ISO3080,82,86,88 Datasheet by Texas Instruments

V'.‘ 1!. IE X E I TEXAS INSTRUMENTS
DE 5
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GALVANIC ISOLATIO
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GALVANIC ISOLATION
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An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
ISO3080
,
ISO3082
,
ISO3086
,
ISO3088
SLOS581I –MAY 2008REVISED APRIL 2017
ISO308x Isolated 5-V Full- and Half-Duplex RS-485 Transceivers
1
1 Features
1 Meets or Exceeds TIA/EIA RS-485 Requirements
Signaling Rates up to 20 Mbps
1/8 Unit Load – Up to 256 Nodes on a Bus
Thermal Shutdown Protection
Low Bus Capacitance – 16 pF (Typical)
50 kV/μs Typical Transient Immunity
Fail-safe Receiver for Bus Open, Short, Idle
3.3-V Inputs are 5-V Tolerant
Bus-Pin ESD Protection
12-kV HBM Between Bus Pins and GND2
6-kV HBM Between Bus Pins and GND1
Safety-Related Certifications:
– 4000-VPK Basic Insulation, 560 VPK VIORM per
DIN V VDE V 0884-10 (VDE V 0884-10):
2006-12 and DIN EN 61010-1
2500 VRMS Isolation per UL 1577
4000 VPK Isolation per CSA Component
Acceptance Notice 5A and IEC 60950-1
2 Applications
Security Systems
Chemical Production
Factory Automation
Motor and Motion Control
HVAC and Building Automation Networks
Networked Security Stations
3 Description
The ISO3080 and ISO3086 devices are isolated full-
duplex differential line drivers and receivers while the
ISO3082 and ISO3088 devices are isolated half-
duplex differential line transceivers for TIA/EIA
485/422 applications.
These devices are ideal for long transmission lines
because the ground loop is broken to allow for a
much larger common-mode voltage range. The
symmetrical isolation barrier of the device is tested to
provide 2500 VRMS of isolation for 60 s per UL 1577
between the bus-line transceiver and the logic-level
interface.
Any cabled I/O can be subjected to electrical noise
transients from various sources. These noise
transients can cause damage to the transceiver
and/or nearby sensitive circuitry if they are of
sufficient magnitude and duration. These isolated
devices can significantly increase protection and
reduce the risk of damage to expensive control
circuits.
The ISO3080, ISO3082, ISO3086, and ISO3088
device are qualified for use from –40°C to +85°C.
Device Information(1)
PART NUMBER PACKAGE BODY SIZE (NOM)
ISO3080
SOIC (16) 10.30 mm × 7.50 mm
ISO3082
ISO3086
ISO3088
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
ISO3080, IOS3086 Function Diagram ISO3082, IOS3088 Function Diagram
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ISO3080
,
ISO3082
,
ISO3086
,
ISO3088
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Table of Contents
1 Features.................................................................. 1
2 Applications ........................................................... 1
3 Description ............................................................. 1
4 Revision History..................................................... 2
5 Pin Configuration and Functions......................... 4
6 Specifications......................................................... 5
6.1 Absolute Maximum Ratings ..................................... 5
6.2 ESD Ratings.............................................................. 5
6.3 Recommended Operating Conditions....................... 5
6.4 Thermal Information.................................................. 6
6.5 Insulation Specifications............................................ 6
6.6 Safety-Related Certifications..................................... 6
6.7 Safety Limiting Values .............................................. 7
6.8 Electrical Characteristics: Driver............................... 7
6.9 Electrical Characteristics: Receiver .......................... 8
6.10 Supply Current ........................................................ 9
6.11 Switching Characteristics: Driver ............................ 9
6.12 Switching Characteristics: Receiver........................ 9
6.13 Insulation Characteristics Curves ......................... 10
6.14 Typical Characteristics.......................................... 11
7 Parameter Measurement Information ................ 13
8 Detailed Description............................................ 17
8.1 Overview ................................................................. 17
8.2 Functional Block Diagrams ..................................... 17
8.3 Feature Description................................................. 18
8.4 Device Functional Modes........................................ 18
9 Application and Implementation ........................ 20
9.1 Application Information............................................ 20
9.2 Typical Application ................................................. 20
10 Power Supply Recommendations ..................... 22
11 Layout................................................................... 22
11.1 Layout Guidelines ................................................. 22
11.2 Layout Example .................................................... 23
12 Device and Documentation Support ................. 24
12.1 Documentation Support ........................................ 24
12.2 Related Links ........................................................ 24
12.3 Receiving Notification of Documentation Updates 24
12.4 Community Resources.......................................... 24
12.5 Trademarks........................................................... 24
12.6 Electrostatic Discharge Caution............................ 24
12.7 Glossary................................................................ 25
13 Mechanical, Packaging, and Orderable
Information ........................................................... 25
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision H (December 2015) to Revision I Page
Changed the L(I01) and L(I02) parameters to external clearance and external creepage, respectively............................... 6
Changed the VPR parameter to apparent charge .................................................................................................................. 6
Switched the R and D pins of the master device in the Typical RS-485 Network With Full-Duplex Transceivers figure.... 20
Added the Receiving Notification of Documentation Updates section ................................................................................. 24
Changed the Electrostatic Discharge Caution statement .................................................................................................... 24
Changes from Revision G (July 2015) to Revision H Page
Changed the CDM value in ESD Ratings From: ±200 To: ±1000 ......................................................................................... 5
Changed the MON value of L(IO1) in Insulation and Safety-Related Package Characteristics From: 8.34 To: 8 mm ........ 6
Changed the MON value of L(IO2) in Insulation and Safety-Related Package Characteristics From: 8.1 To: 8 mm .......... 6
Moved the last list item " Routing the high-speed traces..." to the second list items in Layout Guidelines section............. 22
Changes from Revision F (May 2015) to Revision G Page
Deleted "Rated mains voltage 400 VRMS" from IEC 60664-1 Ratings Table....................................................................... 6
Changed "Maximum case temperature" To: "Maximum safety temperature" in Safety Limiting............................................ 7
Changed the Layout Guidelines section .............................................................................................................................. 22
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ISO3080
,
ISO3082
,
ISO3086
,
ISO3088
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Changes from Revision E (September 2011) to Revision F Page
Added ESD Rating table, Thermal Information table, Feature Description section, Device Functional Modes,
Application and Implementation section, Power Supply Recommendations section, Layout section, Device and
Documentation Support section, and Mechanical, Packaging, and Orderable Information section....................................... 1
Changed Features list item From: IEC 60747-5-2 (VDE 0884, Rev. 2) To: DIN V VDE V 0884-10 (VDE V 0884-10):
2006-12................................................................................................................................................................................... 1
VDE standard changed to DIN V VDE V 0884-10 (VDE V 0884-10):2006-12....................................................................... 1
Changed IEC 60664-1 Ratings Table. Basic isolation group SPECIFICATION entry From: IIIa To: II ................................. 6
Changes from Revision D (January 2011) to Revision E Page
Changed Features list item From: 16 kV HBM To: 12 kV HBM............................................................................................. 1
Changed ESD HBM spec value from ±16 to ±12 in ESD Ratings ......................................................................................... 5
Changes from Revision C (October 2009) to Revision D Page
Added TSTG row to the Absolute Maximum Ratings ............................................................................................................... 5
Added "Dynamic" conditions to Recommended Operating Conditions VID spec with reference to ISO3086
Recommended Minimum Differential Input Voltage vs Signaling Rate.................................................................................. 5
Changed for 3 V to 3.3 V in note 1 of the Recommended Operating Conditions table ......................................................... 5
Changed File Number from '1698195' to '220991 in Regulatory Information ....................................................................... 6
Changed θJA from 212 ° C/W to 168 ° C/W in conditions statement for ISspec.; and MAX current from 210 mA to
157 mA in Safety Limiting....................................................................................................................................................... 7
Deleted VI= VCCI or 0 V from CMTI spec. Conditions statement. Added "Figure 13" in Electrical Characteristics: Driver ... 7
Changed top row, UNIT column, split into 2 rows, top row µs and second row ns in Switching Characteristics: Driver....... 9
Changed graph for " DW-16 θJC Thermal Derating Curve per IEC 60747-5-2 " , Thermal Derating Curve......................... 10
Added the ISO3086 Recommended Minimum Differential Input Voltage vs Signaling Rate graph..................................... 11
Added note to bottom of first page of the Parameter Measurement Information................................................................. 13
Added Footnotes to the Driver Function Table and Receiver Function Table ..................................................................... 18
Changes from Revision B (December 2008) to Revision C Page
Changed Recommended Operating Conditions table note From: For 3-V operation, VCC1 or VCC2 is specified from
3.15 V to 3.6V. To: For 3-V operation, VCC1 is specified from 3.15 V to 3.6V........................................................................ 5
Changes from Revision A (June 2008) to Revision B Page
Changed Features bullet From: 4000-VPEAK Isolation, To: 4000-VPEAK Isolation,, 560-VPEAK VIORM ...................................... 1
Added the CSA column to Regulatory Information................................................................................................................. 6
Changes from Original (May 2008) to Revision A Page
Deleted the CSA column from Regulatory Information. ......................................................................................................... 6
Changed the file number in the VDE column in Regulatory Information From: 40014131 To: 40016131............................. 6
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1
2
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89
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15
16
R
RE
D
GND1
Y
VCC2
B
Z
A
GND2
DE
VCC1
GND1 GND2
GND2
GND1
4
ISO3080
,
ISO3082
,
ISO3086
,
ISO3088
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5 Pin Configuration and Functions
ISO3080 and ISO3086 DW Package
16-Pin SOIC
Top View
ISO3082 and ISO3088 DW Package
16-Pin SOIC
Top View
Pin Functions
PIN
I/O DESCRIPTION
NAME ISO3080,
ISO3086 ISO3082,
ISO3088
A14 I Receiver noninverting input on the bus-side
12 I/O Transceiver noninverting Input or output (I/O) on the bus-side
B13 I Receiver inverting Input on the bus-side
13 I/O Transceiver inverting input or output (I/O) on the bus-side
D 6 6 I Driver input
DE 5 5 I Enables (when high) or disables (when low or open) driver output of ISO308x
GND1
2 2
Ground connection for VCC1
7 7
8 8
GND2
9 9
Ground connection for VCC2
10 10
15 15
NC 11 No connect
14
R 3 3 O Receiver output
RE 4 4 I Disables (when high or open) or enables (when low) receiver output of ISO308x
VCC1 1 1 Power supply, VCC1
VCC2 16 16 Power supply, VCC2
Y 11 O Driver noninverting output
Z 12 O Driver inverting output
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,
ISO3082
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ISO3086
,
ISO3088
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(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values except differential I/O bus voltages are with respect to network ground terminal and are peak voltage values.
6 Specifications
6.1 Absolute Maximum Ratings
See (1).
MIN MAX UNIT
VCC Input supply voltage(2) VCC1, VCC2 –0.3 6 V
VOVoltage at any bus I/O pin –9 14 V
VIT Voltage input, transient pulse (through 100 Ω, see Figure 21) A, B, Y, and Z –50 50 V
VIVoltage input at any D, DE or RE pin –0.5 7 V
IOReceiver output current ±10 mA
TJMaximum junction temperature 150 °C
Tstg Storage temperature –65 150 °C
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.2 ESD Ratings
VALUE UNIT
V(ESD) Electrostatic
discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
Bus pins and GND1 ±6000
V
Bus pins and GND2 ±12000
All pins ±4000
Charged device model (CDM), per JEDEC specification JESD22-C101(2) ±1000
(1) For 5-V operation, VCC1 or VCC2 is specified from 4.5 V to 5.5 V. For 3.3-V operation, VCC1 is specified from 3.15 V to 3.6 V.
6.3 Recommended Operating Conditions
MIN TYP MAX UNIT
VCC1 Logic-side supply voltage (1) 3.15 5.5 V
VCC2 Bus-side supply voltage(1) 4.5 5 5.5 V
VOC Voltage at either bus I/O pin A, B –7 12 V
VIH High-level input voltage D, DE, RE 2 VCC V
VIL Low-level input voltage D, DE, RE 0 0.8
VID Differential input voltage A with respect to B –12 12 V
Dynamic (ISO3086) See Figure 10
RLDifferential input resistance 54 60 Ω
IOOutput current Driver –60 60 mA
Receiver –8 8
TAAmbient temperature –40 85 °C
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ISO3080
,
ISO3082
,
ISO3086
,
ISO3088
SLOS581I –MAY 2008REVISED APRIL 2017
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(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
(2) Tested in accordance with the Low-K or High-K thermal metric definitions of EIA/JESD51-3 for leaded surface mount packages.
6.4 Thermal Information
THERMAL METRIC(1)
ISO308x
UNITDW (SOIC)
16 PINS
RθJA Junction-to-ambient thermal resistance Low-K thermal resistance(2) 168 °C/W
High-K thermal resistance 79.6
RθJC(top) Junction-to-case (top) thermal resistance 39.7 °C/W
RθJB Junction-to-board thermal resistance 44.7 °C/W
ψJT Junction-to-top characterization parameter 11.8 °C/W
ψJB Junction-to-board characterization parameter 44.0 °C/W
RθJC(bot) Junction-to-case (bottom) thermal resistance °C/W
(1) Creepage and clearance requirements should be applied according to the specific equipment isolation standards of an application. Care
should be taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the isolator on
the printed-circuit board do not reduce this distance. Creepage and clearance on a printed-circuit board become equal in certain cases.
Techniques such as inserting grooves and/or ribs on a printed circuit board are used to help increase these specifications.
(2) This coupler is suitable for basic electrical insulation only within the maximum operating ratings. Compliance with the safety ratings shall
be ensured by means of suitable protective circuits.
(3) Apparent charge is electrical discharge caused by a partial discharge (pd).
(4) All pins on each side of the barrier tied together creating a two-terminal device
6.5 Insulation Specifications
PARAMETER TEST CONDITIONS VALUE UNIT
GENERAL
CLR External clearance(1) Shortest terminal-to-terminal distance through air 8 mm
CPG External creepage(1) Shortest terminal-to-terminal distance across the
package surface 8 mm
DTI Distance through the insulation Minimum internal gap (internal clearance) 0.008 mm
CTI Comparative tracking index DIN EN 60112 (VDE 0303-11) 400 V
Material group II
Overvoltage category Rated mains voltage 150 VRMS I-IV
Rated mains voltage 300 VRMS I-III
DIN V VDE V 0884-10 (VDE V 0884-10):2006-12(2)
VIORM Maximum repetitive peak isolation voltage AC voltage (bipolar) 560 VPK
VIOTM Maximum transient isolation voltage VTEST = VIOTM, t = 60 s (qualification);
t = 1 s (100% production) 4000 VPK
qpd Apparent charge(3) Method b1, VPR = VIORM × 1.5,
100% Production test with t = 1 s 5 pC
CIO Barrier capacitance, input to output(4) VI= 0.4 sin (4E6πt) 2 pF
RIO Isolation resistance, input to output(4) VIO = 500 V, TA= 25°C, all pins on each side of the
barrier tied together creating a 2-terminal device >1012 Ω
VIO = 500 V at TS= 150°C >109Ω
Pollution degree 2
Climatic category 40/125/21
6.6 Safety-Related Certifications
VDE CSA UL
Certified according to DIN V VDE V 0884-10 (VDE
V 0884-10):2006-12 Approved under CSA Component
Acceptance Notice 5A and IEC 60950-1 Recognized under UL 1577
Component Recognition Program
Basic insulation,
4000 VPK Maximum transient overvoltage,
560 VPK Maximum repetitive peak isolation voltage
4000 VPK Isolation rating,
560 VPK Basic working voltage per CSA
60950-1-07 and IEC 60950-1 (2nd Ed) Single Protection, 2500 VRMS
Certificate number: 40016131 Master contract number: 220991 File number: E181974
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ISO3080
,
ISO3082
,
ISO3086
,
ISO3088
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(1) The safety-limiting constraint is the maximum junction temperature specified in the data sheet. The power dissipation and junction-to-air
thermal impedance of the device installed in the application hardware determines the junction temperature. The assumed junction-to-air
thermal resistance in the Thermal Information table is that of a device installed on a high-K test board for leaded surface-mount
packages. The power is the recommended maximum input voltage times the current. The junction temperature is then the ambient
temperature plus the power times the junction-to-air thermal resistance.
6.7 Safety Limiting Values
Safety limiting(1) intends to minimize potential damage to the isolation barrier upon failure of input or output circuitry. A failure
of the I/O can allow low resistance to ground or the supply and, without current limiting, dissipate sufficient power to overheat
the die and damage the isolation barrier, potentially leading to secondary system failures.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ISSafety input, output, or supply
current RθJA = 79.6°C/W, VI= 5.5 V, TJ= 150°C, TA= 25°C,
see Figure 1 286 mA
TSSafety temperature 150 °C
6.8 Electrical Characteristics: Driver
over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
| VOD |Differential output voltage
magnitude
IO= 0 mA, no load 3 4.3 VCC
V
RL= 54 Ω, See Figure 11 1.5 2.3
RL= 100 Ω(RS-422), See Figure 11 2 2.3
Vtest from –7 V to +12 V, See Figure 12 1.5
Δ|VOD|Change in magnitude of the
differential output voltage See Figure 11 and Figure 12 –0.2 0 0.2 V
VOC(SS) Steady-state common-mode
output voltage See Figure 13 1 2.6 3
V
ΔVOC(SS) Change in steady-state common-
mode output voltage See Figure 13 –0.1 0.1
VOC(pp) Peak-to-peak common-mode
output voltage See Figure 13 0.5 V
IIInput current D, DE, VIat 0 V or VCC1 –10 10 μA
IOZ High-impedance state output
current
ISO3082, ISO3088 See the receiver bias input
current parameter
ISO3080
ISO3086
VYor VZ= 12 V,
VCC = 0 V or 5 V,
DE = 0 V, Other input at 0 V 1
μA
VYor VZ= –7 V.
VCC = 0 V or 5 V,
DE = 0 V, Other input at 0 V –1
IOS Short-circuit output current VAor VBat –7 V, Other input at 0 V –200 200 mA
VAor VBat 12 V, Other input at 0 V
CMTI Common-mode transient
immunity See Figure 22 and Figure 23 25 50 kV/μs
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ISO3080
,
ISO3082
,
ISO3086
,
ISO3088
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6.9 Electrical Characteristics: Receiver
over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VIT(+) Positive-going input threshold
voltage IO= –8 mA –85 –10 mV
VIT(–) Negative-going input threshold
voltage IO= 8 mA –200 –115 mV
Vhys Hysteresis voltage (VIT+ – VIT–) 30 mV
VOH High-level output voltage VID = 200 mV, IO= –8 mA,
See Figure 17
3.3-V VCC1 VCC1
0.4 3.1 V
5-V VCC1 4 4.8
VOL Low-level output voltage VID = –200 mV, IO= 8 mA,
See Figure 17
3.3-V VCC1 0.15 0.4 V
5-V VCC1 0.15 0.4
IO(Z) High-impedance state output
current VI= –7 to 12 V, Other input = 0 V –1 1 μA
IIBus input current
VAor VB= 12 V, Other input at 0 V 0.04 0.1
mA
VAor VB= 12 V, VCC = 0, Other input at 0 V 0.06 0.13
VAor VB= –7 V, Other input at 0 V –0.1 –0.04
VAor VB= –7 V, VCC = 0, Other input at 0 V –0.05 –0.03
IIH High-level input current, RE VIH = 2 V –10 10 μA
IIL Low-level input current, RE VIL = 0.8 V –10 10 μA
RID Differential input resistance A, B 48 kΩ
CDDifferential input capacitance Test input signal is a 1.5-MHz sine wave with
1-VPP amplitude. CDis measured across A
and B 7 pF
CIInput capacitance to ground VI = 0.4 sin (4E6πt) 2 pF
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,
ISO3088
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6.10 Supply Current
over recommended operating condition (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ICC1 Logic-side supply current
RE at 0 V or VCC, DE at 0 V
or VCC1 3.3-V VCC1 8
mA
RE at 0 V or VCC, DE at 0 V
or VCC1 5-V VCC1 10
ICC2 Bus-side supply current RE at 0 V or VCC, DE at 0 V, No load 15 mA
(1) Also known as pulse skew
6.11 Switching Characteristics: Driver
over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tPLH, tPHL Propagation delay ISO3080/82
See Figure 14
0.7 1.3 μs
ISO3086/88 25 45 ns
PWD(1) Pulse skew (|tPHL
tPLH|)
ISO3080/82 20 200 ns
ISO3086/88 3 7.5
tr, tf
Differential output
signal rise and fall
time
ISO3080/82 0.5 0.9 1.5 μs
ISO3086/88 7 15 ns
tPZH,
tPZL
Propagation delay,
high-impedance-to-
high-level output and
high-impedance-to-
low-level output
ISO3080/82 See Figure 15 and
Figure 16,
DE at 0 V
50% VO2.5 7
μs
90% VO1.8
ISO3086/88
See Figure 15 and Figure 16, DE at 0 V
25 55 ns
tPHZ,
tPLZ
Propagation delay,
high-level-to-high-
impedance output
and low-level to high-
impedance output
ISO3080/82 95 225
ns
ISO3086/88 25 55
(1) Also known as pulse skew.
6.12 Switching Characteristics: Receiver
over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tPLH, tPHL Propagation delay
See Figure 18
90 125 ns
PWD(1) Pulse width distortion |tPHL – tPLH| 4 12
tr, tfOutput signal rise and fall time 1 ns
tPHZ,
tPZH
Propagation delay, high-level-to-
high-impedance output and high-
impedance-to-high-level output See Figure 19, DE at 0 V 22 ns
tPZL,
tPLZ
Propagation delay, high-
impedance-to-low-level output
and low-level-to-high-impedance
output
See Figure 20, DE at 0 V 22 ns
l TEXAS INSTRUMENTS 300
Case Temperature (°C)
Safety Limiting Current (mA)
0 50 100 150 200
0
100
200
300
D001
VCC1 = VCC2 = 5.5 V
10
ISO3080
,
ISO3082
,
ISO3086
,
ISO3088
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6.13 Insulation Characteristics Curves
Figure 1. Thermal Derating Curve for Limiting Current per VDE
l TEXAS INSTRUMENTS
Data Rate (Mbps)
Supply Current (mA)
0 5 10 15 20
0
10
20
30
40
50
60
70
80
D007
I (3.3 V)
CC1
I (5 V)
CC2
Data Rate (Mbps)
Supply Current (mA)
0 5 10 15 20
0
10
20
30
40
50
60
70
D006
I (3.3 V)
CC1
I (5 V)
CC2
Data Rate (kbps)
Supply Current (mA)
0 50 100 150 200
0
10
20
30
40
50
60
D004
I (3.3 V)
CC1
I (5 V)
CC2
Data Rate (kbps)
Supply Current (mA)
0 50 100 150 200
0
10
20
30
40
50
D005
I (3.3 V)
CC1
I (5 V)
CC2
Data Rate (kbps)
Supply Current (mA)
0 50 100 150 200
0
10
20
30
40
50
60
D002
I (3.3 V)
CC1
I (5 V)
CC2
Data Rate (kbps)
Supply Current (mA)
0 50 100 150 200
0
5
10
15
20
25
30
D003
I (3.3 V)
CC1
I (5 V)
CC2
11
ISO3080
,
ISO3082
,
ISO3086
,
ISO3088
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6.14 Typical Characteristics
Figure 2. ISO3080 Supply Current vs Data Rate With Load Figure 3. ISO3080 Supply Current vs Data Rate With No
Load
Figure 4. ISO3082 Supply Current vs Data Rate With Load Figure 5. ISO3082 Supply Current vs Data Rate With No
Load
Figure 6. ISO3086 Supply Current vs Data Rate With Load Figure 7. ISO3086 Supply Current vs Data Rate With No
Load
l TEXAS INSTRUMENTS
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
0 2 4 6 8 10 12 14 16 18 20
Signaling Rate - Mbps
V - Differential Input Voltage - pk
ID
Data Rate (Mbps)
Supply Current (mA)
0 5 10 15 20
0
10
20
30
40
50
60
70
80
D008
I (3.3 V)
CC1
I (5 V)
CC2
Data Rate (Mbps)
Supply Current (mA)
0 5 10 15 20
0
10
20
30
40
50
60
70
D009
I (3.3 V)
CC1
I (5 V)
CC2
12
ISO3080
,
ISO3082
,
ISO3086
,
ISO3088
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Typical Characteristics (continued)
Figure 8. ISO3088 Supply Current vs Data Rate With Load Figure 9. ISO3088 Supply Current vs Data Rate With No
Load
Figure 10. ISO3086 Recommended Minimum Differential Input Voltage vs Signaling Rate
VOD
50 W
D
A
B
DE
VCC1
VI
Input
Generator
Generator: PRR = 100 kHz, 50 % duty cycle,
tr< 6ns , t f< 6 ns , ZO= 50
3V
tf
tr
tPLH tPHL
10%
90%
VOD
VI
90%
10%
VOD(H)
VOD(L)
includesfixtureand
instrumentationcapacitance
L
C50%50%
GND1
R =54
±1%
LWC =50pF
±20%
L
50% 50%
Input II
VI
VCC1
DE
A
B
VOB VOA
VOD
IOA
IOB
GND2
GND1
GND1 GND2
VOC
27 W
VOC
BVB
VA
A
VOC(SS)
OC(p-p)
V
27 W
Generator: PRR= 100 kHz, 50 % duty
cycle, t r< 6ns , tf< 6 ns, ZO= 50 W
Input
0 or II
VI
VCC1
DE
A
B
V
OB V
OA
V
OD
IOA
IOB
GND1
GND1 GND2
VCC1
GND2
375 W
60 W
+
VOD
D
DE
GND 2
VCC2
A
B
0 V or 3 V
375 W
–7 V to 12 V
13
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,
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,
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,
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7 Parameter Measurement Information
Figure 11. Driver VOD Test and Current Definitions Figure 12. Driver VOD With Common-Mode Loading
Test Circuit
NOTE
Unless otherwise stated, test circuits are shown for half-duplex devices, ISO3082 and
ISO3088. For full-duplex devices, the driver output pins are Y and Z.
Figure 13. Test Circuit and Waveform Definitions For The Driver Common-Mode Output Voltage
Figure 14. Driver Switching Test Circuit and Voltage Waveforms
Input
Generator
1.5 V
C includesfixtureand
L
instrumentationcapacitance
A
B
RVO
VI
RE
50 W
Generator: PRR=100 kHz, 50% duty cycle,
r< 6ns, t f< 6ns, ZO=50 W
t
50% 50%
3 V
VOH
VOL
tf
tr
tPLH tPHL
10%
90%
50% 50%
0 V
VO
VI
C =15pF
±20%
L
V
ID
IO
A
B
R
IB
IA
VIC
VA
VB
VB
VA+
2
VO
GND 2
Input
Generator 50 W
3 Vor0 V
S1
3V
D
A
B
DE
VIC includesfixtureand
Linstrumentation
capacitance
Generator: PRR =50 kHz ,50% duty cycle,
r< 6ns, tf< 6ns, Z = 50t
0 Viftesting A output,
3 ViftestingBoutput
50%
3V
VOL
tPZL tPLZ
10%
VO
VI
5V
50%
50%
C =50pF±20%
L
R =110
±1%
LW
0V
Input
Generator 50 W
3 Viftesting A output,
0 ViftestingBoutput S1
CLincludesfixtureand
instrumentation
capacitance
D
A
DE
50% 50%
3 V
VOH
tPZH
tPHZ
50%
90%
0 V
VO
VI
3Vor0V
VI
GND1
VO
C =50pF±20%
L
R =110
±1%
LW
GeneratorPRR=50kHz,50%dutycycle,
t <6ns,t <6ns,Z =50
r f O W
0V
~
~
14
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Parameter Measurement Information (continued)
Figure 15. Driver High-Level Output Enable and Disable Time Test Circuit and Voltage Waveforms
Figure 16. Driver Low-Level Output Enable and Disable Time Test Circuit and Voltage Waveform
Figure 17. Receiver Voltage and Current Definitions
Figure 18. Receiver Switching Test Circuit and Waveforms
A
B
PulseGenerator
15 sduration
1%dutycycle
t ,t 100ns
m
£
r f
R
Note:Thistestisconductedtotestsurvivabilityonly.
DatastabilityattheRoutputisnotspecified.
D
+
_
RE
DE
0V
3V
100 ±1%W
VCC
Input
Generator 50 W
R
A
B
C includesfixture
L
andinstrumentation
capacitance
RE
VI
VO
CL= 15 pF ±20%
S1
0 V
1.5 V
Generator: PRR =100 kHz, 50% dutycycle,
r<6 ns, tf< 6ns, ZO=50 W
t
50%
3 V
0 V
VI
VCC
VOL
tPZL tPLZ
VO
50%
50%
10%
1k ±1%W
50%
VOH
tPZH tpHZ
50%
3 V
90%
VI
VO
0 V
50%
!
VCC
Input
Generator 50 W
R
A
B
C includes fixture
L
and instrumentation
capacitance
RE
VI
VO
CL= 15 pF ±20 %
S1
1kW
1.5 V
0 V
Generator:PRR=100 kHz, 50% duty cycle ,
r<6ns, tf< 6ns, Z O=50 W
t
±1%
15
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,
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Parameter Measurement Information (continued)
Figure 19. Receiver Enable Test Circuit and Waveforms, Data Output High
Figure 20. Receiver Enable Test Circuit and Waveforms, Data Output Low
Figure 21. Transient Overvoltage Test Circuit
‘5‘ TEXAS INSTRUMENTS
D
DE
RE
54 W
GND1
VTEST
GND2
Y
Z
GND1
S 1
1.5 V or 0 V
0 V or 1.5 V
B
A
2 V
0.8 V
C = 0.1 F
1%
m
±
C = 0.1 F 1%m ±
VCC1 VCC2
1 kW
54 W
CL = 15 pF
(includes probe and
jig capacitance)
V or V
OH OL
V or V
OH OL
D
R
DE
RE
54 W
GND1
VTEST
GND2
A
B
GND1
S1
2V
0.8V
V orV
OH OL 1kW
CL =15pF
(includesprobeand
jigcapacitance)
V orV
OH OL
VCC1 VCC2
C=0.1 F
1%
m
±
C=0.1 F 1%m ±
16
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Parameter Measurement Information (continued)
Figure 22. Half-Duplex Common-Mode Transient Immunity Test Circuit
Figure 23. Full-Duplex Common-Mode Transient Immunity Test Circuit
«E?
D
R
B
A
13
12
DE
6
5
3
4
RE
GALVANIC ISOLATION
DE 5
D6
R3
4
RE
Y
Z
B
A
14
11
12
13
N
GALVANIC ISOLATIO
17
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8 Detailed Description
8.1 Overview
The ISO3080 and ISO3086 devices are isolated full-duplex differential line drivers and receivers while the
ISO3082 and ISO3088 devices are isolated half-duplex differential line transceivers for TIA/EIA 485/422
applications. They are rated to provide galvanic isolation of up to 2500 VRMS for 60 s as per the standard. They
have active-high driver enables and active-low receiver enables to control the data flow. They are available in
two speed grades suitable for data transmission up to 200 kbps and 20 Mbps.
When the driver enable pin, DE, is logic high, the differential outputs Y and Z follow the logic states at data input
D. A logic high at D causes Y to turn high and Z to turn low. In this case the differential output voltage defined as
VOD = V(Y) – V(Z) is positive. When D is low, the output states reverse, Z turns high, Y becomes low, and VOD is
negative. When DE is low, both outputs turn high-impedance. In this condition the logic state at D is irrelevant.
The DE pin has an internal pulldown resistor to ground, thus when left open the driver is disabled (high-
impedance) by default. The D pin has an internal pullup resistor to VCC, thus, when left open while the driver is
enabled, output Y turns high and Z turns low.
When the receiver enable pin, RE, is logic low, the receiver is enabled. When the differential input voltage
defined as VID = V(A) – V(B) is positive and higher than the positive input threshold, VIT+, the receiver output, R,
turns high. When VID is negative and less than the negative and lower than the negative input threshold, VIT– ,
the receiver output, R, turns low. If VID is between VIT+ and VIT– the output is indeterminate. When RE is logic
high or left open, the receiver output is high-impedance and the magnitude and polarity of VID are irrelevant.
Internal biasing of the receiver inputs causes the output to go failsafe-high when the transceiver is disconnected
from the bus (open-circuit), the bus lines are shorted (short-circuit), or the bus is not actively driven (idle bus).
8.2 Functional Block Diagrams
Figure 24. ISO3080, IOS3086 Functional Diagram
Figure 25. ISO3082, IOS3088 Functional Diagram
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(1) See Safety-Related Certifications table for detailed isolation ratings.
8.3 Feature Description
Table 1 provides an overview of the device features.
Table 1. Device Features
DEVICE RATED ISOLATION(1) TYPE DATA RATE
ISO3080 4000 VPK / 2500 VRMS Full-duplex 200 kbps
ISO3086 4000 VPK / 2500 VRMS Full-duplex 20 Mbps
ISO3082 4000 VPK / 2500 VRMS Half-duplex 200 kbps
ISO3088 4000 VPK / 2500 VRMS Half-duplex 20 Mbps
(1) PU = Powered Up; PD = Powered Down; H = Logic High; L= Logic Low; X = Irrelevant, Hi-Z = High Impedance (off)
(2) Driver output pins are Y and Z for full-duplex devices and A and B for half-duplex devices.
8.4 Device Functional Modes
Table 2 lists the driver functional modes and Table 3 lists the receiver functional modes.
Table 2. Driver Function Table(1)
VCC1 VCC2 INPUT
(D) ENABLE INPUT
(DE)
OUTPUTS(2)
Y / A Z / B
PU PU H H H L
PU PU L H L H
PU PU X L Hi-Z Hi-Z
PU PU X OPEN Hi-Z Hi-Z
PU PU OPEN H H L
PD PU X X Hi-Z Hi-Z
PU PD X X Hi-Z Hi-Z
PD PD X X Hi-Z Hi-Z
(1) PU = Powered Up; PD = Powered Down; H = Logic High; L= Logic Low; X = Irrelevant, Hi-Z = High Impedance (off), ? = Indeterminate
Table 3. Receiver Function Table(1)
VCC1 VCC2 DIFFERENTIAL INPUT
VID = (VA– VB)ENABLE
(RE) OUTPUT
(R)
PU PU –0.01 V VID L H
PU PU –0.2 V < VID < –0.01 V L ?
PU PU VID –0.2 V L L
PU PU X H Hi-Z
PU PU X OPEN Hi-Z
PU PU Open circuit L H
PU PU Short circuit L H
PU PU Idle (terminated) bus L H
PD PU X X Hi-Z
PU PD X L H
[TEXAS INSTRUMENTS D and RE Input DE Input Vcc1 V001 V001 Vccl Vcc1 1 MO 500 D 500 n InpuI Input 1 m A Input B Input 7 Vccz Input Inpul 16 V 36 kfl Y and Z Oumuts V552 - - __| 16 V Output _| 16 V 3.3V R Output 5V R Output Vcc1 Vcc1 K 5.5 O 11 n % K
19
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,
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8.4.1 Device I/O Schematics
Figure 26. Device I/O Schematics
l TEXAS INSTRUMENTS m\ REDED
R
DD
DE
RE
R
Y
ZR
D
R
RE
DE
D
A
B
B
A
Z
Y
RD
RRE DE D
Z YBA
Master Slave
Slave
R(T)
R(T)
R(T)
R(T)
R
D
R
RE
DE
D
A
B
R
D
R
RE
DE
D
A
B
R
D
R
RE
DE
D
A
B
a) Independent driver and
receiver enable signals b) Combined enable signals for
use as directional control pin c) Receiver always on
Copyright © 2016, Texas Instruments Incorporated
20
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,
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,
ISO3086
,
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The ISO308x family consists of RS-485 transceivers commonly used for asynchronous data transmissions. Full-
duplex implementation requires two signal pairs (four wires), and allows each node to transmit data on one pair
while simultaneously receiving data on the other pair. For half-duplex transmission, only one pair is shared for
both transmission and reception of data. To eliminate line reflections, each cable end is terminated with a
termination resistor, R(T), whose value matches the characteristic impedance, Z0, of the cable. This method,
known as parallel termination, allows for higher data rates over longer cable length.
9.2 Typical Application
Figure 27. Half-Duplex Transceiver Configurations
Figure 28. Typical RS-485 Network With Full-Duplex Transceivers
21
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Typical Application (continued)
9.2.1 Design Requirements
RS-485 is a robust electrical standard suitable for long-distance networking that can be used in a wide range of
applications with varying requirements, such as distance, data rate, and number of nodes. Table 4 lists the
design parameters.
Table 4. Design Parameters
PARAMETER VALUE
Pullup and pulldown resistors 1 kΩto 10 kΩ
Decoupling capacitors 100 nF
9.2.2 Detailed Design Procedure
The data rate and cable length have an inverse relationship which means the higher the data rate, the shorter
the cable length; and conversely, the lower the data rate, the longer the cable length. When connecting a node to
the bus, the distance between the transceiver inputs and the cable trunk, known as the stub, should be as short
as possible. Stubs present a nonterminated piece of bus line which can introduce reflections as the length of the
stub increases. As a general guideline, the electrical length, or round-trip delay, of a stub should be less than
one-tenth of the rise time of the driver. The RS-485 standard specifies that a compliant driver must be able to
driver 32 unit loads (ULs), where 1 UL represents a load impedance of approximately 12 kΩ. Because the
ISO308x family consists of 1/8 UL transceivers, connecting up to 256 receivers to the bus is possible.
9.2.3 Application Curve
Figure 29. ISO308x Output
l TEXAS INSTRUMENTS
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10 Power Supply Recommendations
To help ensure reliable operation at all data rates and supply voltages, a 0.1-μF bypass capacitor is
recommended at the input and output supply pins (VCC1 and VCC2). The capacitors should be placed as close to
the supply pins as possible. If only a single primary-side power supply is available in an application, isolated
power can be generated for the secondary-side with the help of a transformer driver such as Texas Instruments'
SN6501. For such applications, detailed power supply design and transformer selection recommendations are
available in SN6501 Transformer Driver for Isolated Power Supplies.
11 Layout
11.1 Layout Guidelines
ON-chip IEC-ESD protection is good for laboratory and portable equipment but never sufficient for EFT and
surge transients occurring in industrial environments. Therefore, robust and reliable bus node design requires the
use of external transient protection devices. Because ESD and EFT transients have a wide frequency bandwidth
from approximately 3-MHz to 3-GHz, high-frequency layout techniques must be applied during PCB design. A
minimum of four layers is required to accomplish a low EMI PCB design (see Figure 30).
Layer stacking should be in the following order (top-to-bottom): high-speed signal layer, ground plane, power
plane, and low-frequency signal layer.
Routing the high-speed traces on the top layer avoids the use of vias (and the introduction of their
inductances) and allows for clean interconnects between the isolator and the transmitter and receiver circuits
of the data link.
Placing a solid ground plane next to the high-speed signal layer establishes controlled impedance for
transmission line interconnects and provides an excellent low-inductance path for the return current flow.
Placing the power plane next to the ground plane creates additional high-frequency bypass capacitance of
approximately 100 pF/in2.
Routing the slower speed control signals on the bottom layer allows for greater flexibility as these signal links
usually have margin to tolerate discontinuities such as vias.
Place the protection circuitry close to the bus connector to prevent noise transients from penetrating your
board.
Use VCC and ground planes to provide low-inductance. High-frequency currents might follow the path of least
inductance and not necessarily the path of least resistance.
Design the protection components into the direction of the signal path. Do not force the transient currents to
divert from the signal path to reach the protection device.
Apply 0.1-µF bypass capacitors as close as possible to the VCC-pins of transceiver, UART, and controller ICs
on the board.
Use at least two vias for VCC and ground connections of bypass capacitors and protection devices to
minimize effective via-inductance.
Use 1-kΩto 10-kΩpullup and pulldown resistors for enable lines to limit noise currents in these lines during
transient events.
Insert pulse-proof resistors into the A and B bus lines if the TVS clamping voltage is higher than the specified
maximum voltage of the transceiver bus pins. These resistors limit the residual clamping current into the
transceiver and prevent it from latching up.
While pure TVS protection is sufficient for surge transients up to 1 kV, higher transients require metal-oxide
varistors (MOVs) which reduce the transients to a few hundred volts of clamping voltage, and transient
blocking units (TBUs) that limit transient current to less than 1 mA.
l TEXAS INSTRUMENTS
10 mils
10 mils
40 mils FR-4
0r ~ 4.5
Keep this
space free
from planes,
traces, pads,
and vias
Ground plane
Power plane
Low-speed traces
High-speed traces
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Layout Guidelines (continued)
If an additional supply voltage plane or signal layer is needed, add a second power or ground plane system to
the stack to keep it symmetrical. This makes the stack mechanically stable and prevents it from warping. Also the
power and ground plane of each power system can be placed closer together, thus increasing the high-frequency
bypass capacitance significantly.
For detailed layout recommendations, refer to the Digital Isolator Design Guide.
11.2 Layout Example
Figure 30. Recommended Layer Stack
l TEXAS INSTRUMENTS
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,
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,
ISO3086
,
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12 Device and Documentation Support
12.1 Documentation Support
12.1.1 Related Documentation
For related documentation see the following:
Communication Module Reference Design for Functional Isolated RS-485, CAN, and I2C Data Transmission
Digital Isolator Design Guide
Dual Isolated Half-Duplex RS-485 Repeater
Isolation Glossary
Programmable Logic Controller (PLC) I/O Module Front- End Controller with Tiva C Series ARM®Cortex®-M4
MCU
Small Form Factor, Digital Isolator-Based Half-Duplex RS- 485 Interface Module Reference Design
SN6501 Transformer Driver for Isolated Power Supplies
12.2 Related Links
The table below lists quick access links. Categories include technical documents, support and community
resources, tools and software, and quick access to sample or buy.
Table 5. Related Links
PARTS PRODUCT FOLDER ORDER NOW TECHNICAL
DOCUMENTS TOOLS &
SOFTWARE SUPPORT &
COMMUNITY
ISO3080 Click here Click here Click here Click here Click here
ISO3082 Click here Click here Click here Click here Click here
ISO3086 Click here Click here Click here Click here Click here
ISO3088 Click here Click here Click here Click here Click here
12.3 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
12.4 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.5 Trademarks
E2E is a trademark of Texas Instruments.
ARM, Cortex are registered trademarks of ARM Ltd..
All other trademarks are the property of their respective owners.
12.6 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
l TEXAS INSTRUMENTS
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12.7 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
‘5‘ TEXAS INSTRUMENTS
www.ti.com
PACKAGE OUTLINE
C
TYP
10.63
9.97
2.65 MAX
14X 1.27
16X 0.51
0.31
2X
8.89
TYP
0.33
0.10
0 - 8
0.3
0.1
(1.4)
0.25
GAGE PLANE
1.27
0.40
A
NOTE 3
10.5
10.1
B
NOTE 4
7.6
7.4
4221009/B 07/2016
SOIC - 2.65 mm max height
DW0016B
SOIC
NOTES:
1. All linear dimensions are in millimeters. Dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm, per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm, per side.
5. Reference JEDEC registration MS-013.
116
0.25 C A B
9
8
PIN 1 ID
AREA
SEATING PLANE
0.1 C
SEE DETAIL A
TYPICAL
DETAIL A
SCALE 1.500
26
ISO3080
,
ISO3082
,
ISO3086
,
ISO3088
SLOS581I –MAY 2008REVISED APRIL 2017
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EXAMPLE BOARD LAYOUT
(9.75)
R0.05 TYP
0.07 MAX
ALL AROUND 0.07 MIN
ALL AROUND
(9.3)
14X (1.27)
R0.05 TYP
16X (1.65)
16X (0.6)
14X (1.27)
16X (2)
16X (0.6)
4221009/B 07/2016
SYMM
SOIC - 2.65 mm max height
DW0016B
SOIC
SYMM
SEE
DETAILS
1
89
16
SYMM
HV / ISOLATION OPTION
8.1 mm CLEARANCE/CREEPAGE
NOTES: (continued)
6. Publication IPC-7351 may have alternate designs.
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
METAL SOLDER MASK
OPENING
NON SOLDER MASK
DEFINED
SOLDER MASK DETAILS
OPENING
SOLDER MASK METAL
SOLDER MASK
DEFINED
SCALE:4X
LAND PATTERN EXAMPLE
SYMM
1
89
16
IPC-7351 NOMINAL
7.3 mm CLEARANCE/CREEPAGE
SEE
DETAILS
27
ISO3080
,
ISO3082
,
ISO3086
,
ISO3088
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EXAMPLE STENCIL DESIGN
R0.05 TYP
R0.05 TYP
16X (1.65)
16X (0.6)
14X (1.27)
(9.75)
16X (2)
16X (0.6)
14X (1.27)
(9.3)
4221009/B 07/2016
SOIC - 2.65 mm max height
DW0016B
SOIC
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
SYMM
SYMM
1
89
16
HV / ISOLATION OPTION
8.1 mm CLEARANCE/CREEPAGE
BASED ON 0.125 mm THICK STENCIL
SOLDER PASTE EXAMPLE
SCALE:4X
SYMM
SYMM
1
89
16
IPC-7351 NOMINAL
7.3 mm CLEARANCE/CREEPAGE
28
ISO3080
,
ISO3082
,
ISO3086
,
ISO3088
SLOS581I –MAY 2008REVISED APRIL 2017
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Product Folder Links: ISO3080 ISO3082 ISO3086 ISO3088
Submit Documentation Feedback Copyright © 2008–2017, Texas Instruments Incorporated
I TEXAS INSTRUMENTS Samples Samples Samples Samples Samples Samples Samples Samples Samples Samples Samples Samples Samples Samples
PACKAGE OPTION ADDENDUM
www.ti.com 13-Aug-2021
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead finish/
Ball material
(6)
MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
ISO3080DW ACTIVE SOIC DW 16 40 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ISO3080
ISO3080DWG4 ACTIVE SOIC DW 16 40 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ISO3080
ISO3080DWR ACTIVE SOIC DW 16 2000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ISO3080
ISO3082DW ACTIVE SOIC DW 16 40 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ISO3082
ISO3082DWG4 ACTIVE SOIC DW 16 40 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ISO3082
ISO3082DWR ACTIVE SOIC DW 16 2000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ISO3082
ISO3082DWRG4 ACTIVE SOIC DW 16 2000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ISO3082
ISO3086DW ACTIVE SOIC DW 16 40 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ISO3086
ISO3086DWG4 ACTIVE SOIC DW 16 40 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ISO3086
ISO3086DWR ACTIVE SOIC DW 16 2000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ISO3086
ISO3088DW ACTIVE SOIC DW 16 40 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ISO3088
ISO3088DWG4 ACTIVE SOIC DW 16 40 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ISO3088
ISO3088DWR ACTIVE SOIC DW 16 2000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ISO3088
ISO3088DWRG4 ACTIVE SOIC DW 16 2000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ISO3088
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
I TEXAS INSTRUMENTS
PACKAGE OPTION ADDENDUM
www.ti.com 13-Aug-2021
Addendum-Page 2
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6) Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
l TEXAS INSTRUMENTS REEL DIMENSIONS TAPE DIMENSIONS 7 “KO '«m» Reel Diameter AD Dimension deswgned to accommodate the componem wwdlh ED Dimension desxgned to accommodate the componenl \engm K0 Dimenslun deswgned to accommodate the componem thickness , w OveraH wwdm loe earner cape i p1 Pitch between successwe cavuy cemers f T Reel Width (W1) QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE O O O D O O D D Sprockemules ,,,,,,,,,,, ‘ User Direcllon 0' Feed Pockel Quadrams
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device Package
Type Package
Drawing Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0
(mm) B0
(mm) K0
(mm) P1
(mm) W
(mm) Pin1
Quadrant
ISO3080DWR SOIC DW 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1
ISO3082DWR SOIC DW 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1
ISO3086DWR SOIC DW 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1
ISO3088DWR SOIC DW 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1
PACKAGE MATERIALS INFORMATION
www.ti.com 5-Jan-2022
Pack Materials-Page 1
l TEXAS INSTRUMENTS TAPE AND REEL BOX DIMENSIONS
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
ISO3080DWR SOIC DW 16 2000 350.0 350.0 43.0
ISO3082DWR SOIC DW 16 2000 350.0 350.0 43.0
ISO3086DWR SOIC DW 16 2000 350.0 350.0 43.0
ISO3088DWR SOIC DW 16 2000 350.0 350.0 43.0
PACKAGE MATERIALS INFORMATION
www.ti.com 5-Jan-2022
Pack Materials-Page 2
l TEXAS INSTRUMENTS T - Tube height| L - Tube length l ,g + w-Tuhe _______________ _ ______________ width $ — B - Alignment groove width
TUBE
*All dimensions are nominal
Device Package Name Package Type Pins SPQ L (mm) W (mm) T (µm) B (mm)
ISO3080DW DW SOIC 16 40 506.98 12.7 4826 6.6
ISO3080DWG4 DW SOIC 16 40 506.98 12.7 4826 6.6
ISO3082DW DW SOIC 16 40 506.98 12.7 4826 6.6
ISO3082DWG4 DW SOIC 16 40 506.98 12.7 4826 6.6
ISO3086DW DW SOIC 16 40 506.98 12.7 4826 6.6
ISO3086DWG4 DW SOIC 16 40 506.98 12.7 4826 6.6
ISO3088DW DW SOIC 16 40 506.98 12.7 4826 6.6
ISO3088DWG4 DW SOIC 16 40 506.98 12.7 4826 6.6
PACKAGE MATERIALS INFORMATION
www.ti.com 5-Jan-2022
Pack Materials-Page 3
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