 26
VDD_SNVS_IN 25
VDD_SOC_IN 14, 53, 77
VDD_USB_CAP 31
VSS 16, 54, 30, 78
VSSA_ADC_3P3 41
Table 52. 12 x 12 mm functional contact assignments
Pin Name 12 x 12
Pin
Power
Group
Pin
Type
Default Setting Default setting
on Reset
Default
Mode
Default
Function
Input/
Output Value Input/
Output Value
GPIO_00 13 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO00 Input Keeper Input 100K PD
GPIO_01 12 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO01 Input Keeper Input Keeper
GPIO_02 11 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO02 Input Keeper Input Keeper
GPIO_03 10 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO03 Input Keeper Input Keeper
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60 NXP Semiconductors
Package information and contact assignments
GPIO_04 9 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO04 Input Keeper Input Keeper
GPIO_05 8 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO05 Input Keeper Input Keeper
GPIO_06 6 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO06 Input Keeper Input Keeper
GPIO_07 5 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO07 Input Keeper Input Keeper
GPIO_08 4 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO08 Input Keeper Input Keeper
GPIO_09 3 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO09 Input Keeper Input Keeper
GPIO_10 2 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO10 Input Keeper Input Keeper
GPIO_11 1 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO11 Input Keeper Input Keeper
GPIO_12 80 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO12 Input Keeper Input Keeper
GPIO_13 79 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO13 Input Keeper Input Keeper
GPIO_AD_00 60 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO14 Input Keeper Input Keeper
GPIO_AD_01 59 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO15 Input Keeper Input Keeper
GPIO_AD_02 58 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO16 Input Keeper Input Keeper
GPIO_AD_03 57 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO17 Input Keeper Input Keeper
GPIO_AD_04 56 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO18 Input Keeper Output1Keeper
GPIO_AD_05 55 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO19 Input Keeper Input Keeper
GPIO_AD_06 52 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO20 Input Keeper Input Keeper
GPIO_AD_07 51 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO21 Input Keeper Input Keeper
GPIO_AD_08 49 NVCC_GPIO Digital
GPIO
Alt 7 JTAG_TRSTB Input 47K PU Input 47K PU
GPIO_AD_09 48 NVCC_GPIO Digital
GPIO
Alt 7 JTAG_TDO Input Keeper Input Keeper
GPIO_AD_10 47 NVCC_GPIO Digital
GPIO
Alt 7 JTAG_TDI Input 47K PU Input 47K PU
Table 52. 12 x 12 mm functional contact assignments (continued)
Package information and contact assignments
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 61
GPIO_AD_11 46 NVCC_GPIO Digital
GPIO
Alt 7 JTAG_MOD Input 100K PD Input 100K PD
GPIO_AD_12 45 NVCC_GPIO Digital
GPIO
Alt 7 JTAG_TCK Input 100K PD Input 100K PD
GPIO_AD_13 44 NVCC_GPIO Digital
GPIO
Alt 7 JTAG_TMS Input 47K PU Input 47K PU
GPIO_AD_14 43 NVCC_GPIO Digital
GPIO
Alt 5 GPIOMUX_IO28 Input Keeper Input Keeper
GPIO_SD_00 76 NVCC_GPIO Digital
GPIO
Alt 5 GPIO2_IO00 Input Keeper Input 100K PD
GPIO_SD_01 75 NVCC_GPIO Digital
GPIO
Alt 5 GPIO2_IO01 Input Keeper Input 100K PD
GPIO_SD_02 74 NVCC_GPIO Digital
GPIO
Alt 5 GPIO2_IO02 Input Keeper Input 100K PD
GPIO_SD_03 73 NVCC_GPIO Digital
GPIO
Alt 6 SRC_BOOT_MOD
E1
Input 100K PD Input 100K PD
GPIO_SD_04 72 NVCC_GPIO Digital
GPIO
Alt 6 SRC_BOOT_MOD
E0
Input 100K PD Input 100K PD
GPIO_SD_05 70 NVCC_GPIO Digital
GPIO
Alt 5 GPIO2_IO05 Input Keeper Input Keeper
GPIO_SD_06 69 NVCC_GPIO Digital
GPIO
Alt 5 GPIO2_IO06 Input Keeper Input Keeper
GPIO_SD_07 68 NVCC_GPIO Digital
GPIO
Alt 5 GPIO2_IO07 Input Keeper Input Keeper
GPIO_SD_08 67 NVCC_GPIO Digital
GPIO
Alt 5 GPIO2_IO08 Input Keeper Input Keeper
GPIO_SD_09 66 NVCC_GPIO Digital
GPIO
Alt 5 GPIO2_IO09 Input Keeper Input Keeper
GPIO_SD_10 65 NVCC_GPIO Digital
GPIO
Alt 5 GPIO2_IO10 Input Keeper Input Keeper
GPIO_SD_11 64 NVCC_GPIO Digital
GPIO
Alt 5 GPIO2_IO11 Input Keeper Input Keeper
GPIO_SD_12 62 NVCC_GPIO Digital
GPIO
Alt 5 GPIO2_IO12 Input Keeper Input Keeper
GPIO_SD_13 61 NVCC_GPIO Digital
GPIO
Alt 5 GPIO2_IO13 Input Keeper Input 100K PD
ONOFF 21 VDD_SNVS_I
N
Digital
GPIO
Alt 0 SRC_RESET_B Input 100K PU Input 100K PU
PMIC_ON_REQ 24 VDD_SNVS_I
N
Digital
GPIO
Alt 0 SNVS_PMIC_ON_
REQ
Output 100K PU Output 100K PU
POR_B 22 VDD_SNVS_I
N
Digital
GPIO
Alt 0 SRC_POR_B Input 100K PU Input 100K PU
Table 52. 12 x 12 mm functional contact assignments (continued)
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
62 NXP Semiconductors
Package information and contact assignments
RTC_XTALI 27 — —— —— ——
RTC_XTALO 28 — —— —— ——
TEST_MODE 23 VDD_SNVS_I
N
Digital
GPIO
Alt 0 TCU_TEST_MOD
E
Input 100K PD Input 100K PD
USB_OTG1_CH
D_B
36 — —— —— ——
USB_OTG1_DN 32 — —— ——
USB_OTG1_DP 33 — —— ——
USB_OTG1_VB
US
29 — —— —— ——
XTALI 37 — —— ——
XTALO 38 — —— ——
1This pin output is in a high level until the system reset is complete.
Table 52. 12 x 12 mm functional contact assignments (continued)
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Package information and contact assignments
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
NXP Semiconductors 63
6.1.3 12 x 12 mm package pin assignments
Figure 36 shows the pin assignments of the 12 x 12 mm package.
Figure 36. The pin assignments of the 12 x 12 mm package
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
16
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
DCDC_GND
DCDC_LP
DCDC_IN
DCDC_IN_Q
VSS
DCDC_PSWITCH
VDD_SOC_IN / DCDC_SENSE
GPIO_00
GPIO_01
GPIO_02
GPIO_03
GPIO_04
GPIO_05
NVCC_GPIO
GPIO_06
GPIO_07
GPIO_08
GPIO_09
GPIO_10
GPIO_11
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
GPIO_12
GPIO_13
VSS
VDD_SOC_IN
GPIO_SD_00
GPIO_SD_01
GPIO_SD_02
GPIO_SD_03
GPIO_SD_04
NVCC_GPIO
GPIO_SD_05
GPIO_SD_06
GPIO_SD_07
GPIO_SD_08
GPIO_SD_09
GPIO_SD_10
GPIO_SD_11
NVCC_GPIO
GPIO_SD_12
GPIO_SD_13
GPIO_AD_00
GPIO_AD_01
GPIO_AD_02
GPIO_AD_03
GPIO_AD_04
GPIO_AD_05
VSS
VDD_SOC_IN
GPIO_AD_06
GPIO_AD_07
NVCC_GPIO
GPIO_AD_08
GPIO_AD_09
GPIO_AD_10
GPIO_AD_11
GPIO_AD_12
GPIO_AD_13
GPIO_AD_14
VDDA_ADC_3P3 / ADC_VREFH
VSSA_ADC_3P3 / ADC_VREFL
NVCC_PLL
VDD_HIGH_IN
XTALO
XTALI
USB_OTG1_CHD_B
VDD_HIGH_CAP
NGND_KEL0
USB_OTG1_DP
USB_OTG1_DN
VDD_USB_CAP
VSS
USB_OTG1_VBUS
RTC_XTALO
RTC_XTALI
VDD_SNVS_CAP
VDD_SNVS_IN
PMIC_ON_REQ
TEST_MODE
POR_B
ONOFF
i.MX RT1010 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 09/2019
64 NXP Semiconductors
Revision history
7 Revision history
Table 53 provides a revision history for this data sheet.
Table 53. i.MX RT1010 data sheet document revision history
Rev.
Number Date Substantive Change(s)
Rev. 0 09/2019 Initial version
arm 2. 3. 9‘“ 9‘ O 9.??? Energy ' .. EfficientSOIJfions mmuea «arm power
Information in this document is provided solely to enable system and software implementers to
use NXP products. There are no express or implied copyright licenses granted hereunder to
design or fabricate any integrated circuits based on the information in this document. NXP
reserves the right to make changes without further notice to any products herein.
NXP makes no warranty, representation, or guarantee regarding the suitability of its products
for any particular purpose, nor does NXP assume any liability arising out of the application or
use of any product or circuit, and specifically disclaims any and all liability, including without
limitation consequential or incidental damages. “Typical” parameters that may be provided in
NXP data sheets and/or specifications can and do vary in different applications, and actual
performance may vary over time. All operating parameters, including “typicals” must be
validated for each customer application by customer‚ customer’s technical experts. NXP does
not convey any license under its patent rights nor the rights of others. NXP sells products
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While NXP has implemented advanced security features, all products may be subject to
unidentified vulnerabilities. Customers are responsible for the design and operation of their
applications and products to reduce the effect of these vulnerabilities on customer’s applications
and products, and NXP accepts no liability for any vulnerability that is discovered. Customers
should implement appropriate design and operating safeguards to minimize the risks
associated with their applications and products.
NXP, the NXP logo, NXP SECURE CONNECTIONS FOR A SMARTER WORLD, COOLFLUX,
EMBRACE, GREENCHIP, HITAG, I2C BUS, ICODE, JCOP, LIFE VIBES, MIFARE, MIFARE
CLASSIC, MIFARE DESFire, MIFARE PLUS, MIFARE FLEX, MANTIS, MIFARE ULTRALIGHT,
MIFARE4MOBILE, MIGLO, NTAG, ROADLINK, SMARTLX, SMARTMX, STARPLUG, TOPFET,
TRENCHMOS, UCODE, Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior,
ColdFire, ColdFire+, C-Ware, the Energy Efficient Solutions logo, Kinetis, Layerscape, MagniV,
mobileGT, PEG, PowerQUICC, Processor Expert, QorIQ, QorIQ Qonverge, Ready Play,
SafeAssure, the SafeAssure logo, StarCore, StarCore, Symphony, VortiQa, Vybrid, Airfast,
BeeKit, BeeStack, CoreNet, Flexis, MXC, Platform in a Package, QUICC Engine, SMARTMOS,
Tower, TurboLink, UMEMS, EdgeScale, EdgeLock, eIQ, and Immersive3D are trademarks of
NXP B.V. All other product or service names are the property of their respective owners. AMBA,
Arm, Arm7, Arm7TDMI, Arm9, Arm11, Artisan, big.LITTLE, Cordio, CoreLink, CoreSight,
Cortex, DesignStart, DynamIQ, Jazelle, Keil, Mali, Mbed, Mbed Enabled, NEON, POP,
RealView, SecurCore, Socrates, Thumb, TrustZone, ULINK, ULINK2, ULINK-ME,
ULINK-PLUS, ULINKpro, µVision, Versatile are trademarks or registered trademarks of Arm
Limited (or its subsidiaries) in the US and/or elsewhere. The related technology may be
protected by any or all of patents, copyrights, designs and trade secrets. All rights reserved.
Oracle and Java are registered trademarks of Oracle and/or its affiliates.The Power Architecture
and Power.org word marks and the Power and Power.org logos and related marks are
trademarks and service marks licensed by Power.org.
© 2019 NXP B.V. Document Number: IMXRT1010CEC
Rev. 0
09/2019