IGL002 FPGA,SmartFusion2 Datasheet by Microchip Technology

Datasheet Feedback/Errors

O Microsemi, a @MIcnncmp company

DS0128

Datasheet

IGLOO2 FPGA and SmartFusion2 SoC FPGA

O Microsemi a Q MIERDCHID company

51700128. 12.0 8/18

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Microsemi makes no warranty, representation, or guarantee regarding the information contained herein or the suitability of

its products and services for any particular purpose, nor does Microsemi assume any liability whatsoever arising out of the

application or use of any product or circuit. The products sold hereunder and any other products sold by Microsemi have

been subject to limited testing and should not be used in conjunction with mission-critical equipment or applications. Any

performance specifications are believed to be reliable but are not verified, and Buyer must conduct and complete all

performance and other testing of the products, alone and together with, or installed in, any end-products. Buyer shall not

rely on any data and performance specifications or parameters provided by Microsemi. It is the Buyer’s responsibility to

independently determine suitability of any products and to test and verify the same. The information provided by Microsemi

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semiconductor and system solutions for aerospace & defense, communications, data center and industrial markets.

Products include high-performance and radiation-hardened analog mixed-signal integrated circuits, FPGAs, SoCs and

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G Microsemi. a @anucmn company

Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 iii

Contents

1 Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1

1.1 Revision 12.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1

1.2 Revision 11.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1

1.3 Revision 10.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1

1.4 Revision 9.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1

1.5 Revision 8.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2

1.6 Revision 7.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2

1.7 Revision 6.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2

1.8 Revision 5.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2

1.9 Revision 4.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3

1.10 Revision 3.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3

1.11 Revision 2.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3

1.12 Revision 1.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4

2 IGLOO2 FPGA and SmartFusion2 SoC FPGA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

2.1 Device Status . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

2.2 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6

2.3 Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6

2.3.1 Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6

2.3.2 Power Consumption . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13

2.3.3 Average Fabric Temperature and Voltage Derating Factors . . . . . . . . . . . . . . . . . . . . . . . . . . 15

2.3.4 Timing Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

2.3.5 User I/O Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18

2.3.6 Logic Element Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75

2.3.7 Global Resource Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78

2.3.8 FPGA Fabric SRAM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79

2.3.9 Programming Times . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94

2.3.10 Math Block Timing Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103

2.3.11 Embedded NVM (eNVM) Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104

2.3.12 SRAM PUF . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105

2.3.13 Non-Deterministic Random Bit Generator (NRBG) Characteristics . . . . . . . . . . . . . . . . . . . . 106

2.3.14 Cryptographic Block Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106

2.3.15 Crystal Oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 107

2.3.16 On-Chip Oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109

2.3.17 Clock Conditioning Circuits (CCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110

2.3.18 JTAG . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111

2.3.19 System Controller SPI Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 113

2.3.20 Power-up to Functional Times . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 114

2.3.21 DEVRST_N Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116

2.3.22 DEVRST_N to Functional Times . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116

2.3.23 Flash*Freeze Timing Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119

2.3.24 DDR Memory Interface Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119

2.3.25 SFP Transceiver Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120

2.3.26 SerDes Electrical and Timing AC and DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . 120

2.3.27 SmartFusion2 Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122

2.3.28 CAN Controller Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127

2.3.29 USB Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127

2.3.30 MMUART Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128

2.3.31 IGLOO2 Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128

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Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 iv

Figures

Figure 1 High Temperature Data Retention (HTR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

Figure 2 Timing Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

Figure 3 Input Buffer AC Loading . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18

Figure 4 Output Buffer AC Loading . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19

Figure 5 Tristate Buffer for Enable Path Test Point . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

Figure 6 Timing Model for Input Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65

Figure 7 I/O Register Input Timing Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66

Figure 8 Timing Model for Output/Enable Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68

Figure 9 I/O Register Output Timing Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69

Figure 10 Input DDR Module . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70

Figure 11 Input DDR Timing Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71

Figure 12 Output DDR Module . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73

Figure 13 Output DDR Timing Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74

Figure 14 LUT-4 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75

Figure 15 Sequential Module . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76

Figure 16 Sequential Module Timing Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77

Figure 17 Power-up to Functional Timing Diagram for SmartFusion2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115

Figure 18 Power-up to Functional Timing Diagram for IGLOO2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116

Figure 19 DEVRST_N to Functional Timing Diagram for SmartFusion2 . . . . . . . . . . . . . . . . . . . . . . . . . . . 117

Figure 20 DEVRST_N to Functional Timing Diagram for IGLOO2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118

Figure 21 I2C Timing Parameter Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 124

Figure 22 SPI Timing for a Single Frame Transfer in Motorola Mode (SPH = 1) . . . . . . . . . . . . . . . . . . . . . 127

Figure 23 SPI Timing for a Single Frame Transfer in Motorola Mode (SPH = 1) . . . . . . . . . . . . . . . . . . . . . 130

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Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 v

Tables

Table 1 IGLOO2 and SmartFusion2 Design Security Densities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

Table 2 IGLOO2 and SmartFusion2 Data Security Densities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

Table 3 Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6

Table 4 Recommended Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

Table 5 FPGA Operating Limits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

Table 6 Embedded Operating Flash Limits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9

Table 7 Device Storage Temperature and Retention . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9

Table 8 High Temperature Data Retention (HTR) Lifetime . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9

Table 9 Package Thermal Resistance of SmartFusion2 and IGLOO2 Devices . . . . . . . . . . . . . . . . . . . . . 11

Table 10 Quiescent Supply Current Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13

Table 11 SmartFusion2 and IGLOO2 Quiescent Supply Current (VDD = 1.2 V) – Typical Process . . . . . . . 13

Table 12 Currents During Program Cycle, 0 °C < = TJ <= 85 °C – Typical Process . . . . . . . . . . . . . . . . . . . 14

Table 13 Currents During Verify Cycle, 0 °C <= TJ <= 85 °C – Typical Process . . . . . . . . . . . . . . . . . . . . . . 14

Table 14 SmartFusion2 and IGLOO2 Quiescent Supply Current (VDD = 1.26 V) – Worst-Case Process . . 14

Table 15 Average Junction Temperature and Voltage Derating Factors for Fabric Timing Delays . . . . . . . . 15

Table 16 Inrush Currents at Power up, –40 °C <= TJ <= 100 °C – Typical Process . . . . . . . . . . . . . . . . . . . 15

Table 17 Timing Model Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

Table 18 Maximum Data Rate Summary Table for Single-Ended I/O in Worst-Case Industrial Conditions . 20

Table 19 Maximum Data Rate Summary Table for Voltage-Referenced I/O in Worst-Case

Industrial Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

Table 20 Maximum Data Rate Summary Table for Differential I/O in Worst-Case Industrial Conditions . . . 21

Table 21 Maximum Frequency Summary Table for Single-Ended I/O in Worst-Case Industrial Conditions . 21

Table 22 Maximum Frequency Summary Table for Voltage-Referenced I/O in Worst-Case Industrial

Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22

Table 23 Maximum Frequency Summary Table for Differential I/O in Worst-Case Industrial Conditions . . . 22

Table 24 Input Capacitance, Leakage Current, and Ramp Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23

Table 25 I/O Weak Pull-up/Pull-down Resistances for DDRIO I/O Bank . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23

Table 26 I/O Weak Pull-Up/Pull-Down Resistances for MSIO I/O Bank . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24

Table 27 I/O Weak Pull-up/Pull-down Resistances for MSIOD I/O Bank . . . . . . . . . . . . . . . . . . . . . . . . . . . 24

Table 28 Schmitt Trigger Input Hysteresis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24

Table 29 LVTTL/LVCMOS 3.3 V DC Recommended DC Operating Conditions (Applicable to MSIO I/O Bank

Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25

Table 30 LVTTL/LVCMOS 3.3 V Input Voltage Specification (Applicable to MSIO I/O Bank Only) . . . . . . . 25

Table 31 LVCMOS 3.3 V DC Output Voltage Specification (Applicable to MSIO I/O Bank Only) . . . . . . . . . 25

Table 32 LVTTL 3.3 V DC Output Voltage Specification (Applicable to MSIO I/O Bank Only) . . . . . . . . . . . 25

Table 33 LVTTL/LVCMOS 3.3 V AC Maximum Switching Speed (Applicable to MSIO I/O Bank Only) . . . . 25

Table 34 LVTTL/LVCMOS 3.3 V AC Test Parameter Specifications (Applicable to MSIO I/O Bank Only) . . 26

Table 35 LVTTL/LVCMOS 3.3 V Transmitter Drive Strength Specifications for MSIO I/O Bank . . . . . . . . . . 26

Table 36 LVTTL/LVCMOS 3.3 V Receiver Characteristics for MSIO I/O Bank (Input Buffers) . . . . . . . . . . . 26

Table 37 LVTTL/LVCMOS 3.3 V Transmitter Characteristics for MSIO I/O Bank (Output and

Tristate Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26

Table 38 LVCMOS 2.5 V DC Recommended DC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27

Table 39 LVCMOS 2.5 V DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27

Table 40 LVCMOS 2.5 V DC Output Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27

Table 41 LVCMOS 2.5 V AC Minimum and Maximum Switching Speed . . . . . . . . . . . . . . . . . . . . . . . . . . . 27

Table 42 LVCMOS 2.5 V AC Calibrated Impedance Option . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27

Table 43 LVCMOS 2.5 V AC Test Parameter Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

Table 44 LVCMOS 2.5 V Transmitter Drive Strength Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

Table 45 LVCMOS 2.5 V Receiver Characteristics (Input Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

Table 46 LVCMOS 2.5 V Transmitter Characteristics for DDRIO Bank (Output and Tristate Buffers) . . . . . 28

Table 47 LVCMOS 2.5 V Transmitter Characteristics for MSIO Bank (Output and Tristate Buffers) . . . . . . 29

Table 48 LVCMOS 2.5 V Transmitter Characteristics for MSIOD Bank (Output and Tristate Buffers) . . . . . 30

Table 49 LVCMOS 1.8 V DC Recommended Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

Table 50 LVCMOS 1.8 V DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

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Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 vi

Table 51 LVCMOS 1.8 V DC Output Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

Table 52 LVCMOS 1.8 V Minimum and Maximum AC Switching Speed . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

Table 53 LVCMOS 1.8 V AC Calibrated Impedance Option . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31

Table 54 LVCMOS 1.8 V AC Test Parameter Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31

Table 55 LVCMOS 1.8 V Transmitter Drive Strength Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31

Table 56 LVCMOS 1.8 V Receiver Characteristics (Input Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31

Table 57 LVCMOS 1.8 V Transmitter Characteristics for DDRIO I/O Bank with Fixed Code (Output and Tristate

Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32

Table 58 LVCMOS 1.8 V Transmitter Characteristics for MSIO I/O Bank . . . . . . . . . . . . . . . . . . . . . . . . . . . 33

Table 59 LVCMOS 1.8 V Transmitter Characteristics for MSIOD I/O Bank . . . . . . . . . . . . . . . . . . . . . . . . . 33

Table 60 LVCMOS 1.5 V DC Recommended Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33

Table 61 LVCMOS 1.5 V DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33

Table 62 LVCMOS 1.5 V DC Output Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34

Table 63 LVCMOS 1.5 V AC Minimum and Maximum Switching Speed . . . . . . . . . . . . . . . . . . . . . . . . . . . 34

Table 64 LVCMOS 1.5 V AC Calibrated Impedance Option . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34

Table 65 LVCMOS 1.5 V AC Test Parameter Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34

Table 66 LVCMOS 1.5 V Transmitter Drive Strength Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34

Table 67 LVCMOS 1.5 V Receiver Characteristics for DDRIO I/O Bank with Fixed Codes (Input Buffers) . 35

Table 68 LVCMOS 1.5 V Receiver Characteristics for MSIO I/O Bank (Input Buffers) . . . . . . . . . . . . . . . . . 35

Table 69 LVCMOS 1.5 V Receiver Characteristics for MSIOD I/O Bank (Input Buffers) . . . . . . . . . . . . . . . . 35

Table 70 LVCMOS 1.5 V Transmitter Characteristics for DDRIO I/O Bank (Output and Tristate Buffers) . . 35

Table 71 LVCMOS 1.5 V Transmitter Characteristics for MSIO I/O Bank (Output and Tristate Buffers) . . . 36

Table 72 LVCMOS 1.5 V Transmitter Characteristics for MSIOD I/O Bank (Output and Tristate Buffers) . . 37

Table 73 LVCMOS 1.2 V DC Recommended DC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37

Table 74 LVCMOS 1.2 V DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37

Table 75 LVCMOS 1.2 V DC Output Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37

Table 76 LVCMOS 1.2 V Minimum and Maximum AC Switching Speed . . . . . . . . . . . . . . . . . . . . . . . . . . . 37

Table 77 LVCMOS 1.2 V AC Calibrated Impedance Option . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38

Table 78 LVCMOS 1.2 V AC Test Parameter Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38

Table 79 LVCMOS 1.2 V Transmitter Drive Strength Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38

Table 80 LVCMOS 1.2 V Receiver Characteristics for DDRIO I/O Bank with Fixed Code (Input Buffers) . . 38

Table 81 LVCMOS 1.2 V Receiver Characteristics for MSIO I/O Bank (Input Buffers) . . . . . . . . . . . . . . . . . 38

Table 82 LVCMOS 1.2 V Receiver Characteristics for MSIOD I/O Bank (Input Buffers) . . . . . . . . . . . . . . . . 39

Table 83 LVCMOS 1.2 V Transmitter Characteristics for DDRIO I/O Bank (Output and Tristate Buffers) . . 39

Table 84 LVCMOS 1.2 V Transmitter Characteristics for MSIO I/O Bank (Output and Tristate Buffers) . . . 39

Table 85 LVCMOS 1.2 V Transmitter Characteristics for MSIOD I/O Bank (Output and Tristate Buffers) . . 40

Table 86 PCI/PCI-X DC Recommended Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40

Table 87 PCI/PCI-X DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40

Table 88 PCI/PCI-X DC Output Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40

Table 89 PCI/PCI-X Minimum and Maximum AC Switching Speed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40

Table 90 PCI/PCI-X AC Test Parameter Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40

Table 91 PCI/PCIX AC Switching Characteristics for Receiver for MSIO I/O Bank (Input Buffers) . . . . . . . . 41

Table 92 PCI/PCIX AC switching Characteristics for Transmitter for MSIO I/O Bank (Output and Tristate

Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41

Table 93 HSTL Recommended DC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41

Table 94 HSTL DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41

Table 95 HSTL DC Output Voltage Specification Applicable to DDRIO I/O Bank Only . . . . . . . . . . . . . . . . . 42

Table 96 HSTL DC Differential Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42

Table 97 HSTL AC Differential Voltage Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42

Table 98 HSTL Minimum and Maximum AC Switching Speed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42

Table 99 HSTL Impedance Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42

Table 100 HSTL AC Test Parameter Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42

Table 101 HSTL Receiver Characteristics for DDRIO I/O Bank with Fixed Code (Input Buffers) . . . . . . . . . . 43

Table 102 HSTL Transmitter Characteristics for DDRIO I/O Bank (Output and Tristate Buffers) . . . . . . . . . . 43

Table 103 DDR1/SSTL2 DC Recommended Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44

Table 104 DDR1/SSTL2 DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44

Table 105 DDR1/SSTL2 DC Output Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44

Table 106 DDR1/SSTL2 DC Differential Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44

Table 107 SSTL2 AC Differential Voltage Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44

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Table 108 SSTL2 Minimum and Maximum AC Switching Speeds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45

Table 109 SSTL2 AC Impedance Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45

Table 110 DDR1/SSTL2 AC Test Parameter Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45

Table 111 SSTL2 Receiver Characteristics for DDRIO I/O Bank (Input Buffers) . . . . . . . . . . . . . . . . . . . . . . 45

Table 112 SSTL2 Receiver Characteristics for MSIO I/O Bank (Input Buffers) . . . . . . . . . . . . . . . . . . . . . . . . 45

Table 113 DDR1/SSTL2 Receiver Characteristics for MSIOD I/O Bank (Input Buffers) . . . . . . . . . . . . . . . . . 46

Table 114 SSTL2 Class I Transmitter Characteristics for DDRIO I/O Bank (Output and Tristate Buffers) . . . 46

Table 115 DDR1/SSTL2 Class I Transmitter Characteristics for MSIO I/O Bank (Output and

Tristate Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46

Table 116 DDR1/SSTL2 Class I Transmitter Characteristics for MSIOD I/O Bank (Output and

Tristate Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46

Table 117 DDR1/SSTL2 Class II Transmitter Characteristics for DDRIO I/O Bank (Output and

Tristate Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46

Table 118 DDR1/SSTL2 Class II Transmitter Characteristics for MSIO I/O Bank (Output and

Tristate Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46

Table 119 SSTL18 DC Recommended DC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47

Table 120 SSTL18 DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47

Table 121 SSTL18 DC Output Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47

Table 122 SSTL18 DC Differential Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47

Table 123 SSTL18 AC Differential Voltage Specifications (Applicable to DDRIO Bank Only) . . . . . . . . . . . . 47

Table 124 SSTL18 Minimum and Maximum AC Switching Speed (Applicable to DDRIO Bank Only) . . . . . . 48

Table 125 SSTL18 AC Impedance Specifications (Applicable to DDRIO Bank Only) . . . . . . . . . . . . . . . . . . . 48

Table 126 SSTL18 AC Test Parameter Specifications (Applicable to DDRIO Bank Only) . . . . . . . . . . . . . . . 48

Table 127 DDR2/SSTL18 Receiver Characteristics for DDRIO I/O Bank with Fixed Code . . . . . . . . . . . . . . . 48

Table 128 DDR2/SSTL18 Transmitter Characteristics (Output and Tristate Buffers) . . . . . . . . . . . . . . . . . . . 48

Table 129 SSTL15 DC Recommended DC Operating Conditions (for DDRIO I/O Bank Only) . . . . . . . . . . . . 49

Table 130 SSTL15 DC Input Voltage Specification (for DDRIO I/O Bank Only) . . . . . . . . . . . . . . . . . . . . . . . 49

Table 131 SSTL15 DC Output Voltage Specification (for DDRIO I/O Bank Only) . . . . . . . . . . . . . . . . . . . . . . 49

Table 132 SSTL15 DC Differential Voltage Specification (for DDRIO I/O Bank Only) . . . . . . . . . . . . . . . . . . 49

Table 133 SSTL15 AC SSTL15 Minimum and Maximum AC Switching Speed (for DDRIO I/O Bank Only) . 50

Table 134 SSTL15 Minimum and Maximum AC Switching Speed (for DDRIO I/O Bank Only) . . . . . . . . . . . 50

Table 135 SSTL15 AC Calibrated Impedance Option (for DDRIO I/O Bank Only) . . . . . . . . . . . . . . . . . . . . . 50

Table 136 SSTL15 AC Test Parameter Specifications (for DDRIO I/O Bank Only) . . . . . . . . . . . . . . . . . . . . 50

Table 137 DDR3/SSTL15 Receiver Characteristics for DDRIO I/O Bank – with Calibration Only . . . . . . . . . 50

Table 138 DDR3/SSTL15 Transmitter Characteristics (Output and Tristate Buffers) . . . . . . . . . . . . . . . . . . . 51

Table 139 LPDDR DC Recommended DC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51

Table 140 LPDDR DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51

Table 141 LPDDR DC Output Voltage Specification Reduced Drive . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52

Table 142 LPDDR DC Output Voltage Specification Full Drive . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52

Table 143 LPDDR DC Differential Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52

Table 144 LPDDR AC Differential Voltage Specifications (for DDRIO I/O Bank Only) . . . . . . . . . . . . . . . . . . 52

Table 145 LPDDR AC Specifications (for DDRIO I/O Bank Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52

Table 146 LPDDR AC Calibrated Impedance Option (for DDRIO I/O Bank Only) . . . . . . . . . . . . . . . . . . . . . 52

Table 147 LPDDR AC Test Parameter Specifications (for DDRIO I/O Bank Only) . . . . . . . . . . . . . . . . . . . . . 52

Table 148 LPDDR Receiver Characteristics for DDRIO I/O Bank with Fixed Codes . . . . . . . . . . . . . . . . . . . 53

Table 149 LPDDR Reduced Drive for DDRIO I/O Bank (Output and Tristate Buffers) . . . . . . . . . . . . . . . . . . 53

Table 150 LPDDR Full Drive for DDRIO I/O Bank (Output and Tristate Buffers) . . . . . . . . . . . . . . . . . . . . . . 53

Table 151 LPDDR-LVCMOS 1.8 V Mode Recommended DC Operating Conditions . . . . . . . . . . . . . . . . . . . 53

Table 152 LPDDR-LVCMOS 1.8 V Mode DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . 53

Table 153 LPDDR-LVCMOS 1.8 V Mode DC Output Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . 53

Table 154 LPDDR-LVCMOS 1.8 V Minimum and Maximum AC Switching Speeds . . . . . . . . . . . . . . . . . . . . 54

Table 155 LPDDR-LVCMOS 1.8 V Calibrated Impedance Option . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54

Table 156 LPDDR-LVCMOS 1.8 V AC Test Parameter Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54

Table 157 LPDDR-LVCMOS 1.8 V Mode Transmitter Drive Strength Specification for DDRIO Bank . . . . . . 54

Table 158 LPDDR-LVCMOS 1.8V AC Switching Characteristics for Receiver (for DDRIO I/O Bank with Fixed

Code - Input Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54

Table 159 LPDDR-LVCMOS 1.8 V AC Switching Characteristics for Transmitter for DDRIO I/O Bank (Output

and Tristate Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54

Table 160 LVDS Recommended DC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55

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Table 161 LVDS DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56

Table 162 LVDS DC Output Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56

Table 163 LVDS DC Differential Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56

Table 164 LVDS Minimum and Maximum AC Switching Speed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56

Table 165 LVDS AC Impedance Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56

Table 166 LVDS AC Test Parameter Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56

Table 167 LVDS25 Receiver Characteristics for MSIO I/O Bank (Input Buffers) . . . . . . . . . . . . . . . . . . . . . . 57

Table 168 LVDS25 Receiver Characteristics for MSIOD I/O Bank (Input Buffers) . . . . . . . . . . . . . . . . . . . . . 57

Table 169 LVDS25 Transmitter Characteristics for MSIO I/O Bank (Output and Tristate Buffers) . . . . . . . . . 57

Table 170 LVDS25 Transmitter Characteristics for MSIOD I/O Bank (Output and Tristate Buffers) . . . . . . . . 57

Table 171 LVDS33 Receiver Characteristics for MSIO I/O Bank (Input Buffers) . . . . . . . . . . . . . . . . . . . . . . 57

Table 172 LVDS33 Transmitter Characteristics for MSIO I/O Bank (Output and Tristate Buffers) . . . . . . . . . 57

Table 173 B-LVDS Recommended DC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58

Table 174 B-LVDS DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58

Table 175 B-LVDS DC Output Voltage Specification (for MSIO I/O Bank Only) . . . . . . . . . . . . . . . . . . . . . . . 58

Table 176 B-LVDS DC Differential Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58

Table 177 B-LVDS Minimum and Maximum AC Switching Speed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58

Table 178 B-LVDS AC Impedance Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58

Table 179 B-LVDS AC Test Parameter Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58

Table 180 B-LVDS AC Switching Characteristics for Receiver for MSIO I/O Bank (Input Buffers) . . . . . . . . . 59

Table 181 B-LVDS AC Switching Characteristics for Receiver for MSIOD I/O Bank (Input Buffers) . . . . . . . . 59

Table 182 B-LVDS AC Switching Characteristics for Transmitter (for MSIO I/O Bank - Output and Tristate

Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59

Table 183 M-LVDS Recommended DC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59

Table 184 M-LVDS DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59

Table 185 M-LVDS DC Voltage Specification Output Voltage Specification (for MSIO I/O Bank Only) . . . . . 60

Table 186 M-LVDS Differential Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60

Table 187 M-LVDS Minimum and Maximum AC Switching Speed for MSIO I/O Bank . . . . . . . . . . . . . . . . . . 60

Table 188 M-LVDS AC Impedance Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60

Table 189 M-LVDS AC Test Parameter Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60

Table 190 M-LVDS AC Switching Characteristics for Receiver (for MSIO I/O Bank - Input Buffers) . . . . . . . 60

Table 191 M-LVDS AC Switching Characteristics for Receiver (for MSIOD I/O Bank - Input Buffers) . . . . . . 60

Table 192 M-LVDS AC Switching Characteristics for Transmitter (for MSIO I/O Bank - Output and Tristate

Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61

Table 193 Mini-LVDS Recommended DC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61

Table 194 Mini-LVDS DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61

Table 195 Mini-LVDS DC Output Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61

Table 196 Mini-LVDS DC Differential Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61

Table 197 Mini-LVDS Minimum and Maximum AC Switching Speed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61

Table 198 Mini-LVDS AC Impedance Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61

Table 199 Mini-LVDS AC Test Parameter Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62

Table 200 Mini-LVDS AC Switching Characteristics for Receiver (for MSIO I/O Bank - Input Buffers) . . . . . . 62

Table 201 Mini-LVDS AC Switching Characteristics for Transmitter for MSIO I/O Bank (Output and Tristate

Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62

Table 202 Mini-LVDS AC Switching Characteristics for Transmitter (for MSIOD I/O Bank - Output and Tristate

Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62

Table 203 RSDS Recommended DC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63

Table 204 RSDS DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63

Table 205 RSDS DC Output Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63

Table 206 RSDS Differential Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63

Table 207 RSDS Minimum and Maximum AC Switching Speed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63

Table 208 RSDS AC Impedance Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63

Table 209 RSDS AC Test Parameter Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63

Table 210 RSDS AC Switching Characteristics for Receiver (for MSIO I/O Bank - Input Buffers) . . . . . . . . . 64

Table 211 RSDS AC Switching Characteristics for Receiver (for MSIOD I/O Bank - Input Buffers) . . . . . . . . 64

Table 212 RSDS AC Switching Characteristics for Transmitter (for MSIO I/O Bank - Output and

Tristate Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64

Table 213 RSDS AC Switching Characteristics for Transmitter (for MSIOD I/O Bank - Output and

Tristate Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64

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Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 ix

Table 214 LVPECL Recommended DC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64

Table 215 LVPECL DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64

Table 216 LVPECL DC Differential Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65

Table 217 LVPECL Minimum and Maximum AC Switching Speeds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65

Table 218 LVPECL Receiver Characteristics for MSIO I/O Bank . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65

Table 219 Input Data Register Propagation Delays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67

Table 220 Output/Enable Data Register Propagation Delays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69

Table 221 Input DDR Propagation Delays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71

Table 222 Output DDR Propagation Delays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74

Table 223 Combinatorial Cell Propagation Delays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76

Table 224 Register Delays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77

Table 225 150 Device Global Resource . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78

Table 226 090 Device Global Resource . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78

Table 227 050 Device Global Resource . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78

Table 228 025 Device Global Resource . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78

Table 229 010 Device Global Resource . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79

Table 230 005 Device Global Resource . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79

Table 231 RAM1K18 – Dual-Port Mode for Depth × Width Configuration 1K × 18 . . . . . . . . . . . . . . . . . . . . . 79

Table 232 RAM1K18 – Dual-Port Mode for Depth × Width Configuration 2K × 9 . . . . . . . . . . . . . . . . . . . . . . 80

Table 233 RAM1K18 – Dual-Port Mode for Depth × Width Configuration 4K × 4 . . . . . . . . . . . . . . . . . . . . . . 81

Table 234 RAM1K18 – Dual-Port Mode for Depth × Width Configuration 8K × 2 . . . . . . . . . . . . . . . . . . . . . . 83

Table 235 RAM1K18 – Dual-Port Mode for Depth × Width Configuration 16K × 1 . . . . . . . . . . . . . . . . . . . . . 84

Table 236 RAM1K18 – Two-Port Mode for Depth × Width Configuration 512 × 36 . . . . . . . . . . . . . . . . . . . . 85

Table 237 µSRAM (RAM64x18) in 64 × 18 Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86

Table 238 µSRAM (RAM64x16) in 64 × 16 Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87

Table 239 µSRAM (RAM128x9) in 128 × 9 Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88

Table 240 µSRAM (RAM128x8) in 128 × 8 Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89

Table 241 µSRAM (RAM256x4) in 256 × 4 Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91

Table 242 µSRAM (RAM512x2) in 512 × 2 Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92

Table 243 µSRAM (RAM1024x1) in 1024 × 1 Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93

Table 244 JTAG Programming (Fabric Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94

Table 245 JTAG Programming (eNVM Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95

Table 246 JTAG Programming (Fabric and eNVM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95

Table 247 2 Step IAP Programming (Fabric Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95

Table 248 2 Step IAP Programming (eNVM Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96

Table 249 2 Step IAP Programming (Fabric and eNVM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96

Table 250 SmartFusion2 Cortex-M3 ISP Programming (Fabric Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96

Table 251 SmartFusion2 Cortex-M3 ISP Programming (eNVM Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96

Table 252 SmartFusion2 Cortex-M3 ISP Programming (Fabric and eNVM) . . . . . . . . . . . . . . . . . . . . . . . . . . 97

Table 253 Programming Times with 100 kHz, 25 MHz, and 12.5 MHz SPI Clock Rates (Fabric Only) . . . . . 97

Table 254 Programming Times with 100 kHz, 25 MHz, and 12.5 MHz SPI Clock Rates (eNVM Only) . . . . . 97

Table 255 Programming Times with 100 kHz, 25 MHz, and 12.5 MHz SPI Clock Rates (Fabric and eNVM) . 98

Table 256 JTAG Programming (Fabric Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99

Table 257 JTAG Programming (eNVM Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99

Table 258 JTAG Programming (Fabric and eNVM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99

Table 259 2 Step IAP Programming (Fabric Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100

Table 260 2 Step IAP Programming (eNVM Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100

Table 261 2 Step IAP Programming (Fabric and eNVM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100

Table 262 SmartFusion2 Cortex-M3 ISP Programming (Fabric Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101

Table 263 SmartFusion2 Cortex-M3 ISP Programming (eNVM Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101

Table 264 SmartFusion2 Cortex-M3 ISP Programming (Fabric and eNVM) . . . . . . . . . . . . . . . . . . . . . . . . . 101

Table 265 Programming Times with 100 kHz, 25 MHz. and 12.5 MHz SPI Clock Rates (Fabric Only) . . . . 102

Table 266 Programming Times with 100 kHz, 25 MHz. and 12.5 MHz SPI Clock Rates (eNVM Only) . . . . 102

Table 267 Programming Times with 100 kHz, 25 MHz. and 12.5 MHz SPI Clock Rates (Fabric and eNVM) 102

Table 268 Math Blocks with all Registers Used . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103

Table 269 Math Block with Input Bypassed and Output Registers Used . . . . . . . . . . . . . . . . . . . . . . . . . . . 103

Table 270 Math Block with Input Register Used and Output in Bypass Mode . . . . . . . . . . . . . . . . . . . . . . . . 104

Table 271 Math Block with Input and Output in Bypass Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104

Table 272 eNVM Read Performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104

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Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 x

Table 273 eNVM Page Programming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104

Table 274 SRAM PUF . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105

Table 275 Non-Deterministic Random Bit Generator (NRBG) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106

Table 276 Cryptographic Block Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106

Table 277 Electrical Characteristics of the Crystal Oscillator – High Gain Mode (20 MHz) . . . . . . . . . . . . . . 107

Table 278 Electrical Characteristics of the Crystal Oscillator – Medium Gain Mode (2 MHz) . . . . . . . . . . . . 108

Table 279 Electrical Characteristics of the Crystal Oscillator – Low Gain Mode (32 kHz) . . . . . . . . . . . . . . . 108

Table 280 Electrical Characteristics of the 50 MHz RC Oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109

Table 281 Electrical Characteristics of the 1 MHz RC Oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109

Table 282 IGLOO2 and SmartFusion2 SoC FPGAs CCC/PLL Specification . . . . . . . . . . . . . . . . . . . . . . . . 110

Table 283 IGLOO2 and SmartFusion2 SoC FPGAs CCC/PLL Jitter Specifications . . . . . . . . . . . . . . . . . . . 111

Table 284 JTAG 1532 for 005, 010, 025, and 050 Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111

Table 285 JTAG 1532 for 060, 090, and 150 Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 112

Table 286 System Controller SPI Characteristics for All Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 113

Table 287 Supported I/O Configurations for System Controller SPI (for MSIO Bank Only) . . . . . . . . . . . . . 113

Table 288 Power-up to Functional Times When MSS/HPMS is Used . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 114

Table 289 Power-up to Functional Times When MSS/HPMS is not Used . . . . . . . . . . . . . . . . . . . . . . . . . . . 115

Table 290 DEVRST_N Characteristics for All Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116

Table 291 DEVRST_N to Functional Times When MSS/HPMS is Used . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116

Table 292 DEVRST_N to Functional Times When MSS/HPMS is not Used . . . . . . . . . . . . . . . . . . . . . . . . . 118

Table 293 Flash*Freeze Entry and Exit Times . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119

Table 294 DDR Memory Interface Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119

Table 295 SFP Transceiver Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120

Table 296 Transmitter Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120

Table 297 Receiver Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121

Table 298 SerDes Protocol Compliance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121

Table 299 SerDes Reference Clock AC Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122

Table 300 HCSL Minimum and Maximum DC Input Levels (Applicable to SerDes REFCLK Only) . . . . . . . 122

Table 301 HCSL Minimum and Maximum AC Switching Speeds (Applicable to SerDes REFCLK Only) . . . 122

Table 302 Maximum Frequency for MSS Main Clock . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122

Table 303 I2C Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123

Table 304 I2C Switching Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 124

Table 305 SPI Characteristics for All Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 125

Table 306 CAN Controller Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127

Table 307 USB Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127

Table 308 MMUART Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128

Table 309 Maximum Frequency for HPMS Main Clock . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128

Table 310 SPI Characteristics for All Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128

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Revision History

Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 1

1 Revision History

The revision history describes the changes that were implemented in the document. The changes are

listed by revision, starting with the current publication.

1.1 Revision 12.0

The following is a summary of the changes in revision 11.0 of this document.

• A note about SERDES_[01]_VDD supply was added to recommended operating conditions table.

See Table 4, page 7.

• A note about VID was added to LVDS DC differential voltage specification. See Table 163, page 56.

• Updated Table 286, page 113. Table 288, page 114, Table 289, page 115, Ta ble 29 0, page 116,

Table 291, page 116, and Table 292, page 118.

• Updated Table 297, page 121 with RX-CID details.

1.2 Revision 11.0

The following is a summary of the changes in revision 11.0 of this document.

• Updated Table 24, page 23 with minimum and maximum values for input current low and high (SAR

73114 and 80314).

• Added Non-Deterministic Random Bit Generator (NRBG) Characteristics, page 106 (SAR 73114

and 79517).

• Added 060 device in Table 282, page 110 (SAR 79860).

• Added DEVRST_N to Functional Times, page 116 (SAR 73114).

• Added Cryptographic Block Characteristics, page 106 (SAR 73114 and 79516).

• Update Ta bl e 29 6, page 120 with VTX-AMP details (SAR 81756).

• Update note in Table 297, page 121 (SAR 74570 and 80677).

• Update Ta bl e 29 8, page 121 with generic EPCS details (SAR 75307).

• Added Ta ble 3 08 , page 128 (SAR 50424).

1.3 Revision 10.0

The following is a summary of the changes in revision 10.0 of this document.

• The Surge Current on VDD during DEVRST_B Assertion and Surge Current on VDD during Digest

Check using System Services tables were deleted and added reference to AC393: Board Design

Guidelines for SmartFusion2 SoC and IGLOO2 FPGAs Application Note. (SAR 76865 and 76623).

• Added 060 device in Table 4, page 7 (SAR 76383).

• Updated Table 24, page 23 for ramp time input (SAR 72103).

• Added 060 device details in Table 284, page 111 (SAR 74927).

• Updated Table 290, page 116 for name change (SAR 74925).

• Updated Table 283, page 111 for 060 FG676 Package details (SAR 78849).

• Updated Table 305, page 125 for SmartFusion2 and Table 310, page 128 for IGLOO2 for SPI timing

and Fmax (SAR 56645, 75331).

• Updated Table 293, page 119 for Flash*Freeze entry and exit times (SAR 75329, 75330).

• Updated Table 297, page 121 for RX-CID information (SAR 78271).

• Added Ta ble 8 , page 9 and Figure 1, page 10 (SAR 78932).

• Updated Table 223, page 76 for timing characteristics and Ta ble 2 24 , page 77(SAR 75998).

• Added SRAM PUF, page 105 (SAR 64406).

• Added a footnote on digest cycle in Ta ble 5, page 8 (SAR 79812).

1.4 Revision 9.0

The following is a summary of the changes in revision 9.0 of this document.

• Added a note in Table 5, page 8 (SAR 71506).

• Added a note in Table 6, page 9 (SAR 74616).

• Added a note in Figure 3, page 18 (SAR 71506).

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Revision History

Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 2

• Updated Quiescent Supply Current for 060 in Ta bl e 11 , page 13 and Ta ble 1 2, page 14 (SAR

74483).

• Updated programming currents for 060 in Ta ble 13 , page 14, Ta ble 14 , page 14, and Table 15,

page 15.

• Added DEVRST_B assertion tables (SAR 74708).

• Updated I/O speeds for LVDS 3.3 V in Table 18, page 20 and Table 21, page 21 (SAR 69829).

• Updated Table 24, page 23 (SAR 69418).

• Updated Table 25, page 23, Table 26, page 24, Table 27, page 24 (SAR 74570).

• Updated all AC/DC table to link to the Input Capacitance, Leakage Current, and Ramp Time,

page 23 for reference (SAR 69418).

• Added Ta ble 2 44 , page 94 and Table 256, page 99 (SAR 73971).

• Updated the SerDes Electrical and Timing AC and DC Characteristics, page 120 (SAR 71171).

• Added the DEVRST_N Characteristics, page 116 (SAR 64100, 72103).

• Added Ta ble 2 98 , page 121 (SAR 71897).

• Updated Table 25, page 23, Table 26, page 24, and Ta ble 27 , page 24 (SAR 74570).

• Added 060 devices in Table 277, page 107, Ta ble 27 8, page 108, and Tab le 2 79, page 108 (SAR

57898).

• Updated duty cycle parameter of crystal in Table 280, page 109 and Table 281, page 109 (SAR

57898).

• Added 32 KHz mode PLL acquisition time in Table 282, page 110 (SAR 68281).

• Updated Table 293, page 119 for 060 devices (SAR 57828).

• Updated Table 297, page 121 for CID value (SAR 70878).

1.5 Revision 8.0

The following is a summary of the changes in revision 8.0 of this document.

• Updated Table 11, page 13 (SAR 69218).

• Updated Table 12, page 14 (SAR 69218).

• Updated Table 283, page 111 (SAR 69000).

1.6 Revision 7.0

The following is a summary of the changes in revision 7.0 of this document.

• Updated Table 1, page 5(SAR 68620).

1.7 Revision 6.0

The following is a summary of the changes in revision 6.0 of this document.

• Updated Table 5, page 8 (SAR 65949).

• Updated Table 9, page 11 (SAR 62995).

• Updated Table 123, page 47 and Table 133, page 50 (SAR 67210).

• Added Embedded NVM (eNVM) Characteristics, page 104 (SAR 52509).

• Updated Table 277, page 107 (SAR 64855).

• Updated Table 282, page 110 (SAR 65958 and SAR 56666).

• Added DDR Memory Interface Characteristics, page 119 (SAR 66223).

• Added SFP Transceiver Characteristics, page 120 (SAR 63105).

• Updated Table 302, page 122 and Table 309, page 128 (SAR 66314).

1.8 Revision 5.0

The following is a summary of the changes in revision 5.0 of this document.

• Updated Table 1, page 5.

• Updated Table 4, page 7 for TJ symbol information.

• Updated Table 5, page 8 (SAR 63109).

• Updated Table 9, page 11.

• Updated Table 282, page 110 (SAR 62012).

• Added Ta ble 2 90 , page 116 (SAR 64100).

• Added Ta bl e 30 6, page 127, Table 307, page 127 (SAR 50424).

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Revision History

Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 3

1.9 Revision 4.0

The following is a summary of the changes in revision 4.0 of this document.

• Updated Table 1, page 5. Changed the Status of 090 devices to "Production" (SAR 62750).

• Updated Figure 10, page 70. Removed inverter bubble from DDR_IN latch (SAR 61418).

• Updated SerDes Electrical and Timing AC and DC Characteristics, page 120 (SAR 62836).

1.10 Revision 3.0

In revision 3.0 of this document, the Theta B/C columns and FCS325 package was updated. For more

information, see Ta ble 9, page 11 (SAR 62002).

1.11 Revision 2.0

The following is a summary of the changes in revision 2.0 of this document.

•Table 1, page 5 was updated (SAR 59056).

•Table 7, page 9 temperature and data retention information was updated SAR (61363).

• Storage Operating Table was updated and split into three tables – Table 5, page 8, Tab le 7 , page 9

(SAR 58725).

• Updated Theta B/C columns and FCS325 package in Ta bl e 9, page 11 (SAR 62002).

• Added 090-FCS325 thermal resistance to Ta ble 9, page 11 (SAR 59384).

• TQ144 package was added to Table 9, page 11 (SAR 57708).

• Added PLL jitter data for the VF400 package (SAR 53162).

• Added Additional Worst Case IDD to Tab le 11 , page 13 and Table 12, page 14 (SAR 59077).

•Table 13, page 14, Table 14, page 14, and Ta ble 15 , page 15 were added to verify Inrush currents

(SAR 56348).

•Table 18, page 20 and Table 21, page 21 – I/O speeds were replaced.

• Max speed was changed in Table 41, page 27 (SAR 57221) and in Table 52, page 30 (SAR 57113).

•Minimum and Maximum DC/AC Input and Output Levels Specification, page 30 and

Table 49, page 30–Table 57, page 32 were added.

• Added Cload to Table 89, page 40 (SAR 56238).

• Removed "Rs" information in DDR Timing Measurement Table 123, page 47, Ta bl e 13 3, page 50,

and Ta bl e 14 4, page 52.

• Updated drive programming for M/B-LVDS outputs (SAR 58154).

• Added an inverter bubble to DDR_IN latch in Figure 10, page 70 (SAR 61418).

• QF waveform in Figure 11, page 71 was updated (SAR 59816).

• uSRAM Write Clock minimum values were updated in Table 237, page 86–Table 243, page 93 (SAR

55236).

• Fixed typo in the 32 kHz Crystal (XTAL) oscillator accuracy data section (SAR 59669).

•The "On-Chip Oscillator" section was split, and the Embedded NVM (eNVM) Characteristics,

page 104 was added. Table 277, page 107–Tab le 2 81, page 109 were revised.(SARs 57898 and

59669).

• PLL VCP Frequency and conditions were added to Ta ble 28 2, page 110 (SAR 57416).

• Fixed typo for PLL jitter data in the 100-400 MHz range (SAR 60727).

• Updated FCCC information in Table 282, page 110 and Ta bl e 28 3, page 111 (SAR 60799).

• Device 025 specifications were added to Ta bl e 28 3, page 111 (SAR 51625).

•JTAG Table 284, page 111 was replaced (SAR 51188).

• Flash*Freeze Table 293, page 119 was replaced (SAR 57828).

• Added support for HCSL I/O Standard for SERDES reference clocks in Ta bl e 30 0, page 122 and

Table 301, page 122 (SAR 50748).

• Tir and Tif parameters were added to Table 303, page 123 (SAR 52203).

• Speed grade consistency was fixed in tables throughout the datasheet (SAR 50722).

• Added jitter attenuation information (SAR 59405).

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Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 4

1.12 Revision 1.0

The following is a summary of the changes in revision 1.0 of this document.

• The IGLOO2 v2 and the SmartFusion2 v5 datasheets are combined into this single product family

datasheet.

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2 IGLOO2 FPGA and SmartFusion2 SoC FPGA

Microsemi’s mainstream SmartFusion®2 SoC and IGLOO®2 FPGA families integrate an industry

standard 4-input lookup table-based (LUT) FPGA fabric with integrated math blocks, multiple embedded

memory blocks, and high-performance SerDes communication interfaces on a single chip. Both families

benefit from low-power flash technology and are the most secure and reliable FPGAs in the industry.

These next generation devices offer up to 150K Logic Elements, up to 5 MBs of embedded RAM, up to

16 SerDes lanes, and up to four PCI Express Gen 2 endpoints, as well as integrated hard DDR3 memory

controllers with error correction.

SmartFusion2 devices integrate an entire low-power, real-time microcontroller subsystem (MSS) with a

rich set of industry-standard peripherals including Ethernet, USB, and CAN, while IGLOO2 devices

integrate a high-performance memory subsystem with on-chip flash, 32 Kbyte embedded SRAM, and

multiple DMA controllers.

2.1 Device Status

The following table shows the design security densities and development status of the IGLOO2 FPGA

and SmartFusion2 SoC FPGA devices.

The following table shows the data security densities and development status of the IGLOO2 FPGA and

SmartFusion2 SoC FPGA devices.

Table 1 • IGLOO2 and SmartFusion2 Design Security Densities

Design Security Device Densities Status

005 Production

010, 010T Production

025, 025T Production

050, 050T Production

060, 060T Production

090, 090T Production

150, 150T Production

Table 2 • IGLOO2 and SmartFusion2 Data Security Densities

Data Security Device Densities Status

005S Production

010TS Production

025TS Production

050TS Production

060TS Production

090TS Production

150TS Production

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2.2 References

The following documents are recommended references:

•PB0121: IGLOO2 Product Brief

•DS0124: IGLOO2 Pin Descriptions

•PB0115: SmartFusion2 SoC FPGA Product Brief

•DS0115: SmartFusion2 Pin Descriptions

All product documentation for IGLOO2 and SmartFusion2 is available at:

http://www.microsemi.com/products/fpga-soc/fpga/igloo2-fpga

http://www.microsemi.com/products/fpga-soc/soc-fpga/smartfusion2#overview

2.3 Electrical Specifications

2.3.1 Operating Conditions

The following table lists the stress limits. Stress applied above the specified limit may cause permanent

damage to the device. Exposure to absolute maximum rating conditions for extended periods may affect

device reliability.

Absolute maximum ratings are stress ratings only; functional operation of the device at these or any

other conditions beyond those listed under the recommended operating conditions specified in the

following table are not implied.

Table 3 • Absolute Maximum Ratings

Parameter Symbol Min Max Unit

DC core supply voltage. Must always power this pin. VDD –0.3 1.32 V

Power supply for charge pumps (for normal operation

and programming). Must always power this pin.

VPP –0.3 3.63 V

Analog power pad for MDDR PLL MSS_MDDR_PLL_VDDA –0.3 3.63 V

Analog power pad for MDDR PLL HPMS_MDDR_PLL_VDDA –0.3 3.63 V

Analog power pad for FDDR PLL FDDR_PLL_VDDA –0.3 3.63 V

Analog power pad for MDDR PLL PLL0_PLL1_MSS_MDDR_VDDA –0.3 3.63 V

Analog power pad for MDDR PLL PLL0_PLL1_HPMS_MDDR_VDDA –0.3 3.63 V

Analog power pad for PLL0–5 CCC_XX[01]_PLL_VDDA –0.3 3.63 V

High supply voltage for PLL SerDes[01] SERDES_[01]_PLL_VDDA –0.3 3.63 V

Analog power for SerDes[01] PLL lane0 to lane3.

This is a 2.5 V SerDes internal PLL supply.

SERDES_[01]_L[0123]_VDDAPLL –0.3 2.75 V

TX/RX analog I/O voltage. Low voltage power for the

lanes of SerDesIF0. This is a 1.2 V SerDes PMA supply.

SERDES_[01]_L[0123]_VDDAIO –0.3 1.32 V

PCIe/PCS power supply SERDES_[01]_VDD –0.3 1.32 V

DC FPGA I/O buffer supply voltage for MSIO I/O bank VDDIx –0.3 3.63 V

DC FPGA I/O buffer supply voltage for MSIOD/DDRIO

I/O banks

VDDIx –0.3 2.75 V

I/O Input voltage for MSIO I/O bank VI–0.3 3.63 V

I/O Input voltage for MSIOD/DDRIO I/O bank VI–0.3 2.75 V

Analog sense circuit supply of embedded nonvolatile

memory (eNVM). Must be shorted to VPP

VPPNVM –0.33.63V

Storage temperature1TSTG –65 150 °C

Junction temperature TJ–55 135 °C

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1. For flash programming and retention maximum limits, see Table 5, page 8. For recommended operating conditions, see Table 4,

page 7.

Table 4 • Recommended Operating Conditions1

Parameter Symbol Min Typ Max Unit Conditions

Operating junction temperature TJ0 25 85 °C Commercial

–40 25 100 °C Industrial

Programming junction temperatures2TJ0 25 85 °C Commercial

–40 25 100 °C Industrial

DC core supply voltage.

Must always power this pin.

VDD 1.14 1.2 1.26 V

Power supply for charge pumps

(for normal operation and

programming) for the 005, 010,

025, 050, 060 devices

VPP 2.375 2.5 2.625 V 2.5 V range

3.15 3.3 3.45 V 3.3 V range

Power supply for charge pumps (for

normal operation and programming)

for the 090 and 150 devices

VPP 3.15 3.3 3.45 V 3.3 V range

Analog power pad for MDDR PLL MSS_MDDR_PLL_VDDA 2.375 2.5 2.625 V 2.5 V range

3.15 3.3 3.45 V 3.3 V range

Analog power pad for MDDR PLL HPMS_MDDR_PLL_VDDA 2.375 2.5 2.625 V 2.5 V range

3.15 3.3 3.45 V 3.3 V range

Analog power pad for FDDR PLL FDDR_PLL_VDDA 2.375 2.5 2.625 V 2.5 V range

3.15 3.3 3.45 V 3.3 V range

Analog power pad for MDDR PLL PLL0_PLL1_MSS_MDDR_V

DDA

2.375 2.5 2.625 V 2.5 V range

3.15 3.3 3.45 V 3.3 V range

Analog power pad for MDDR PLL PLL0_PLL1_HPMS_MDDR_

VDDA

2.375 2.5 2.625 V 2.5 V range

3.15 3.3 3.45 V 3.3 V range

Analog power pad for PLL0 to PLL5 CCC_XX[01]_PLL_VDDA 2.375 2.5 2.625 V 2.5 V range

3.15 3.3 3.45 V 3.3 V range

High supply voltage for PLL

SerDes[01]

SERDES_[01]_PLL_VDDA 2.375 2.5 2.625 V 2.5 V range

3.15 3.3 3.45 V 3.3 V range

Analog power for SerDes[01] PLL

Lane 0 to Lane 3. This is a 2.5 V

SerDes internal PLL supply.

SERDES_[01]_L[0123]_VD

DAPLL

2.375 2.5 2.625 V

TX/RX analog I/O voltage. Low

voltage power for the lanes of

SerDesIF0. This is a 1.2 V SerDes

PMA supply.

SERDES_[01]_L[0123]_VD

DAIO

1.14 1.2 1.26 V

PCIe/PCS power supply SERDES_[01]_VDD 1.14 1.2 1.26 V

1.2 V DC supply voltage VDDIx 1.14 1.2 1.26 V

1.5 V DC supply voltage VDDIx 1.425 1.5 1.575 V

1.8 V DC supply voltage VDDIx 1.71 1.8 1.89 V

2.5 V DC supply voltage VDDIx 2.375 2.5 2.625 V

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Note: Power supply ramps must all be strictly monotonic, without plateaus.

Note: The retention specification is defined as the total number of programing and digest cycles. For example,

20 years of retention after 500 programming cycles.

Note: The digest cycle specification is 2000 digest cycles for every program cycle with a maximum of 500

programming cycles.

Note: If your product qualification requires accelerated programming cycles, see Microsemi SoC Products

Quality and Reliability Report about recommended methodologies.

3.3 V DC supply voltage VDDIx 3.15 3.3 3.45 V

LVDS differential I/O VDDIx 2.375 2.5 3.45 V

B-LVDS, M-LVDS, Mini-LVDS,

RSDS differential I/O

VDDIx 2.375 2.5 2.625 V

LVPECL differential I/O VDDIx 3.15 3.3 3.45 V

Reference voltage supply for FDDR

(Bank0) and MDDR (Bank5)

VREFx 0.49 ×

VDDIx

0.5 ×

VDDIx

0.51 ×

VDDIx

Analog sense circuit supply of

embedded nonvolatile memory

(eNVM). Must be shorted to VPP.

VPPNVM 2.375 2.5 2.625 V 2.5 V range

3.15 3.3 3.45 V 3.3 V range

1. The SERDES_[01]_VDD supply must be connected to VDD.

2. Programming at Industrial temperature range is available only with VPP = 3.3 V.

Table 5 • FPGA Operating Limits

Product

Grade Element

Programming

Temperature

Operating

Temperature

Programming

Cycles

Digest

Temperature

Digest

Cycles

Retention

(Biased/

Unbiased)

Commercial FPGA Min TJ = 0 °C

Max TJ = 85 °C

Min TJ = 0 °C

Max TJ = 85 °C

500 Min TJ = 0 °C

Max TJ = 85 °C

2000 20 years

Industrial1

1. Programming at Industrial temperature range is available only with VPP = 3.3 V.

FPGA Min TJ = –40 °C

Max TJ = 100 °C

Min TJ = –40 °C

Max TJ = 100 °C

500 Min TJ = –40 °C

Max TJ = 100 °C

2000 20 years

Table 4 • Recommended Operating Conditions1 (continued)

Parameter Symbol Min Typ Max Unit Conditions

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The following table lists the embedded operating flash limits.

Note: If your product qualification requires accelerated programming cycles, see Microsemi SoC Products

Quality and Reliability Report about recommended methodologies.

Table 6 • Embedded Operating Flash Limits

Product

Grade Element

Programming

Temperature

Maximum

Operating

Temperature

Programming

Cycles

Retention

(Biased/Unbiased)

Commercial Embedded flash Min TJ = 0 °C

Max TJ = 85 °C

Min TJ = 0 °C

Max TJ = 85 °C

< 1000 cycles per page,

up to two million cycles

per eNVM array

20 years

Min TJ = 0 °C

Max TJ = 85 °C

< 10000 cycles per page,

up to 20 million cycles per

eNVM array

10 years

Industrial Embedded flash Min TJ = –40 °C

Max TJ = 100 °C

Min TJ = –40 °C

Max TJ = 100 °C

< 1000 cycles per page,

up to two million cycles

per eNVM array

20 years

Min TJ = –40 °C

Max TJ = 100 °C

< 10000 cycles per page,

up to 20 million cycles per

eNVM array

10 years

Table 7 • Device Storage Temperature and Retention

Product Grade Storage Temperature (Tstg) Retention

Commercial Min TJ = 0 °C

Max TJ = 85 °C

20 years

Industrial Min TJ = –40 °C

Max TJ = 100 °C

20 years

Table 8 • High Temperature Data Retention (HTR) Lifetime

TJ (C) HTR Lifetime1 (yrs)

1. HTR Lifetime is the period during which a verify failure is not expected due

to flash leakage.

90 20.5

95 20.5

100 20.5

105 17.0

110 15.0

115 13.0

120 11.5

125 10.0

130 8.0

135 6.0

140 4.5

145 3.0

150 1.5

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Figure 1 • High Temperature Data Retention (HTR)

2.3.1.1 Overshoot/Undershoot Limits

For AC signals, the input signal may undershoot during transitions to –1.0 V for no longer than 10% of

the period. The current during the transition must not exceed 100 mA.

For AC signals, the input signal may overshoot during transitions to VCCI + 1.0 V for no longer than 10%

of the period. The current during the transition must not exceed 100 mA.

Note: The above specifications do not apply to the PCI standard. The IGLOO2 and SmartFusion2 PCI I/Os are

compliant with the PCI standard including the PCI overshoot/undershoot specifications.

2.3.1.2 Thermal Characteristics

The temperature variable in the Microsemi SoC Products Group Designer software refers to the junction

temperature, not the ambient, case, or board temperatures. This is an important distinction because

dynamic and static power consumption causes the chip's junction temperature to be higher than the

ambient, case, or board temperatures.

EQ1 through EQ3 give the relationship between thermal resistance, temperature gradient, and power.

EQ 1

EQ 2

EQ 3

JA

TJTA

–

-------------------

JB

TJTB

–

-------------------

JC

TJTC

–

-------------------

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where

JA =Junction-to-air thermal resistance

JB =Junction-to-board thermal resistance

JC =Junction-to-case thermal resistance

TJ=Junction temperature

TA=Ambient temperature

TB=Board temperature (measured 1.0 mm away from the package edge)

TC=Case temperature

P=Total power dissipated by the device

Table 9 • Package Thermal Resistance of SmartFusion2 and IGLOO2 Devices

Device

Still Air 1.0 m/s 2.5 m/s

JB JC UnitJA

005

FG484 19.36 15.81 14.63 9.74 5.27 °C/W

VF256 41.30 38.16 35.30 28.41 3.94 °C/W

VF400 20.19 16.94 15.41 8.86 4.95 °C/W

TQ144 42.80 36.80 34.50 37.20 10.80 °C/W

010

FG484 18.22 14.83 13.62 8.83 4.92 °C/W

VF256 37.36 34.26 31.45 24.84 7.89 °C/W

VF400 19.40 15.75 14.22 8.11 4.22 °C/W

TQ144 38.60 32.60 30.30 31.80 8.60 °C/W

025

FG484 17.03 13.66 12.45 7.66 4.18 °C/W

VF256 33.85 30.59 27.85 21.63 6.13 °C/W

VF400 18.36 14.89 13.36 7.12 3.41 °C/W

FCS325 29.17 24.87 23.12 14.44 2.31 °C/W

050

FG484 15.29 12.19 10.99 6.27 3.24 °C/W

FG896 14.70 12.50 10.90 7.20 4.90 °C/W

VF400 17.53 14.17 12.63 6.32 2.81 °C/W

FCS325 27.38 23.18 21.41 12.47 1.59 °C/W

060

FG484 15.40 12.06 10.85 6.14 3.15 °C/W

FG676 15.49 12.21 11.06 7.07 3.87 °C/W

VF400 17.45 14.01 12.47 6.22 2.69 °C/W

FCS325 27.03 22.91 21.25 12.33 1.54 °C/W

090

FG484 14.64 11.37 10.16 5.43 2.77 °C/W

FG676 14.52 11.19 10.37 6.17 3.24 °C/W

FCS325 26.63 22.26 20.13 14.24 2.50 °C/W

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2.3.1.2.1 Theta-JA

Junction-to-ambient thermal resistance (JA) is determined under standard conditions specified by

JEDEC (JESD-51), but it has little relevance in the actual performance of the product. It must be used

with caution, but it is useful for comparing the thermal performance of one package with another.

The maximum power dissipation allowed is calculated using EQ4.

EQ 4

The absolute maximum junction temperature is 100 °C. EQ5 shows a sample calculation of the absolute

maximum power dissipation allowed for the M2GL050T-FG896 package at commercial temperature and

in still air, where:

EQ 5

The power consumption of a device can be calculated using the Microsemi SoC Products Group power

calculator. The device's power consumption must be lower than the calculated maximum power

dissipation by the package.

If the power consumption is higher than the device's maximum allowable power dissipation, a heat sink

may be attached to the top of the case, or the airflow inside the system must be increased.

2.3.1.2.2 Theta-JB

Junction-to-board thermal resistance (JB) measures the ability of the package to dissipate heat from the

surface of the chip to the PCB. As defined by the JEDEC (JESD-51) standard, the thermal resistance

from the junction to the board uses an isothermal ring cold plate zone concept. The ring cold plate is

simply a means to generate an isothermal boundary condition at the perimeter. The cold plate is

mounted on a JEDEC standard board with a minimum distance of 5.0 mm away from the package edge.

2.3.1.2.3 Theta-JC

Junction-to-case thermal resistance (JC) measures the ability of a device to dissipate heat from the

surface of the chip to the top or bottom surface of the package. It is applicable to packages used with

external heat sinks. Constant temperature is applied to the surface, which acts as a boundary condition.

This only applies to situations where all or nearly all of the heat is dissipated through the surface in

consideration.

2.3.1.3 ESD Performance

See RT0001: Microsemi Corporation - SoC Products Reliability Report for information about ESD.

150

FC1152 9.08 6.81 5.87 2.56 0.38 °C/W

FCS536 15.01 12.06 10.76 3.69 1.55 °C/W

FCV484 16.21 13.11 11.84 6.73 0.10 °C/W

JA = 14.7 °C/W (taken from Table 9, page 11).

TA= 85 °C

Table 9 • Package Thermal Resistance of SmartFusion2 and IGLOO2 Devices (continued)

Device

Still Air 1.0 m/s 2.5 m/s

JB JC UnitJA

Maximum power allowed TJ(MAX) TA(MAX)

–

JA

---------------------------------------------

Maximum power allowed 100 °C 85 °C–

14.7 °C/W

----------------------------------------1.088 W==

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2.3.2 Power Consumption

The following sections describe the power consumptions of the devices.

2.3.2.1 Quiescent Supply Current

Table 10 • Quiescent Supply Current Characteristics

Power Supplies/Blocks

Modes and Configurations

Non-Flash*Freeze Flash*Freeze

FPGA Core On Off

VDD/SERDES_[01]_VDD1

1. SERDES_[01]_VDD Power Supply is shorted to VDD.

On On

VPP/VPPNVM On On

HPMS_MDDR_PLL_VDDA/FDDR_PLL_VDDA/

CCC_XX[01]_PLL_VDDA/PLL0_PLL1_HPMS_MDDR_VDD

0 V 0 V

SERDES_[01]_PLL_VDDA2

2. SerDes and DDR blocks to be unused.

0 V 0 V

SERDES_[01]_L[0123]_VDDAPLL/VDD_2V52On On

SERDES_[01]_L[0123]_VDDAIIO2On On

VDDIx3, 4

3. VDDIx has been set to ON for test conditions as described. Banks on the east side should always be powered with

the appropriate VDDI bank supplies. For details on bank power supplies, see “Recommendation for Unused Bank

Supplies” table in the AC393: SmartFusion2 and IGLOO2 Board Design Guidelines Application Note.

4. No Differential (that is to say, LVDS) I/Os or ODT attributes to be used.

On On

VREFx On On

MSSDDR CLK 32 kHz 32 kHz

RAM On Sleep state

System controller 50 MHz 50 MHz

50 MHz oscillator (enable/disable) Enable Disabled

1 MHz oscillator (enable/disable) Disabled Disabled

Crystal oscillator (enable/disable) Disabled Disabled

Table 11 • SmartFusion2 and IGLOO2 Quiescent Supply Current (VDD = 1.2 V) – Typical Process

Symbol Modes 005 010 025 050 060 090 150 Unit Conditions

IDC1 Non-

Flash*Freeze

6.2 6.9 8.9 13.1 15.3 15.4 27.5 mA Typical

(TJ = 25 °C)

24.0 28.4 40.6 67.8 80.6 81.4 144.7 mA Commercial

(TJ = 85 °C)

35.2 41.9 60.5 102.1 121.4 122.6 219.1 mA Industrial

(TJ = 100 °C)

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2.3.2.2 Programming Currents

The following tables represent programming, verify and Inrush currents for SmartFusion2 SoC and

IGLOO2 FPGA devices.

IDC2 Flash*Freeze 1.4 2.6 3.7 5.1 5.0 5.1 8.9 mA Typical

(TJ = 25 °C)

12.0 20.0 26.6 35.3 35.4 35.7 57.8 mA Commercial

(TJ = 85 °C)

18.5 30.8 41.0 54.5 54.5 55.0 89.0 mA Industrial

(TJ = 100 °C)

Table 12 • SmartFusion2 and IGLOO2 Quiescent Supply Current (VDD = 1.26 V) – Worst-Case Process

Symbol Modes 005 010 025 050 060 090 150 Unit Conditions

IDC1 Non-

Flash*Freeze

43.8 57.0 84.6 132.3 161.4 163.0 242.5 mA Commercial

(TJ= 85 °C)

65.3 85.7 127.8 200.9 245.4 247.8 369.0 mA Industrial

(TJ = 100 °C)

IDC2 Flash*Freeze 29.1 45.6 51.7 62.7 69.3 70.0 84.8 mA Commercial

(TJ = 85 °C)

44.9 70.3 79.7 96.5 106.8 107.8 130.6 mA Industrial

(TJ = 100 °C)

Table 13 • Currents During Program Cycle, 0 °C < = TJ <= 85 °C – Typical Process

Power Supplies Voltage (V) 005 010 025 050 060 090 1501

1. VPP and VPPNVM are internally shorted.

Unit

VDD 1.26 46 53 55 58 30 42 52 mA

VPP 3.46 8 11 6 10 9 12 12 mA

VPPNVM 3.46 122333 mA

VDDI 2.62 31 16 17 1 12 12 81 mA

3.46 62 31 36 1 12 17 84 mA

Number of banks 7 8 8 10 10 9 19

Table 14 • Currents During Verify Cycle, 0 °C <= TJ <= 85 °C – Typical Process

Power Supplies Voltage (V) 005 010 025 050 060 090 1501

1. VPP and VPPNVM are internally shorted.

Unit

VDD 1.26 44 53 55 58 33 41 51 mA

VPP 3.46 6531581112mA

VPPNVM 3.46 100111 mA

VDDI 2.62 31 16 17 1 12 11 81 mA

3.46 61 32 36 1 12 17 84 mA

Number of banks 7 8 8 10 10 9 19

Table 11 • SmartFusion2 and IGLOO2 Quiescent Supply Current (VDD = 1.2 V) – Typical Process

Symbol Modes 005 010 025 050 060 090 150 Unit Conditions

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2.3.3 Average Fabric Temperature and Voltage Derating Factors

The following table lists the average temperature and voltage derating factors for fabric timing delays

normalized to TJ = 85 °C, in worst-case VDD = 1.14 V.

Table 15 • Inrush Currents at Power up, –40 °C <= TJ <= 100 °C – Typical Process

Power Supplies Voltage (V) 005 010 025 050 060 090 150 Unit

VDD 1.26 25 32 38 48 45 77 109 mA

VPP 3.46 33 49 36 180 13 36 51 mA

VDDI 2.62 134 141 161 187 93 272 388 mA

Number of banks 7 8 8 10 10 9 19

Table 16 • Average Junction Temperature and Voltage Derating Factors for Fabric Timing Delays

Array Voltage VDD (V) –40 °C 0 °C 25 °C 70 °C 85 °C 100 °C

1.14 0.83 0.89 0.92 0.98 1.00 1.02

1.2 0.75 0.80 0.83 0.89 0.91 0.93

1.26 0.690.730.760.810.830.85

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2.3.4 Timing Model

This section describes timing model and timing parameters.

Figure 2 • Timing Model

The following table lists the timing model parameters in worst commercial-case conditions when

TJ = 85 °C, VDD = 1.14 V.

Table 17 • Timing Model Parameters

Index Symbol Description –1 Unit For More Information

PY Propagation delay of DDR3 receiver 1.605 ns See Ta bl e 13 7, page 50

ICLKQ Clock-to-Q of the input data register 0.16 ns See Tab l e 22 1, page 71

TISUD Setup time of the input data register 0.357 ns See Ta ble 22 1, page 71

RCKH Input high delay for global clock 1.53 ns See Ta bl e 22 7, page 78

TRCKL Input low delay for global clock 0.897 ns See Ta bl e 22 7, page 78

PY Input propagation delay of LVDS

receiver

2.774 ns See Ta ble 16 7, page 57

DP Propagation delay of a three-input AND

gate

0.198 ns See Ta ble 22 3, page 76

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DP Propagation delay of an OR gate 0.179 ns See Tabl e 22 3, page 76

DP Propagation delay of an LVDS

transmitter

2.136 ns See Ta ble 16 9, page 57

DP Propagation delay of a three-input XOR

Gate

0.241 ns See Ta ble 22 3, page 76

DP Propagation delay of LVCMOS 2.5 V

transmitter, drive strength of 16 mA on

the MSIO bank

2.412 ns See Table 46, page 28

DP Propagation delay of a two-input NAND

gate

0.179 ns See Ta ble 22 3, page 76

DP Propagation delay of LVCMOS 2.5 V

transmitter, drive strength of 8 mA on

the MSIO bank

2.309 ns See Table 46, page 28

CLKQ Clock-to-Q of the data register 0.108 ns See Ta ble 22 4, page 77

TSUD Setup time of the data register 0.254 ns See Ta bl e 22 4, page 77

DP Propagation delay of a two-input AND

gate

0.179 ns See Ta ble 22 3, page 76

OCLKQ Clock-to-Q of the output data register 0.263 ns See Tabl e 22 0, page 69

TOSUD Setup time of the output data register 0.19 ns See Ta ble 22 0, page 69

DP Propagation delay of SSTL2, Class I

transmitter on the MSIO bank

2.055 ns See Tab l e 114 , page 46

DP Propagation delay of LVCMOS 1.5 V

transmitter, drive strength of 12 mA,

fast slew on the DDRIO bank

3.316 ns See Table 70, page 35

Table 17 • Timing Model Parameters (continued)

Index Symbol Description –1 Unit For More Information

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2.3.5 User I/O Characteristics

There are three types of I/Os supported in the IGLOO2 FPGA and SmartFusion2 SoC FPGA families:

MSIO, MSIOD, and DDRIO I/O banks. The I/O standards supported by the different I/O banks is

described in the I/Os section of the UG0445: IGLOO2 FPGA and SmartFusion2 SoC FPGA Fabric User

Guide.

2.3.5.1 Input Buffer and AC Loading

The following figure shows the input buffer and AC loading.

Figure 3 • Input Buffer AC Loading

TPY

(R)

GND TPY

(F)

TPYS

(R)

TPYS

(F)

50%

PAD Y

TPY

VIH

VCCA

VTRIP

VTRIP VIL

TPYS

TPY = MAX(TPY(R), TPY(F))

TPYS = MAX(TPYS(R), TPYS(F))

Note: TPYS = Schmitt Trigger Input

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2.3.5.2 Output Buffer and AC Loading

The following figure shows the output buffer and AC loading.

Figure 4 • Output Buffer AC Loading

PAD

DDI

CLOAD

= MAX(T

(R), T

(F))

PAD

CLOAD

Rtt_test

= MAX(T

(R), T

(F))

Single-Ended I/O Test Setup HSTL/PCI Test Setup

PAD

CLOAD

Rtt_test

= MAX(T

(R), T

(F))

Voltage-Referenced, Singled-Ended I/O Test Setup

Differential I/O Test Setup

PAD_P PAD_P

= MAX(T

(R), T

(F)) T

= MAX(T

(R), T

(F))

PYS

= MAX(T

PYS

(R), T

PYS

(F))

PAD_N PAD_N

OUT

OUT OUT

OUT

VTT

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2.3.5.3 Tristate Buffer and AC Loading

The tristate path for enable path loadings is described in the respective specifications. The following

figure shows the methodology of characterization illustrated by the enable path test point.

Figure 5 • Tristate Buffer for Enable Path Test Point

2.3.5.4 I/O Speeds

This section describes the maximum data rate summary of I/O in worst-case industrial conditions. See

the individual I/O standards for operating conditions.

Table 18 • Maximum Data Rate Summary Table for Single-Ended I/O in Worst-Case

Industrial Conditions

I/O MSIO MSIOD DDRIO Unit

PCI 3.3 V 630 Mbps

LVTTL 3.3 V 600 Mbps

LVCMOS 3.3 V 600 Mbps

LVCMOS 2.5 V 410 420 400 Mbps

LVCMOS 1.8 V 295 400 400 Mbps

LVCMOS 1.5 V 160 220 235 Mbps

LVCMOS 1.2 V 120 160 200 Mbps

LPDDR-LVCMOS 1.8 V mode 400 Mbps

THZ TZH

TLZ

90% VDDI

10% VDDI

50%

PAD

Data

(D)

Enable

(E)

50%

10% VDDI

TZL

50%

PAD

DOUT

TZL, TZH, THZ, TLZ

Rent to GND for TZH, THZ

50%

Cent TZL, TLZ, TZH, THZ

Rent to VDDI for TZL, TLZ

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Table 19 • Maximum Data Rate Summary Table for Voltage-Referenced I/O in Worst-Case

Industrial Conditions

I/O MSIO MSIOD DDRIO Unit

LPDDR 400 Mbps

HSTL1.5 V 400 Mbps

SSTL 2.5 V 510 700 400 Mbps

SSTL 1.8 V 667 Mbps

SSTL 1.5 V 667 Mbps

Table 20 • Maximum Data Rate Summary Table for Differential I/O in Worst-Case

Industrial Conditions

I/O MSIO MSIOD Unit

LVPECL (input only) 900 Mbps

LVDS 3.3 V 535 Mbps

LVDS 2.5 V 535 700 Mbps

RSDS 520 700 Mbps

BLVDS 500 Mbps

MLVDS 500 Mbps

Mini-LVDS 520 700 Mbps

Table 21 • Maximum Frequency Summary Table for Single-Ended I/O in Worst-Case

Industrial Conditions

I/O MSIO MSIOD DDRIO Unit

PCI 3.3 V 315 MHz

LVTTL 3.3 V 300 MHz

LVCMOS 3.3 V 300 MHz

LVCMOS 2.5 V 205 210 200 MHz

LVCMOS 1.8 V 147.5 200 200 MHz

LVCMOS 1.5 V 80 110 118 MHz

LVCMOS 1.2 V 60 80 100 MHz

LPDDR– LVCMOS 1.8 V mode 200 MHz

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Table 22 • Maximum Frequency Summary Table for Voltage-Referenced I/O in Worst-

Case Industrial Conditions

I/O MSIO MSIOD DDRIO Unit

LPDDR 200 MHz

HSTL1.5 V 200 MHz

SSTL 2.5 V 255 350 200 MHz

SSTL 1.8 V 334 MHz

SSTL 1.5 V 334 MHz

Table 23 • Maximum Frequency Summary Table for Differential I/O in Worst-Case

Industrial Conditions

I/O MSIO MSIOD Unit

LVPECL (input only) 450 MHz

LVDS 3.3 V 267.5 MHz

LVDS 2.5 V 267.5 350 MHz

RSDS 260 350 MHz

BLVDS 250 MHz

MLVDS 250 MHz

Mini-LVDS 260 350 MHz

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2.3.5.5 Detailed I/O Characteristics

The following table lists the minimum and maximum I/O weak pull-up/pull-down resistance values of

DDRIO I/O bank at VOH/VOL Level.

Table 24 • Input Capacitance, Leakage Current, and Ramp Time

Symbol Description Maximum Unit Conditions

CIN Input capacitance 10 pF

IIL (dc) Input current low

(Applicable to HSTL/SSTL inputs only)

400 µA VDDI = 2.5 V

500 µA VDDI = 1.8 V

600 µA VDDI = 1.5 V1

1. Applicable when I/O pair is programmed with an HSTL/SSTL I/O type on IOP and an un-

terminated I/O type (LVCMOS, for example) on ION pad.

Input current low

(Applicable to all other digital inputs)

10 µA

IIH (dc) Input current high

(Applicable to HSTL/SSTL inputs only)

400 µA VDDI = 2.5 V

500 µA VDDI = 1.8 V

600 µA VDDI = 1.5 V1

Input current high

(Applicable to all other digital inputs)

10 µA

TRAMPIN2

2. Voltage ramp must be monotonic.

Input ramp time

(Applicable to all digital inputs)

50 ns

Table 25 • I/O Weak Pull-up/Pull-down Resistances for DDRIO I/O Bank

VDDI Domain

R(WEAK PULL-UP) at VOH () R(WEAK PULL-DOWN) at VOL (

Min Max Min Max

2.5 V1, 2

1. R(WEAK PULL-DOWN) = (VOLspec)/I(WEAK PULL-DOWN MAX).

2. R(WEAK PULL-UP) = (VDDImax – VOHspec)/I(WEAK PULL-UP MIN).

10K 17.8K 9.98K 18K

1.8 V1, 2 10.3K 19.1K 10.3K 19.5K

1.5 V1, 2 10.6K 20.2K 10.6K 21.1K

1.2 V1, 2 11.1K 22.7K 11.2K 24.6K

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The following table lists the minimum and maximum I/O weak pull-up/pull-down resistance values of

MSIO I/O bank at VOH/VOL Level.

The following table lists the minimum and maximum I/O weak pull-up/pull-down resistance values of

MSIOD I/O bank at VOH/VOL Level.

The following table lists the hysteresis voltage value for schmitt trigger mode input buffers.

Table 26 • I/O Weak Pull-Up/Pull-Down Resistances for MSIO I/O Bank

VDDI Domain

R(WEAK PULL-UP) at VOH ( R(WEAK PULL-DOWN) at VOL (

Min Max Min Max

3.3 V 9.9K 17.1K 9.98K 17.5K

2.5 V1, 2

1. R(WEAK PULL-DOWN) = (VOLspec)/I(WEAK PULL-DOWN MAX).

2. R(WEAK PULL-UP) = (VDDImax – VOHspec)/I(WEAK PULL-UP MIN).

10K 17.6K 10.1K 18.4K

1.8 V1, 2 10.4K 19.1K 10.4K 20.4K

1.5 V1, 2 10.7K 20.4K 10.8K 22.2K

1.2 V1, 2 11.3K 23.2K 11.5K 26.7K

Table 27 • I/O Weak Pull-up/Pull-down Resistances for MSIOD I/O Bank

VDDI Domain

R(WEAK PULL-UP) at VOH () R(WEAK PULL-DOWN) at VOL ()

Min Max Min Max

2.5 V1, 2

1. R(WEAK PULL-DOWN) = (VOLspec)/I(WEAK PULL-DOWN MAX).

2. R(WEAK PULL-UP) = (VDDImax – VOHspec)/I(WEAK PULL-UP MIN).

9.6K 16.6K 9.5K 16.4K

1.8 V1, 2 9.7K 17.3K 9.7K 17.1K

1.5 V1, 2 9.9K 18K 9.8K 17.6K

1.2 V1, 2 10.3K 19.6K 10K 19.1K

Table 28 • Schmitt Trigger Input Hysteresis

Input Buffer Configuration Hysteresis Value (Typical, unless otherwise noted)

3.3 V LVTTL/LVCMOS/

PCI/PCI-X

0.05 × VDDI (worst-case)

2.5 V LVCMOS 0.05 × VDDI (worst-case)

1.8 V LVCMOS 0.1 × VDDI (worst-case)

1.5 V LVCMOS 60 mV

1.2 V LVCMOS 20 mV

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2.3.5.6 Single-Ended I/O Standards

2.3.5.6.1 Low Voltage Complementary Metal Oxide Semiconductor (LVCMOS)

LVCMOS is a widely used switching standard implemented in CMOS transistors. This standard is defined

by JEDEC (JESD 8-5). The LVCMOS standards supported in IGLOO2 FPGAs and SmartFusion2 SoC

FPGAs are: LVCMOS12, LVCMOS15, LVCMOS18, LVCMOS25, and LVCMOS33.

2.3.5.6.2 3.3 V LVCMOS/LVTTL

LVCMOS 3.3 V or Low-Voltage Transistor-Transistor Logic (LVTTL) is a general standard for 3.3 V

applications.

Minimum and Maximum DC/AC Input and Output Levels Specification

Table 29 • LVTTL/LVCMOS 3.3 V DC Recommended DC Operating Conditions

(Applicable to MSIO I/O Bank Only)

Parameter Symbol Min Typ Max Unit

Supply voltage VDDI 3.15 3.3 3.45 V

Table 30 • LVTTL/LVCMOS 3.3 V Input Voltage Specification (Applicable to MSIO I/O

Bank Only)

Parameter Symbol Min Max Unit

DC input logic high VIH (DC) 2.0 3.45 V

DC input logic low VIL (DC) –0.3 0.8 V

Input current high1

1. See Ta bl e 24 , page 23.

IIH (DC)

Input current low1IIL (DC)

Table 31 • LVCMOS 3.3 V DC Output Voltage Specification (Applicable to MSIO I/O Bank

Only)

Parameter Symbol Min Max Unit

DC output logic high1

1. The VOH/VOL test points selected ensure compliance with LVCMOS 3.3 V JESD8-B

requirements.

VOH VDDI – 0.4 V

DC output logic low1VOL 0.4 V

Table 32 • LVTTL 3.3 V DC Output Voltage Specification (Applicable to MSIO I/O Bank Only)

Parameter Symbol Min Max Unit

DC output logic high VOH 2.4 V

DC output logic low VOL 0.4 V

Table 33 • LVTTL/LVCMOS 3.3 V AC Maximum Switching Speed (Applicable to MSIO I/O Bank

Only)

Parameter Symbol Max Unit Conditions

Maximum data rate

(for MSIO I/O bank)

DMAX 600 Mbps AC loading: 17 pF load, maximum

drive/slew

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Note: For a detailed I/V curve, use the corresponding IBIS models:

www.microsemi.com/soc/download/ibis/default.aspx.

AC Switching Characteristics

Worst commercial-case conditions: TJ = 85 °C, VDD = 1.14 V, VDDI = 3.0 V

Table 34 • LVTTL/LVCMOS 3.3 V AC Test Parameter Specifications (Applicable to MSIO I/O

Bank Only)

Parameter Symbol Typ Unit

Measuring/trip point for data path VTRIP 1.4 V

Resistance for enable path (TZH, TZL, THZ, TLZ)R

ENT 2K 

Capacitive loading for enable path (TZH, TZL, THZ, TLZ) CENT 5pF

Capacitive loading for data path (TDP)C

LOAD 5pF

Table 35 • LVTTL/LVCMOS 3.3 V Transmitter Drive Strength Specifications for MSIO I/O Bank

Output Drive Selection

VOH

(V)

VOL

(V)

IOH (at VOH)

IOL (at VOL)

2 mA VDDI – 0.4 0.4 2 2

4 mA VDDI – 0.4 0.4 4 4

8 mA VDDI – 0.4 0.4 8 8

12 mA VDDI – 0.4 0.4 12 12

16 mA VDDI – 0.4 0.4 16 16

20 mA VDDI – 0.4 0.4 20 20

Table 36 • LVTTL/LVCMOS 3.3 V Receiver Characteristics for MSIO I/O Bank (Input

Buffers)

On-Die Termination

(ODT)

TPY TPYS

Unit–1 –Std –1 –Std

None 2.262 2.663 2.289 2.695 ns

Table 37 • LVTTL/LVCMOS 3.3 V Transmitter Characteristics for MSIO I/O Bank (Output and Tristate Buffers)

Output

Drive

Selection

Slew

Control

TDP TZL TZH THZ1

1. Delay increases with drive strength are inherent to built-in slew control circuitry for simultaneous switching output (SSO)

management.

TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

2 mA Slow 3.192 3.755 3.47 4.083 2.969 3.494 1.856 2.183 3.337 3.926 ns

4 mA Slow 2.331 2.742 2.673 3.145 2.526 2.973 3.034 3.569 4.451 5.236 ns

8 mA Slow 2.135 2.511 2.33 2.741 2.297 2.703 4.532 5.331 4.825 5.676 ns

12 mA Slow 2.052 2.414 2.107 2.479 2.162 2.544 5.75 6.764 5.445 6.406 ns

16 mA Slow 2.062 2.425 2.072 2.438 2.145 2.525 5.993 7.05 5.625 6.618 ns

20 mA Slow 2.148 2.527 1.999 2.353 2.088 2.458 6.262 7.367 5.876 6.913 ns

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2.3.5.7 2.5 V LVCMOS

LVCMOS 2.5 V is a general standard for 2.5 V applications and is supported in IGLOO2 FPGA and

SmartFusion2 SoC FPGAs that are in compliance with the JEDEC specification JESD8-5A.

Minimum and Maximum DC/AC Input and Output Levels Specification

Table 38 • LVCMOS 2.5 V DC Recommended DC Operating Conditions

Parameter Symbol Min Typ Max Unit

Supply voltage VDDI 2.375 2.5 2.625 V

Table 39 • LVCMOS 2.5 V DC Input Voltage Specification

Parameter Symbol Min Max Unit

DC input logic high (for MSIOD

and DDRIO I/O banks)

VIH (DC) 1.7 2.625 V

DC input logic high (for MSIO I/O

bank)

VIH (DC) 1.7 3.45 V

DC input logic low VIL (DC) –0.3 0.7 V

Input current high1

1. See Tab le 24 , page 23.

IIH (DC)

Input current low1IIL (DC)

Table 40 • LVCMOS 2.5 V DC Output Voltage Specification

Parameter Symbol Min Max Unit

DC output logic high VOH1

1. The VOH/VOL test points selected ensure compliance with LVCMOS 2.5 V JEDEC8-5A requirements.

VDDI – 0.4 – V

DC output logic low VOL10.4 V

Table 41 • LVCMOS 2.5 V AC Minimum and Maximum Switching Speed

Parameter Symbol Max Unit Conditions

Maximum data rate (for DDRIO I/O bank) DMAX 400 Mbps AC loading: 17 pF load,

maximum drive/slew

Maximum data rate (for MSIO I/O bank) DMAX 410 Mbps AC loading: 17 pF load,

maximum drive/slew

Maximum data rate (for MSIOD I/O bank) DMAX 420 Mbps AC loading: 17 pF load,

maximum drive/slew

Table 42 • LVCMOS 2.5 V AC Calibrated Impedance Option

Parameter Symbol Typ Unit

Supported output driver calibrated impedance (for

DDRIO I/O bank)

Rodt_cal 75, 60, 50, 33,

25, 20



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Note: For board design considerations, output slew rates extraction, detailed output buffer resistances, and I/V

Curve, use the corresponding IBIS models located at:

www.microsemi.com/soc/download/ibis/default.aspx.

AC Switching Characteristics

Worst commercial-case conditions: TJ = 85 °C, VDD = 1.14 V, VDDI = 2.375 V

Table 43 • LVCMOS 2.5 V AC Test Parameter Specifications

Parameter Symbol Typ Unit

Measuring/trip point for data path VTRIP 1.2 V

Resistance for enable path (TZH, TZL, THZ, TLZ)R

ENT 2K 

Capacitive loading for enable path (TZH, TZL, THZ, TLZ) CENT 5pF

Capacitive loading for data path (TDP)C

LOAD 5pF

Table 44 • LVCMOS 2.5 V Transmitter Drive Strength Specifications

Output Drive Selection VOH (V) VOL (V) IOH (at VOH) mA IOL (at VOL) mA

MSIO I/O

Bank

MSIOD I/O

Bank

DDRIO I/O Bank

(With Software Default

Fixed Code) Min Max

2 mA 2 mA 2 mA VDDI – 0.4 0.4 2 2

4 mA 4 mA 4 mA VDDI – 0.4 0.4 4 4

6 mA 6 mA 6 mA VDDI – 0.4 0.4 6 6

8 mA 8 mA 8 mA VDDI – 0.4 0.4 8 8

12 mA 12 mA 12 mA VDDI – 0.4 0.4 12 12

16 mA 16 mA VDDI – 0.4 0.4 16 16

Table 45 • LVCMOS 2.5 V Receiver Characteristics (Input Buffers)

On-Die Termination

(ODT)

TPY TPYS

Unit–1 –Std –1 –Std

LVCMOS 2.5 V (for DDRIO I/O bank) None 1.823 2.145 1.932 2.274 ns

LVCMOS 2.5 V (for MSIO I/O bank) None 2.486 2.925 2.495 2.935 ns

LVCMOS 2.5 V (for MSIOD I/O bank) None 2.29 2.694 2.305 2.712 ns

Table 46 • LVCMOS 2.5 V Transmitter Characteristics for DDRIO Bank (Output and Tristate Buffers)

Output

Drive

Selection

Slew

Control

TDP TZL TZH THZ1TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

2 mA Slow 3.657 4.302 3.393 3.991 3.675 4.323 3.894 4.582 3.552 4.18 ns

Medium 3.374 3.97 3.139 3.693 3.396 3.995 3.635 4.277 3.253 3.828 ns

Medium fast 3.239 3.811 3.036 3.572 3.261 3.836 3.519 4.141 3.128 3.681 ns

Fast 3.224 3.793 3.029 3.563 3.246 3.818 3.512 4.132 3.119 3.67 ns

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4 mA Slow 3.095 3.641 2.705 3.182 3.088 3.633 4.738 5.575 4.348 5.116 ns

Medium 2.825 3.324 2.488 2.927 2.823 3.321 4.492 5.285 4.063 4.781 ns

Medium fast 2.701 3.178 2.384 2.804 2.698 3.173 4.364 5.135 3.945 4.642 ns

Fast 2.69 3.165 2.377 2.796 2.687 3.161 4.359 5.129 3.94 4.636 ns

6 mA Slow 2.919 3.434 2.491 2.93 2.902 3.414 5.085 5.983 4.674 5.5 ns

Medium 2.65 3.118 2.279 2.681 2.642 3.108 4.845 5.701 4.375 5.148 ns

Medium fast 2.529 2.975 2.176 2.56 2.521 2.965 4.724 5.558 4.259 5.011 ns

Fast 2.516 2.96 2.168 2.551 2.508 2.95 4.717 5.55 4.251 5.002 ns

8 mA Slow 2.863 3.368 2.427 2.855 2.844 3.346 5.196 6.114 4.769 5.612 ns

Medium 2.599 3.058 2.217 2.608 2.59 3.047 4.952 5.827 4.471 5.261 ns

Medium fast 2.483 2.921 2.114 2.487 2.473 2.91 4.832 5.685 4.364 5.134 ns

Fast 2.467 2.902 2.106 2.478 2.457 2.89 4.826 5.678 4.348 5.116 ns

12 mA Slow 2.747 3.232 2.296 2.701 2.724 3.204 5.39 6.342 4.938 5.81 ns

Medium 2.493 2.934 2.102 2.473 2.483 2.921 5.166 6.078 4.65 5.471 ns

Medium fast 2.382 2.803 2.006 2.36 2.371 2.789 5.067 5.962 4.546 5.349 ns

Fast 2.369 2.787 1.999 2.352 2.357 2.773 5.063 5.958 4.538 5.339 ns

16 mA Slow 2.677 3.149 2.213 2.604 2.649 3.116 5.575 6.56 5.08 5.977 ns

Medium 2.432 2.862 2.028 2.386 2.421 2.848 5.372 6.32 4.801 5.649 ns

Medium fast 2.324 2.734 1.937 2.278 2.311 2.718 5.297 6.233 4.7 5.531 ns

Fast 2.313 2.721 1.929 2.269 2.3 2.706 5.296 6.231 4.699 5.529 ns

1. Delay increases with drive strength are inherent to built-in slew control circuitry for simultaneous switching output (SSO)

management.

Table 47 • LVCMOS 2.5 V Transmitter Characteristics for MSIO Bank (Output and Tristate Buffers)

Output

Drive

Selection

Slew

Control

TDP TZL TZH THZ1TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

2 mA Slow 3.48 4.095 3.855 4.534 3.785 4.453 2.12 2.494 3.45 4.059 ns

4 mA Slow 2.583 3.039 3.042 3.579 3.138 3.691 4.143 4.874 4.687 5.513 ns

6 mA Slow 2.392 2.815 2.669 3.139 2.82 3.317 4.909 5.775 5.083 5.98 ns

8 mA Slow 2.309 2.717 2.565 3.017 2.74 3.223 5.812 6.837 5.523 6.497 ns

12 mA Slow 2.333 2.745 2.437 2.867 2.626 3.089 6.131 7.213 5.712 6.72 ns

16 mA Slow 2.412 2.838 2.335 2.747 2.533 2.979 6.54 7.694 6.007 7.067 ns

1. Delay increases with drive strength are inherent to built-in slew control circuitry for simultaneous switching output (SSO)

management.

Table 46 • LVCMOS 2.5 V Transmitter Characteristics for DDRIO Bank (Output and Tristate Buffers)

Output

Drive

Selection

Slew

Control

TDP TZL TZH THZ1TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

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Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 30

2.3.5.8 1.8 V LVCMOS

LVCMOS 1.8 is a general standard for 1.8 V applications and is supported in IGLOO2 FPGAs and

SmartFusion2 SoC FPGAs in compliance to the JEDEC specification JESD8-7A.

Minimum and Maximum DC/AC Input and Output Levels Specification

Table 48 • LVCMOS 2.5 V Transmitter Characteristics for MSIOD Bank (Output and Tristate Buffers)

Output

Drive

Selection

Slew

Control

TDP TZL TZH THZ1

1. Delay increases with drive strength are inherent to built-in slew control circuitry for simultaneous switching output (SSO)

management.

TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

2 mA Slow 2.206 2.596 2.678 3.15 2.64 3.106 4.935 5.805 4.74 5.576 ns

4 mA Slow 1.835 2.159 2.242 2.637 2.256 2.654 5.413 6.368 5.15 6.059 ns

6 mA Slow 1.709 2.01 2.132 2.508 2.167 2.549 5.813 6.838 5.499 6.469 ns

8 mA Slow 1.63 1.918 1.958 2.303 2.012 2.367 6.226 7.324 5.816 6.842 ns

12 mA Slow 1.648 1.939 1.86 2.187 1.921 2.259 6.519 7.669 6.027 7.09 ns

Table 49 • LVCMOS 1.8 V DC Recommended Operating Conditions

Parameter Symbol Min Typ Max Unit

LVCMOS 1.8 V DC Recommended Operating Conditions

Supply voltage VDDI 1.710 1.8 1.89 V

Table 50 • LVCMOS 1.8 V DC Input Voltage Specification

Parameter Symbol Min Max Unit

DC input logic high (for MSIOD

and DDRIO I/O banks)

VIH (DC) 0.65 × VDDI 1.89 V

DC input logic high (for MSIO

I/O bank)

VIH (DC) 0.65 × VDDI 3.45 V

DC input logic low VIL (DC) –0.3 0.35 × VDDI V

Input current high1

1. See Tab le 2 4, page 23.

IIH (DC) –

Input current low1IIL (DC) –

Table 51 • LVCMOS 1.8 V DC Output Voltage Specification

Parameter Symbol Min Max Unit

DC output logic high VOH VDDI – 0.45 V

DC output logic low VOL 0.45 V

Table 52 • LVCMOS 1.8 V Minimum and Maximum AC Switching Speed

Parameter Symbol Max Unit Conditions

Maximum data rate (for DDRIO I/O bank)1

1. Maximum Data Rate applies for Drive Strength 8 mA and above, All Slews.

DMAX 400 Mbps AC loading: 17 pF load, maximum drive/slew

Maximum data rate (for MSIO I/O bank) DMAX 295 Mbps AC loading: 17 pF load, maximum drive/slew

Maximum data rate (for MSIOD I/O bank)1DMAX 400 Mbps AC loading: 17 pF load, maximum drive/slew

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Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 31

AC Switching Characteristics

Worst commercial-case conditions: TJ = 85 °C, VDD = 1.14 V, VDDI = 1.71 V

Table 53 • LVCMOS 1.8 V AC Calibrated Impedance Option

Parameter Symbol Typ Unit

Supported output driver calibrated

impedance (for DDRIO I/O bank)

Rodt_cal 75, 60, 50,

33, 25, 20



Table 54 • LVCMOS 1.8 V AC Test Parameter Specifications

Parameter Symbol Typ Unit

Measuring/trip point for data path VTRIP 0.9 V

Resistance for enable path (TZH, TZL, THZ, TLZ)R

ENT 2k 

Capacitive loading for enable path (TZH, TZL, THZ,

TLZ)

CENT 5pF

Capacitive loading for data path (TDP)C

LOAD 5pF

Table 55 • LVCMOS 1.8 V Transmitter Drive Strength Specifications

Output Drive Selection VOH (V) VOL (V) IOH (at VOH)

IOL (at VOL)

mAMSIO I/O Bank MSIOD I/O Bank DDRIO I/O Bank Min Max

2 mA 2 mA 2 mA VDDI – 0.45 0.45 2 2

4 mA 4 mA 4 mA VDDI – 0.45 0.45 4 4

6 mA 6 mA 6 mA VDDI – 0.45 0.45 6 6

8 mA 8 mA 8 mA VDDI – 0.45 0.45 8 8

10 mA 10 mA 10 mA VDDI – 0.45 0.45 10 10

12 mA 12 mA VDDI – 0.45 0.45 12 12

16 mA1

1. 16 mA drive strengths, all slews, meets LPDDR JEDEC electrical compliance.

VDDI – 0.45 0.45 16 16

Table 56 • LVCMOS 1.8 V Receiver Characteristics (Input Buffers)

On-Die Termination

(ODT)

TPY TPYS

Unit–1 –Std –1 –Std

LVCMOS 1.8 V

(for DDRIO I/O bank

with Fixed Codes)

None 1.968 2.315 2.099 2.47 ns

LVCMOS 1.8 V

(for MSIO I/O bank)

None 2.898 3.411 2.883 3.393 ns

50 3.05 3.59 3.044 3.583 ns

75 2.999 3.53 2.987 3.516 ns

150 2.947 3.469 2.933 3.452 ns

LVCMOS 1.8 V

(for MSIOD I/O bank)

None 2.611 3.071 2.598 3.057 ns

50 2.775 3.264 2.775 3.265 ns

75 2.72 3.2 2.712 3.19 ns

150 2.666 3.137 2.655 3.123 ns

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Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 32

Table 57 • LVCMOS 1.8 V Transmitter Characteristics for DDRIO I/O Bank with Fixed Code (Output and

Tristate Buffers)

Output

Drive

Selection

Slew

Control

TDP TZL TZH THZ1TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

2 mA Slow 4.234 4.981 3.646 4.29 4.245 4.995 4.908 5.774 4.434 5.216 ns

Medium 3.824 4.498 3.282 3.861 3.834 4.511 4.625 5.441 4.116 4.843 ns

Medium fast 3.627 4.267 3.111 3.66 3.637 4.279 4.481 5.272 3.984 4.687 ns

Fast 3.605 4.241 3.097 3.644 3.615 4.253 4.472 5.262 3.973 4.674 ns

4 mA Slow 3.923 4.615 3.314 3.9 3.918 4.61 5.403 6.356 4.894 5.757 ns

Medium 3.518 4.138 2.961 3.484 3.515 4.135 5.121 6.025 4.561 5.366 ns

Medium fast 3.321 3.907 2.783 3.275 3.317 3.903 4.966 5.843 4.426 5.206 ns

Fast 3.301 3.883 2.77 3.259 3.296 3.878 4.957 5.831 4.417 5.196 ns

6 mA Slow 3.71 4.364 3.104 3.652 3.702 4.355 5.62 6.612 5.08 5.977 ns

Medium 3.333 3.921 2.779 3.27 3.325 3.913 5.346 6.289 4.777 5.62 ns

Medium fast 3.155 3.712 2.62 3.083 3.146 3.702 5.21 6.13 4.657 5.479 ns

Fast 3.134 3.688 2.608 3.068 3.125 3.677 5.202 6.12 4.648 5.468 ns

8 mA Slow 3.619 4.258 3.007 3.538 3.607 4.244 5.815 6.841 5.249 6.175 ns

Medium 3.246 3.819 2.686 3.16 3.236 3.807 5.542 6.52 4.936 5.807 ns

Medium fast 3.066 3.607 2.525 2.971 3.054 3.593 5.405 6.359 4.811 5.66 ns

Fast 3.046 3.584 2.513 2.957 3.034 3.57 5.401 6.353 4.803 5.651 ns

10 mA Slow 3.498 4.115 2.878 3.386 3.481 4.096 6.046 7.113 5.444 6.404 ns

Medium 3.138 3.692 2.569 3.023 3.126 3.678 5.782 6.803 5.129 6.034 ns

Medium fast 2.966 3.489 2.414 2.841 2.951 3.472 5.666 6.665 5.013 5.897 ns

Fast 2.945 3.464 2.401 2.826 2.93 3.448 5.659 6.658 5.003 5.886 ns

12 mA Slow 3.417 4.02 2.807 3.303 3.401 4.002 6.083 7.156 5.464 6.428 ns

Medium 3.076 3.618 2.519 2.964 3.063 3.604 5.828 6.856 5.176 6.089 ns

Medium fast 2.913 3.427 2.376 2.795 2.898 3.41 5.725 6.736 5.072 5.966 ns

Fast 2.894 3.405 2.362 2.78 2.879 3.388 5.715 6.724 5.064 5.957 ns

16 mA Slow 3.366 3.96 2.751 3.237 3.348 3.939 6.226 7.324 5.576 6.56 ns

Medium 3.03 3.565 2.47 2.906 3.017 3.55 5.981 7.036 5.282 6.214 ns

Medium fast 2.87 3.377 2.328 2.739 2.854 3.358 5.895 6.935 5.18 6.094 ns

Fast 2.853 3.357 2.314 2.723 2.837 3.338 5.889 6.929 5.177 6.09 ns

1. Delay increases with drive strength are inherent to built-in slew control circuitry for simultaneous switching output (SSO)

management.

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IGLOO2 FPGA and SmartFusion2 SoC FPGA

Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 33

2.3.5.9 1.5 V LVCMOS

LVCMOS 1.5 is a general standard for 1.5 V applications and is supported in IGLOO2 FPGAs and

SmartFusion2 SoC FPGAs in compliance to the JEDEC specification JESD8-11A.

Minimum and Maximum DC/AC Input and Output Levels Specification

Table 58 • LVCMOS 1.8 V Transmitter Characteristics for MSIO I/O Bank

Output Drive

Selection

Slew

Control

TDP TZL TZH THZ1

1. Delay increases with drive strength are inherent to built-in slew control circuitry for simultaneous switching output (SSO)

management.

TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

2 mA Slow 3.441 4.047 4.165 4.9 4.413 5.192 4.891 5.755 5.138 6.044 ns

4 mA Slow 3.218 3.786 3.642 4.284 3.941 4.636 5.665 6.665 5.568 6.551 ns

6 mA Slow 3.141 3.694 3.501 4.118 3.823 4.498 6.587 7.75 6.032 7.096 ns

8 mA Slow 3.165 3.723 3.319 3.904 3.654 4.298 6.898 8.115 6.216 7.313 ns

10 mA Slow 3.202 3.767 3.278 3.857 3.616 4.254 7.25 8.529 6.435 7.571 ns

12 mA Slow 3.277 3.855 3.175 3.736 3.519 4.139 7.392 8.697 6.538 7.692 ns

Table 59 • LVCMOS 1.8 V Transmitter Characteristics for MSIOD I/O Bank

Output Drive

Selection

Slew

Control

TDP TZL TZH THZ1

1. Delay increases with drive strength are inherent to built-in slew control circuitry for simultaneous switching output (SSO)

management.

TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

2 mA Slow 2.725 3.206 3.316 3.901 3.484 4.099 5.204 6.123 4.997 5.88 ns

4 mA Slow 2.242 2.638 2.777 3.267 2.947 3.466 5.729 6.74 5.448 6.41 ns

6 mA Slow 1.995 2.347 2.466 2.901 2.63 3.094 6.372 7.496 5.987 7.043 ns

8 mA Slow 2.001 2.354 2.44 2.87 2.6 3.058 6.633 7.804 6.193 7.286 ns

10 mA Slow 2.025 2.382 2.312 2.719 2.47 2.906 6.94 8.165 6.412 7.544 ns

Table 60 • LVCMOS 1.5 V DC Recommended Operating Conditions

Parameter Symbol Min Typ Max Unit

Supply voltage VDDI 1.425 1.5 1.575 V

Table 61 • LVCMOS 1.5 V DC Input Voltage Specification

Parameter Symbol Min Max Unit

DC input logic high for (MSIOD and DDRIO

I/O banks)

VIH (DC) 0.65 × VDDI 1.575 V

DC input logic high (for MSIO I/O bank) VIH (DC) 0.65 × VDDI 3.45 V

DC input logic low VIL (DC) –0.3 0.35 × VDDI V

Input current high1

1. See Table 24, page 23.

IIH (DC) –

Input current low1IIL (DC –

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IGLOO2 FPGA and SmartFusion2 SoC FPGA

Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 34

Note: For a detailed I/V curve, use the corresponding IBIS models:

www.microsemi.com/soc/download/ibis/default.aspx.

Table 62 • LVCMOS 1.5 V DC Output Voltage Specification

Parameter Symbol Min Max Unit

DC output logic high VOH VDDI × 0.75 V

DC output logic low VOL VDDI × 0.25 V

Table 63 • LVCMOS 1.5 V AC Minimum and Maximum Switching Speed

Parameter Symbol Max Unit Conditions

Maximum data rate (for DDRIO I/O bank) DMAX 235 Mbps AC loading: 17 pF load, maximum

drive/slew

Maximum data rate (for MSIO I/O bank) DMAX 160 Mbps AC loading: 17 pF load, maximum

drive/slew

Maximum data rate (for MSIOD I/O bank) DMAX 220 Mbps AC loading: 17 pF load, maximum

drive/slew

Table 64 • LVCMOS 1.5 V AC Calibrated Impedance Option

Parameter Symbol Typ Unit

Supported output driver calibrated

impedance (for DDRIO I/O bank)

RODT_CA

75, 60,

50, 40



Table 65 • LVCMOS 1.5 V AC Test Parameter Specifications

Parameter Symbol Typ Unit

Measuring/trip point VTRIP 0.75 V

Resistance for enable path (TZH, TZL, THZ, TLZ)R

ENT 2K 

Capacitive loading for enable path (TZH, TZL, THZ, TLZ) CENT 5pF

Capacitive loading for data path (TDP)C

LOAD 5pF

Table 66 • LVCMOS 1.5 V Transmitter Drive Strength Specifications

Output Drive Selection VOH (V) VOL (V) IOH (at VOH)

IOL (at VOL)

mAMSIO I/O Bank MSIOD I/O Bank DDRIO I/O Bank Min Max

2 mA 2 mA 2 mA VDDI × 0.75 VDDI × 0.25 2 2

4 mA 4 mA 4 mA VDDI × 0.75 VDDI × 0.25 4 4

6 mA 6 mA 6 mA VDDI × 0.75 VDDI × 0.25 6 6

8 mA 8 mA VDDI × 0.75 VDDI × 0.25 8 8

10 mA VDDI × 0.75 VDDI × 0.25 10 10

12 mA VDDI × 0.75 VDDI × 0.25 12 12

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IGLOO2 FPGA and SmartFusion2 SoC FPGA

Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 35

AC Switching Characteristics

Worst commercial-case conditions: TJ = 85 °C, VDD = 1.14 V, VDDI = 1.425 V

Table 67 • LVCMOS 1.5 V Receiver Characteristics for DDRIO I/O Bank with Fixed

Codes (Input Buffers)

On-Die Termination

(ODT)

TPY TPYS

Unit–1 –Std –1 –Std

None 2.051 2.413 2.086 2.455 ns

Table 68 • LVCMOS 1.5 V Receiver Characteristics for MSIO I/O Bank (Input

Buffers)

On-Die Termination

(ODT)

TPY TPYS

Unit–1 –Std –1 –Std

None 3.311 3.896 3.285 3.865 ns

50 3.654 4.299 3.623 4.263 ns

75 3.533 4.156 3.501 4.119 ns

150 3.415 4.018 3.388 3.986 ns

Table 69 • LVCMOS 1.5 V Receiver Characteristics for MSIOD I/O Bank (Input

Buffers)

On-Die Termination

(ODT)

TPY TPYS

Unit–1 –Std –1 –Std

None 2.959 3.481 2.93 3.447 ns

50 3.298 3.88 3.268 3.845 ns

75 3.162 3.719 3.128 3.68 ns

150 3.053 3.592 3.021 3.554 ns

Table 70 • LVCMOS 1.5 V Transmitter Characteristics for DDRIO I/O Bank (Output and Tristate Buffers)

Output

Drive

Selection

Slew

Control

TDP TZL TZH THZ1TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

2 mA Slow 5.122 6.026 4.31 5.07 5.145 6.052 5.258 6.186 4.672 5.496 ns

Medium 4.58 5.389 3.86 4.54 4.6 5.411 4.977 5.855 4.357 5.126 ns

Medium

fast

4.323 5.086 3.629 4.269 4.341 5.107 4.804 5.652 4.228 4.974 ns

Fast 4.296 5.054 3.609 4.245 4.314 5.075 4.791 5.636 4.219 4.963 ns

4 mA Slow 4.449 5.235 3.707 4.361 4.443 5.227 6.058 7.127 5.458 6.421 ns

Medium 3.961 4.66 3.264 3.839 3.954 4.651 5.778 6.797 5.116 6.018 ns

Medium

fast

3.729 4.387 3.043 3.579 3.72 4.376 5.63 6.624 4.981 5.86 ns

Fast 3.704 4.358 3.027 3.56 3.695 4.347 5.624 6.617 4.973 5.851 ns

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Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 36

6 mA Slow 4.244 4.993 3.465 4.076 4.233 4.979 6.39 7.518 5.736 6.748 ns

Medium 3.774 4.44 3.05 3.587 3.762 4.426 6.114 7.193 5.397 6.35 ns

Medium

fast

3.544 4.17 2.839 3.339 3.529 4.152 5.978 7.033 5.27 6.2 ns

Fast 3.519 4.14 2.82 3.317 3.504 4.122 5.965 7.017 5.259 6.187 ns

8 mA Slow 4.099 4.823 3.311 3.894 4.087 4.807 6.584 7.746 5.854 6.888 ns

Medium 3.656 4.301 2.927 3.443 3.642 4.284 6.311 7.425 5.553 6.533 ns

Medium

fast

3.437 4.044 2.731 3.213 3.42 4.023 6.182 7.273 5.435 6.394 ns

Fast 3.41 4.012 2.715 3.193 3.393 3.991 6.178 7.269 5.425 6.383 ns

10 mA Slow 4.029 4.74 3.238 3.809 4.015 4.723 6.732 7.921 5.965 7.018 ns

Medium 3.601 4.237 2.867 3.372 3.586 4.218 6.473 7.615 5.669 6.669 ns

Medium

fast

3.384 3.981 2.672 3.143 3.365 3.958 6.351 7.471 5.55 6.529 ns

Fast 3.357 3.949 2.655 3.123 3.338 3.927 6.345 7.464 5.54 6.518 ns

12 mA Slow 3.974 4.675 3.196 3.759 3.958 4.656 6.842 8.049 6.068 7.139 ns

Medium 3.55 4.176 2.827 3.326 3.534 4.157 6.584 7.746 5.751 6.766 ns

Medium

fast

3.345 3.935 2.638 3.103 3.325 3.911 6.488 7.633 5.641 6.637 ns

Fast 3.316 3.902 2.621 3.083 3.297 3.878 6.486 7.63 5.626 6.619 ns

1. Delay increases with drive strength are inherent to built-in slew control circuitry for simultaneous switching output (SSO)

management.

Table 71 • LVCMOS 1.5 V Transmitter Characteristics for MSIO I/O Bank (Output and Tristate Buffers)

Output

Drive

Selection

Slew

Control

TDP TZL TZH THZ1TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

2 mA Slow 4.423 5.203 5.397 6.35 5.686 6.69 5.609 6.599 5.561 6.542 ns

4 mA Slow 4.05 4.765 4.503 5.298 4.92 5.788 7.358 8.657 6.525 7.677 ns

6 mA Slow 4.081 4.801 4.259 5.012 4.699 5.528 7.659 9.011 6.709 7.893 ns

8 mA Slow 4.234 4.98 4.068 4.786 4.521 5.319 8.218 9.668 7.05 8.294 ns

1. Delay increases with drive strength are inherent to built-in slew control circuitry for simultaneous switching output (SSO)

management.

Table 70 • LVCMOS 1.5 V Transmitter Characteristics for DDRIO I/O Bank (Output and Tristate Buffers)

Output

Drive

Selection

Slew

Control

TDP TZL TZH THZ1TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

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IGLOO2 FPGA and SmartFusion2 SoC FPGA

Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 37

2.3.5.10 1.2 V LVCMOS

LVCMOS 1.2 is a general standard for 1.2 V applications and is supported in IGLOO2 FPGAs and

SmartFusion2 SoC FPGAs in compliance to the JEDEC specification JESD8-12A.

Minimum and Maximum DC/AC Input and Output Levels Specification

Table 72 • LVCMOS 1.5 V Transmitter Characteristics for MSIOD I/O Bank (Output and Tristate Buffers)

Output

Drive

Selection

Slew

Control

TDP TZL TZH THZ1

1. Delay increases with drive strength are inherent to built-in slew control circuitry for simultaneous switching output (SSO)

management.

TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

2 mA Slow 2.735 3.218 3.371 3.966 3.618 4.257 6.03 7.095 5.705 6.712 ns

4 mA Slow 2.426 2.854 2.992 3.521 3.221 3.79 6.738 7.927 6.298 7.41 ns

6 mA Slow 2.433 2.862 2.81 3.306 3.031 3.566 7.123 8.38 6.596 7.76 ns

Table 73 • LVCMOS 1.2 V DC Recommended DC Operating Conditions

Parameter Symbol Min Typ Max Unit

Supply voltage VDDI 1.140 1.2 1.26 V

Table 74 • LVCMOS 1.2 V DC Input Voltage Specification

Parameter Symbol Min Max Unit

DC input logic high (for

MSIOD and DDRIO I/O

banks)

VIH (DC) 0.65 × VDDI 1.26 V

DC input logic high (for

MSIO I/O bank)

VIH (DC) 0.65 × VDDI 3.45 V

DC input logic low VIL (DC) –0.3 0.35 × VDDI V

Input current high1

1. See Table 24, page 23.

IIH (DC)

Input current low1IIL (DC)

Table 75 • LVCMOS 1.2 V DC Output Voltage Specification

Parameter Symbol Min Max Unit

DC output logic high VOH VDDI × 0.75 V

DC output logic low VOL VDDI × 0.25 V

Table 76 • LVCMOS 1.2 V Minimum and Maximum AC Switching Speed

Parameter Symbol Max Unit Conditions

Maximum data rate (for DDRIO I/O bank) DMAX 200 Mbps AC loading: 17 pF load, maximum drive/slew

Maximum data rate (for MSIO I/O bank) DMAX 120 Mbps AC loading: 17 pF load, maximum drive/slew

Maximum data rate (for MSIOD I/O bank) DMAX 160 Mbps AC loading: 17 pF load, maximum drive/slew

G Microsemi :M @Mucnucmn CL *vpam/

IGLOO2 FPGA and SmartFusion2 SoC FPGA

Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 38

Note: For a detailed I/V curve, use the corresponding IBIS models:

www.microsemi.com/soc/download/ibis/default.aspx.

AC Switching Characteristics

Worst commercial-case conditions: TJ = 85 °C, VDD = 1.14 V, VDDI = 1.14 V

Table 77 • LVCMOS 1.2 V AC Calibrated Impedance Option

Parameter Symbol Typ Unit

Supported output driver calibrated

impedance (for DDRIO I/O bank)

RODT_CAL 75, 60, 50, 40 

Table 78 • LVCMOS 1.2 V AC Test Parameter Specifications

Parameter Symbol Typ Unit

Measuring/trip point VTRIP 0.6 V

Resistance for enable path (TZH, TZL, THZ, TLZ)R

ENT 2K 

Capacitive loading for enable path (TZH, TZL, THZ, TLZ) CENT 5pF

Capacitive loading for data path (TDP)C

LOAD 5pF

Table 79 • LVCMOS 1.2 V Transmitter Drive Strength Specifications

Output Drive Selection VOH (V) VOL (V) IOH (at VOH)

IOL (at VOL)

mAMSIO I/O Bank MSIOD I/O Bank DDRIO I/O Bank Min Max

2 mA 2 mA 2 mA VDDI × 0.75 VDDI × 0.25 2 2

4 mA 4 mA 4 mA VDDI × 0.75 VDDI × 0.25 4 4

6 mA VDDI × 0.75 VDDI × 0.25 6 6

Table 80 • LVCMOS 1.2 V Receiver Characteristics for DDRIO I/O Bank with Fixed Code (Input

Buffers)

On-Die Termination (ODT)

TPY TPYS

Unit–1 –Std –1 –Std

None 2.448 2.88 2.466 2.901 ns

Table 81 • LVCMOS 1.2 V Receiver Characteristics for MSIO I/O Bank (Input Buffers)

On-Die Termination ODT)

TPY TPYS

Unit–1 –Std –1 –Std

None 4.714 5.545 4.675 5.5 ns

50 6.668 7.845 6.579 7.74 ns

75 5.832 6.862 5.76 6.777 ns

150 5.162 6.073 5.111 6.014 ns

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Table 82 • LVCMOS 1.2 V Receiver Characteristics for MSIOD I/O Bank (Input Buffers)

On-Die Termination (ODT)

TPY TPYS

Unit–1 –Std –1 –Std

None 4.154 4.887 4.114 4.84 ns

50 6.918 8.139 6.806 8.008 ns

75 5.613 6.603 5.533 6.509 ns

150 4.716 5.549 4.657 5.479 ns

Table 83 • LVCMOS 1.2 V Transmitter Characteristics for DDRIO I/O Bank (Output and Tristate Buffers)

Output

Drive

Selection

Slew

Control

TDP TZL TZH THZ1TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

2 mA Slow 6.713 7.897 5.362 6.308 6.723 7.909 7.233 8.51 6.375 7.499 ns

Medium 5.912 6.955 4.616 5.43 5.915 6.959 6.887 8.102 6.009 7.069 ns

Medium

fast

5.5 6.469 4.231 4.978 5.5 6.471 6.672 7.849 5.835 6.865 ns

Fast 5.462 6.426 4.194 4.935 5.463 6.427 6.646 7.819 5.828 6.857 ns

4 mA Slow 6.109 7.186 4.708 5.539 6.098 7.174 8.005 9.418 7.033 8.274 ns

Medium 5.355 6.299 4.034 4.746 5.338 6.28 7.637 8.985 6.672 7.849 ns

Medium

fast

4.953 5.826 3.685 4.336 4.932 5.802 7.44 8.752 6.499 7.646 ns

Fast 4.911 5.777 3.658 4.303 4.89 5.754 7.427 8.737 6.488 7.632 ns

6 mA Slow 5.89 6.929 4.506 5.301 5.874 6.911 8.337 9.808 7.315 8.605 ns

Medium 5.176 6.089 3.862 4.543 5.155 6.065 7.986 9.394 6.943 8.168 ns

Medium

fast

4.792 5.637 3.523 4.145 4.765 5.606 7.808 9.186 6.775 7.97 ns

Fast 4.754 5.593 3.486 4.101 4.728 5.563 7.777 9.149 6.769 7.963 ns

1. Delay increases with drive strength are inherent to built-in slew control circuitry for simultaneous switching output (SSO)

management.

Table 84 • LVCMOS 1.2 V Transmitter Characteristics for MSIO I/O Bank (Output and Tristate Buffers)

Output

Drive

Selection

Slew

Control

TDP TZL TZH THZ1TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

2 mA Slow 6.746 7.937 7.458 8.774 8.172 9.614 9.867 11.608 8.393 9.874 ns

4 mA Slow 7.068 8.315 6.678 7.857 7.474 8.793 10.986 12.924 9.043 10.638 ns

1. Delay increases with drive strength are inherent to built-in slew control circuitry for simultaneous switching output (SSO)

management.

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2.3.5.11 3.3 V PCI/PCIX

Peripheral Component Interface (PCI) for 3.3 V standards specify support for 33 MHz and 66 MHz PCI

bus applications.

Minimum and Maximum DC/AC Input and Output Levels Specification (Applicable to MSIO Bank

Only)

Table 85 • LVCMOS 1.2 V Transmitter Characteristics for MSIOD I/O Bank (Output and Tristate Buffers)

Output

Drive

Selection

Slew

Control

TDP TZL TZH THZ1

1. Delay increases with drive strength are inherent to built-in slew control circuitry for simultaneous switching output (SSO)

management.

TLZ1

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

2 mA Slow 3.883 4.568 4.868 5.726 5.329 6.269 7.994 9.404 7.527 8.855 ns

4 mA Slow 3.774 4.44 4.188 4.926 4.613 5.426 8.972 10.555 8.315 9.782 ns

Table 86 • PCI/PCI-X DC Recommended Operating Conditions

Parameter Symbol Min Typ Max Unit

Supply voltage VDDI 3.15 3.3 3.45 V

Table 87 • PCI/PCI-X DC Input Voltage Specification

Parameter Symbol Min Max Unit

DC input voltage VI03.45V

Input current high1

1. See Table 24, page 23.

IIH(DC)

Input current low1IIL(DC)

Table 88 • PCI/PCI-X DC Output Voltage Specification

Parameter Symbol Min Typ Max Unit

DC output logic high VOH Per PCI specification V

DC output logic low VOL Per PCI specification V

Table 89 • PCI/PCI-X Minimum and Maximum AC Switching Speed

Parameter Symbol Max Unit Conditions

Maximum data rate (MSIO I/O bank) DMAX 630 Mbps AC Loading: per JEDEC specifications

Table 90 • PCI/PCI-X AC Test Parameter Specifications

Parameter Symbol Typ Unit

Measuring/trip point for data path (falling edge) VTRIP 0.615 × VDDI V

Measuring/trip point for data path (rising edge) VTRIP 0.285 × VDDI V

Resistance for data test path RTT_TEST 25 

Resistance for enable path (TZH, TZL, THZ, TLZ)R

ENT 2K 

Capacitive loading for enable path (TZH, TZL, THZ, TLZ)C

ENT 5pF

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AC Switching Characteristics

Worst commercial-case conditions: TJ = 85 °C, VDD = 1.14 V, VDDI = 3.0 V

2.3.6 Memory Interface and Voltage Referenced I/O Standards

This section describes High-Speed Transceiver Logic (HSTL) memory interface and voltage reference

I/O standards.

2.3.6.1 High-Speed Transceiver Logic (HSTL)

The HSTL standard is a general purpose high-speed bus standard sponsored by IBM (EIA/JESD8-6).

IGLOO2 FPGA and SmartFusion2 SoC FPGA devices support two classes of the 1.5 V HSTL. These

differential versions of the standard require a differential amplifier input buffer and a push-pull output

buffer.

Minimum and Maximum DC/AC Input and Output Levels Specification (Applicable to DDRIO Bank

Only)

Capacitive loading for data path (TDP)C

LOAD 10 pF

Table 91 • PCI/PCIX AC Switching Characteristics for Receiver for MSIO I/O Bank

(Input Buffers)

On-Die Termination (ODT)

TPY TPYS

Unit–1 –Std –1 –Std

None 2.229 2.623 2.238 2.633 ns

Table 92 • PCI/PCIX AC switching Characteristics for Transmitter for MSIO I/O Bank (Output

and Tristate Buffers)

TDP TZL TZH THZ TLZ

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

2.146 2.525 2.043 2.404 2.084 2.452 6.095 7.171 5.558 6.539 ns

Table 93 • HSTL Recommended DC Operating Conditions

Parameter Symbol Min Typ Max Unit

Supply voltage VDDI 1.425 1.5 1.575 V

Termination voltage VTT 0.698 0.750 0.803 V

Input reference voltage VREF 0.698 0.750 0.803 V

Table 94 • HSTL DC Input Voltage Specification

Parameter Symbol Min Max Unit

DC input logic high VIH (DC) VREF + 0.1 1.575 V

DC input logic low VIL (DC) –0.3 VREF – 0.1 V

Input current high1

1. See Table 24, page 23.

IIH (DC)

Input current low1IIL (DC)

Table 90 • PCI/PCI-X AC Test Parameter Specifications

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Table 95 • HSTL DC Output Voltage Specification Applicable to DDRIO I/O Bank Only

Parameter Symbol Min Max Unit

HSTL Class I

DC output logic high VOH VDDI – 0.4 V

DC output logic low VOL 0.4 V

Output minimum source DC current (MSIO and DDRIO I/O banks) IOH at VOH –8.0 mA

Output minimum sink current (MSIO and DDRIO I/O banks) IOL at VOL 8.0 mA

HSTL Class II

DC output logic high VOH VDDI – 0.4 V

DC output logic low VOL 0.4 V

Output minimum source DC current IOH at VOH –16.0 mA

Output minimum sink current IOL at VOL 16.0 mA

Table 96 • HSTL DC Differential Voltage Specification

Parameter Symbol Min Unit

DC input differential voltage VID (DC) 0.2 V

Table 97 • HSTL AC Differential Voltage Specifications

Parameter Symbol Min Max Unit

AC input differential voltage VDIFF 0.4 V

AC differential cross point voltage Vx0.68 0.9 V

Table 98 • HSTL Minimum and Maximum AC Switching Speed

Parameter Symbol Max Unit Conditions

Maximum data rate DMAX 400 Mbps AC loading: per JEDEC specifications

Table 99 • HSTL Impedance Specification

Parameter Symbol Typ Unit Conditions

Supported output driver calibrated

impedance (for DDRIO I/O bank)

RREF 25.5, 47.8 Reference resistance = 191 

Effective impedance value (ODT for

DDRIO I/O bank only)

RTT 47.8 Reference resistance = 191 

Table 100 • HSTL AC Test Parameter Specification

Parameter Symbol Typ Unit

Measuring/trip point for data path VTRIP 0.75 V

Resistance for enable path (TZH, TZL, THZ, TLZ)R

ENT 2K 

Capacitive loading for enable path (TZH, TZL, THZ, TLZ) CENT 5pF

Reference resistance for data test path for HSTL15 Class I (TDP)RTT_TEST 50 

Reference resistance for data test path for HSTL15 Class II (TDP)RTT_TEST 25 

Capacitive loading for data path (TDP)C

LOAD 5pF

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AC Switching Characteristics

Worst-case commercial conditions: TJ = 85 °C, VDD = 1.14 V, worst-case VDDI.

2.3.6.2 Stub-Series Terminated Logic

Stub-Series Terminated Logic (SSTL) for 2.5 V (SSTL2), 1.8 V (SSTL18), and 1.5 V (SSTL15) is

supported in IGLOO2 and SmartFusion2 SoC FPGAs. SSTL2 is defined by JEDEC standard JESD8-9B

and SSTL18 is defined by JEDEC standard JESD8-15. IGLOO2 SSTL I/O configurations are designed to

meet double data rate standards DDR/2/3 for general purpose memory buses. Double data rate

standards are designed to meet their JEDEC specifications as defined by JEDEC standard JESD79F for

DDR, JEDEC standard JESD79-2F for DDR, JEDEC standard JESD79-3D for DDR3, and JEDEC

standard JESD209A for LPDDR.

Table 101 • HSTL Receiver Characteristics for DDRIO I/O Bank with Fixed Code (Input Buffers)

On-Die Termination (ODT)

TPY

Unit –1 –Std

Pseudo differential None 1.605 1.888 ns

47.8 1.614 1.898 ns

True differential None 1.622 1.909 ns

47.8 1.628 1.916 ns

Table 102 • HSTL Transmitter Characteristics for DDRIO I/O Bank (Output and Tristate Buffers)

TDP TZL TZH THZ TLZ

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

HSTL Class I

Single-ended 2.6 3.059 2.514 2.958 2.514 2.958 2.431 2.86 2.431 2.86 ns

Differential 2.621 3.083 2.648 3.115 2.647 3.113 2.925 3.442 2.923 3.44 ns

HSTL Class II

Single-ended 2.511 2.954 2.488 2.927 2.49 2.93 2.409 2.833 2.411 2.836 ns

Differential 2.528 2.974 2.552 3.003 2.551 3.001 2.897 3.409 2.896 3.408 ns

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2.3.6.3 Stub-Series Terminated Logic 2.5 V (SSTL2)

SSTL2 Class I and Class II are supported in IGLOO2 and SmartFusion2 SoC FPGAs and also comply

with reduced and full drive of double data rate (DDR) standards. IGLOO2 and SmartFusion2 SoC FPGA

I/Os supports both standards for single-ended signaling and differential signaling for SSTL2. This

standard requires a differential amplifier input buffer and a push-pull output buffer.

Minimum and Maximum DC/AC Input and Output Levels Specification

Table 103 • DDR1/SSTL2 DC Recommended Operating Conditions

Parameter Symbol Min Typ Max Unit

Supply voltage VDDI 2.375 2.5 2.625 V

Termination voltage VTT 1.164 1.250 1.339 V

Input reference voltage VREF 1.164 1.250 1.339 V

Table 104 • DDR1/SSTL2 DC Input Voltage Specification

Parameter Symbol Min Max Unit

DC input logic high VIH (DC) VREF + 0.15 2.625 V

DC input logic low VIL (DC) –0.3 VREF – 0.15 V

Input current high1

1. See Ta bl e 24 , page 23.

IIH (DC)

Input current low1IIL (DC)

Table 105 • DDR1/SSTL2 DC Output Voltage Specification

Parameter Symbol Min Max Unit

SSTL2 Class I (DDR Reduced Drive)

DC output logic high VOH VTT + 0.608 V

DC output logic low VOL VTT – 0.608 V

Output minimum source DC current IOH at VOH 8.1 mA

Output minimum sink current IOL at VOL –8.1 mA

SSTL2 Class II (DDR Full Drive) – Applicable to MSIO and DDRIO I/O Bank Only

DC output logic high VOH VTT + 0.81 V

DC output logic low VOL VTT – 0.81 V

Output minimum source DC current IOH at VOH 16.2 mA

Output minimum sink current IOL at VOL –16.2 mA

Table 106 • DDR1/SSTL2 DC Differential Voltage Specification

Parameter Symbol Min Unit

DC input differential voltage VID (DC) 0.3 V

Table 107 • SSTL2 AC Differential Voltage Specifications

Parameter Symbol Min Max Unit

AC input differential voltage VDIFF (AC) 0.7 V

AC differential cross point voltage Vx (AC) 0.5 × VDDI – 0.2 0.5 × VDDI + 0.2 V

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AC Switching Characteristics

Worst commercial-case conditions: TJ = 85 °C, VDD = 1.14 V, VDDI = 2.375 V

Table 108 • SSTL2 Minimum and Maximum AC Switching Speeds

Parameter Symbol Max Unit Conditions

Maximum data rate (for

DDRIO I/O bank)

DMAX 400 Mbps AC loading: per JEDEC

specifications

Maximum data rate (for

MSIO I/O bank)

DMAX 575 Mbps AC loading: 17pF load

Maximum data rate (for

MSIOD I/O bank)

DMAX 700 Mbps AC loading: 3 pF / 50 

load

510 Mbps AC loading: 17pF load

Table 109 • SSTL2 AC Impedance Specifications

Parameter Typ Unit Conditions

Supported output driver calibrated

impedance (for DDRIO I/O bank)

20, 42 Reference resistor = 150 

Table 110 • DDR1/SSTL2 AC Test Parameter Specifications

Parameter Symbol Typ Unit

Measuring/trip point for data path VTRIP 1.25 V

Resistance for enable path (TZH, TZL, THZ, TLZ)R

ENT 2K 

Capacitive loading for enable path (TZH, TZL, THZ, TLZ)C

ENT 5pF

Reference resistance for data test path for SSTL2 Class I

(TDP)

RTT_TEST 50 

Reference resistance for data test path for SSTL2 Class II

(TDP)

RTT_TEST 25 

Capacitive loading for data path (TDP)C

LOAD 5pF

Table 111 • SSTL2 Receiver Characteristics for DDRIO I/O Bank (Input Buffers)

On-Die

Termination (ODT)

TPY

Unit–1 –Std

Pseudo differential None 1.549 1.821 ns

True differential None 1.589 1.87 ns

Table 112 • SSTL2 Receiver Characteristics for MSIO I/O Bank (Input Buffers)

On-Die

Termination (ODT)

TPY

Unit–1 –Std

Pseudo differential None 2.798 3.293 ns

True differential None 2.733 3.215 ns

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2.3.6.4 Stub-Series Terminated Logic 1.8 V (SSTL18)

SSTL18 Class I and Class II are supported in IGLOO2 and SmartFusion2 SoC FPGAs, and also comply

with the reduced and full drive double date rate (DDR2) standard. IGLOO2 and SmartFusion2 SoC

FPGA I/Os support both standards for single-ended signaling and differential signaling for SSTL18. This

standard requires a differential amplifier input buffer and a push-pull output buffer.

Table 113 • DDR1/SSTL2 Receiver Characteristics for MSIOD I/O Bank (Input Buffers)

On-Die

Termination (ODT)

TPY

Unit–1 –Std

Pseudo differential None 2.476 2.913 ns

True differential None 2.475 2.911 ns

Table 114 • SSTL2 Class I Transmitter Characteristics for DDRIO I/O Bank (Output and Tristate Buffers)

TDP TZL TZH THZ TLZ

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

Single-ended 2.26 2.66 1.99 2.341 1.985 2.335 2.135 2.512 2.13 2.505 ns

Differential 2.26 2.658 2.202 2.591 2.201 2.589 2.393 2.815 2.392 2.814 ns

Table 115 • DDR1/SSTL2 Class I Transmitter Characteristics for MSIO I/O Bank (Output and Tristate Buffers)

TDP TZL TZH THZ TLZ

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

Single-ended 2.055 2.417 2.037 2.396 2.03 2.388 2.068 2.433 2.061 2.425 ns

Differential 2.192 2.58 2.434 2.864 2.425 2.852 2.164 2.545 2.156 2.536 ns

Table 116 • DDR1/SSTL2 Class I Transmitter Characteristics for MSIOD I/O Bank (Output and Tristate

Buffers)

TDP TZL TZH THZ TLZ

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

Single-ended 1.512 1.779 1.462 1.72 1.462 1.72 1.676 1.972 1.676 1.971 ns

Differential 1.676 1.971 1.774 2.087 1.766 2.077 1.854 2.181 1.845 2.171 ns

Table 117 • DDR1/SSTL2 Class II Transmitter Characteristics for DDRIO I/O Bank (Output and Tristate

Buffers)

TDP TZL TZH THZ TLZ

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

Single-ended 2.122 2.497 1.906 2.243 1.902 2.237 2.061 2.424 2.056 2.418 ns

Differential 2.127 2.501 2.042 2.402 2.043 2.403 2.363 2.78 2.365 2.781 ns

Table 118 • DDR1/SSTL2 Class II Transmitter Characteristics for MSIO I/O Bank (Output and Tristate Buffers)

TDP TZL TZH THZ TLZ

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

Single-ended 2.29 2.693 1.988 2.338 1.978 2.326 1.989 2.34 1.979 2.328 ns

Differential 2.418 2.846 2.304 2.711 2.297 2.702 2.131 2.506 2.124 2.499 ns

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Minimum and Maximum DC/AC Input and Output Levels Specification

Table 119 • SSTL18 DC Recommended DC Operating Conditions

Parameter Symbol Min Typ Max Unit

Supply voltage VDDI 1.71 1.8 1.89 V

Termination voltage VTT 0.838 0.900 0.964 V

Input reference voltage VREF 0.838 0.900 0.964 V

Table 120 • SSTL18 DC Input Voltage Specification

Parameter Symbol Min Max Unit

DC input logic high VIH (DC) VREF + 0.125 1.89 V

DC input logic low VIL (DC) –0.3 VREF – 0.125 V

Input current high1

1. See Table 24, page 23.

IIH (DC)

Input current low1IIL (DC)

Table 121 • SSTL18 DC Output Voltage Specification

Parameter Symbol Min Max Unit

SSTL18 Class I (DDR2 Reduced Drive)

DC output logic high VOH VTT + 0.603 V

DC output logic low VOL VTT– 0.603 V

Output minimum source DC current (DDRIO I/O bank

only)

IOH at VOH 6.5 mA

Output minimum sink current (DDRIO I/O bank only) IOL at VOL –6.5 mA

SSTL18 Class II (DDR2 Full Drive)1

1. To meet JEDEC Electrical Compliance, use DDR2 Full Drive Transmitter.

DC output logic high VOH VTT + 0.603 V

DC output logic low VOL VTT– 0.603 V

Output minimum source DC current (DDRIO I/O bank

only)

IOH at VOH 13.4 mA

Output minimum sink current (DDRIO I/O bank only) IOL at VOL –13.4 mA

Table 122 • SSTL18 DC Differential Voltage Specification

Parameter Symbol Min Unit

DC input differential voltage VID (DC) 0.3 V

Table 123 • SSTL18 AC Differential Voltage Specifications (Applicable to DDRIO Bank Only)

Parameter Symbol Min Max Unit

AC input differential

voltage

VDIFF (AC) 0.5 V

AC differential cross

point voltage

Vx (AC) 0.5 × VDDI – 0.175 0.5 × VDDI + 0.175 V

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AC Switching Characteristics

Worst commercial-case conditions: TJ = 85 °C, VDD = 1.14 V, VDDI = 1.71 V

Table 124 • SSTL18 Minimum and Maximum AC Switching Speed (Applicable to DDRIO Bank Only)

Parameter Symbol Max Unit Conditions

Maximum data rate (for DDRIO I/O bank) DMAX 667 Mbps AC loading: per JEDEC specification

Table 125 • SSTL18 AC Impedance Specifications (Applicable to DDRIO Bank Only)

Parameter Symbol Typ Unit Conditions

Supported output driver calibrated impedance

(for DDRIO I/O bank)

RREF 20, 42 Reference resistor = 150 

Effective impedance value (ODT) RTT 50, 75, 150 Reference resistor = 150 

Table 126 • SSTL18 AC Test Parameter Specifications (Applicable to DDRIO Bank Only)

Parameter Symbol Typ Unit

Measuring/trip point for data path VTRIP 0.9 V

Resistance for enable path (TZH, TZL, THZ, TLZ)R

ENT 2K 

Capacitive loading for enable path (TZH, TZL, THZ, TLZ)C

ENT 5pF

Reference resistance for data test path for SSTL18 Class I (TDP) RTT_TEST 50 

Reference resistance for data test path for SSTL18 Class II (TDP) RTT_TEST 25 

Capacitive loading for data path (TDP)C

LOAD 5pF

Table 127 • DDR2/SSTL18 Receiver Characteristics for DDRIO I/O Bank with Fixed Code

On-Die Termination (ODT)

TPY

Unit–1 –Std

Pseudo differential None 1.567 1.844 ns

True differential None 1.588 1.869 ns

Table 128 • DDR2/SSTL18 Transmitter Characteristics (Output and Tristate Buffers)

TDP TZL TZH THZ TLZ

Unit–1 –Std –1 –Std –1 –Std –1 –Std –1 –Std

SSTL18 Class I (for DDRIO I/O Bank)

Single-ended 2.383 2.804 2.23 2.623 2.229 2.622 2.202 2.591 2.201 2.59 ns

Differential 2.413 2.84 2.797 3.29 2.797 3.29 2.282 2.685 2.282 2.685 ns

SSTL18 Class II (for DDRIO I/O Bank)

Single-ended 2.281 2.683 2.196 2.584 2.195 2.583 2.171 2.555 2.17 2.554 ns

Differential 2.315 2.724 2.698 3.173 2.698 3.173 2.242 2.639 2.242 2.639 ns

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2.3.6.5 Stub-Series Terminated Logic 1.5 V (SSTL15)

SSTL15 Class I and Class II are supported in IGLOO2 FPGAs and SmartFusion2 SoC FPGAs, and also

comply with the reduced and full drive double data rate (DDR3) standard. IGLOO2 FPGA and

SmartFusion2 SoC FPGA I/Os supports both standards for single-ended signaling and differential

signaling for SSTL18. This standard requires a differential amplifier input buffer and a push-pull output

buffer.

Minimum and Maximum DC/AC Input and Output Levels Specification

The following table lists the SSTL15 DC voltage specifications for DDRIO bank.

Note: To meet JEDEC electrical compliance, use DDR3 full drive transmitter.

Table 129 • SSTL15 DC Recommended DC Operating Conditions (for DDRIO I/O Bank Only)

Parameter Symbol Min Typ Max Unit

Supply voltage VDDI 1.425 1.5 1.575 V

Termination voltage VTT 0.698 0.750 0.803 V

Input reference voltage VREF 0.698 0.750 0.803 V

Table 130 • SSTL15 DC Input Voltage Specification (for DDRIO I/O Bank Only)

Parameter Symbol Min Max Unit

DC input logic high VIH(DC) VREF + 0.1 1.575 V

DC input logic low VIL(DC) –0.3 VREF – 0.1 V

Input current high1

1. See Table 24, page 23.

IIH (DC)

Input current low1IIL (DC)

Table 131 • SSTL15 DC Output Voltage Specification (for DDRIO I/O Bank Only)

Parameter Symbol Min Max Unit

DDR3/SSTL15 Class I (DDR3 Reduced Drive)

DC output logic high VOH 0.8 × VDDI V

DC output logic low VOL 0.2 × VDDI V

Output minimum source DC

current

IOH at VOH 6.5 mA

Output minimum sink current IOL at VOL –6.5 mA

DDR3/SSTL15 Class II (DDR3 Full Drive)

DC output logic high VOH 0.8 × VDDI V

DC output logic low VOL 0.2 × VDDI V

Output minimum source DC

current

IOH at VOH 7.6 mA

Output minimum sink current IOL at VOL –7.6 mA

Table 132 • SSTL15 DC Differential Voltage Specification (for DDRIO I/O Bank Only)

Parameter Symbol Min Unit

DC input differential voltage VID 0.2 V

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Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 50

AC Switching Characteristics

Worst commercial-case conditions: TJ = 85 °C, VDD = 1.14 V, VDDI = 1.425 V

Table 133 • SSTL15 AC SSTL15 Minimum and Maximum AC Switching Speed (for DDRIO I/O Bank Only)

Parameter Symbol Min Max Unit

AC input differential voltage VDIFF (AC) 0.3 V

AC differential cross point voltage Vx (AC) 0.5 × VDDI – 0.150 0.5 × VDDI + 0.150 V

Table 134 • SSTL15 Minimum and Maximum AC Switching Speed (for DDRIO I/O Bank Only)

Parameter Symbol Max Unit Conditions

Maximum data rate DMAX 667 Mbps AC loading: per JEDEC specifications

Table 135 • SSTL15 AC Calibrated Impedance Option (for DDRIO I/O Bank Only)

Parameter Symbol Typ Unit Conditions

Supported output driver calibrated impedance RREF 34, 40 Reference resistor = 240 

Effective impedance value (ODT) RTT 20, 30, 40, 60, 120 Reference resistor = 240 

Table 136 • SSTL15 AC Test Parameter Specifications (for DDRIO I/O Bank Only)

Parameter Symbol Typ Unit

Measuring/trip point for data path VTRIP 0.75 V

Resistance for enable path (TZH, TZL, THZ, TLZ)R

ENT 2K 

Capacitive loading for enable path (TZH, TZL, THZ, TLZ)C

ENT 5pF

Reference resistance for data test path for SSTL15 Class I (TDP) RTT_TEST 50 

Reference resistance for data test path for SSTL15 Class II (TDP) RTT_TEST 25 

Capacitive loading for data path (TDP)C

LOAD 5pF

Table 137 • DDR3/SSTL15 Receiver Characteristics for DDRIO I/O Bank – with Calibration Only

On-Die Termination (ODT)

TPY

Unit –1 –Std

Pseudo differential None 1.605 1.888 ns

20 1.616 1.901 ns

30 1.613 1.897 ns

40 1.611 1.895 ns

60 1.609 1.893 ns

120 1.607 1.89 ns

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Microsemi Proprietary and Confidential DS0128 Datasheet Revision 12.0 51

2.3.6.6 Low Power Double Data Rate (LPDDR)

LPDDR reduced and full drive low power double data rate standards are supported in IGLOO2 FPGA

and SmartFusion2 SoC FPGA I/Os. This standard requires a differential amplifier input buffer and a

push-pull output buffer.

Minimum and Maximum DC/AC Input and Output Levels Specification

True differential None 1.623 1.91 ns

20 1.637 1.926 ns

30 1.63 1.918 ns

40 1.626 1.914 ns

60 1.622 1.91 ns

120 1.619 1.9