
The high-impedance state of the I/O lines during tri-state
output mode facilitates use in multidrop networks. In tri-
state output mode, do not exceed (VL + 0.3V) on I/O VL_
or (VCC + 0.3V) on I/O VCC_.
Thermal-Shutdown Protection
The MAX3394E/MAX3395E/MAX3396E are protected
from thermal damage resulting from short-circuit faults. In
the event of a short-circuit fault, when the junction tem-
perature (TJ) reaches +125°C, a thermal sensor forces
the device into the tri-state output mode. When TJ drops
below +115°C, normal operation resumes.
±15kV ESD Protection
As with all Maxim devices, ESD-protection structures are
incorporated on all pins to protect against ESD encoun-
tered during handling and assembly. The I/O VCC_ lines
are further protected by advanced ESD structures to
guard these pins from damage caused by ESD of up to
±15kV. Protection structures prevent damage caused by
ESD events in normal operation, tri-state output mode,
and when the device is unpowered. After arresting an
ESD event, MAX3394E/MAX3395E/MAX3396E continue
to function without latching up, whereas competing devic-
es can enter a latched-up state and must be power cycled
to restore functionality.
Several ESD testing standards exist for gauging the
robustness of ESD structures. The ESD protection of
the MAX3394E/MAX3395E/MAX3396E is characterized
for the human body model (HBM). Figure 6a shows the
model used to simulate an ESD event resulting from con-
tact with the human body. The model consists of a 100pF
storage capacitor that is charged to a high voltage then
discharged through a 1.5kΩ resistor. Figure 6b shows
the current waveform when the storage capacitor is dis-
charged into a low impedance.
To ensure full ±15kV ESD protection, bypass VCC to
ground with a 0.1μF ceramic capacitor and an additional
1μF ceramic capacitor as close to the device as possible.
ESD Test Conditions
ESD performance depends on a variety of conditions.
Contact Maxim for a reliability report documenting test
setup, methodology, and results.
Applications Information
Power-Supply Decoupling
Bypass VL and VCC to ground with 0.1μF ceramic capac-
itors. To ensure full ±15kV ESD protection, bypass VCC to
ground with an additional 1μF or greater ceramic capaci-
tor. Place all capacitors as close to the device as possible.
Open-Drain Mode vs. Push-Pull Mode
The MAX3394E/MAX3395E/MAX3396E are compatible
with push-pull (active) and open-drain drivers. For push-
pull operation, maximum data rate is guaranteed to
6Mbps. For open-drain applications, the MAX3394E/
MAX3395E/MAX3396E include internal pullup resistors
and slew-rate enhancement circuitry, providing a maxi-
mum data rate of 1Mbps. External pullup resistors can
be added to increase data rate when the bus is loaded
by high capacitance. (See the Use of External Pullup
Resistors section.)
Serial-Interface Level Translation
The MAX3395E provides level translation on four I/O
lines, making it an ideal device for multivoltage I2C,
MICROWIRE, and SPI serial interfaces.
Use of External Pullup Resistors
The MAX3394E/MAX3395E/MAX3396E include internal
10kΩ pullup resistors. During a low-to-high logic transi-
tion, the internal pullup resistors charge the bus capaci-
Figure 6a. Human Body ESD Test Model Figure 6b. HBM Discharge Current Waveform
CHARGE-CURRENT-
LIMIT RESISTOR
DISCHARGE
RESISTANCE
STORAGE
CAPACITOR
Cs
100pF
RC
1MΩ
RD
1500Ω
HIGH-
VOLTAGE
DC
SOURCE
DEVICE-
UNDER-
TEST
IP 100%
90%
36.8%
tRL TIME
tDL
CURRENT WAVEFORM
PEAK-TO-PEAK RINGING
(NOT DRAWN TO SCALE)
Ir
10%
0
0
AMPERES
MAX3394E/MAX3395E/
MAX3396E
±15kV ESD-Protected, High-Drive Current,
Dual-/Quad-/Octal-Level Translators with
Speed-Up Circuitry
www.maximintegrated.com Maxim Integrated
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