OPA1662-Q1 Datasheet by Texas Instruments

r.- 32, Q ‘X E I TEXAS INSTRUMENTS mu~N w
0.00001
0.0001
0.001
0.01
20 100 1k 10k 20k
Frequency (Hz)
THD+N (%)
G = 10V/V, RL = 600
G = 10V/V, RL = 2k
G = +1V/V, RL = 600
G = +1V/V, RL = 2k
G = −1V/V, RL = 600
G = −1V/V, RL = 2k
VOUT = 3VRMS
BW = 80kHz
G007
1 10 100 1k 10k 100k
0.1
1
10
100
0.1
1
10
100
Frequency (Hz)
Voltage Noise (nV/ Hz)
Current Noise (pA/ Hz)
Voltage Noise
Current Noise
G001
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An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
OPA1662-Q1
SLOS805C –JULY 2012REVISED AUGUST 2016
OPA1662-Q1 Dual, 3.3 nV/Hz Noise, 0.00006% THD+N, RRO, Bipolar-Input Audio
Operational Amplifier
1
1 Features
1 Qualified for Automotive Applications
AEC-Q100 Qualified With the Following Results
Device Temperature Grade 3: –40°C to 85°C
Ambient Operating Temperature Range
Device HBM ESD Classification Level H2
Device CDM ESD Classification Level C3B
Low Noise: 3.3 nV/Hz at 1 kHz
Low Distortion: 0.00006% at 1 kHz
Low Quiescent Current: 1.5 mA per Channel
Slew Rate: 17 V/μs
Wide Gain Bandwidth: 22 MHz (G = 1)
Unity Gain Stable
Rail-to-Rail Output
Wide Supply Range: ±1.5 V to ±18 V,
or3Vto36V
Small Package Sizes:
Dual: 8-Pin SOIC and VSSOP
2 Applications
• Automotive
Car Audio
Premium Audio
External Audio Amplifiers
Body Control Modules
3 Description
The OPA1662-Q1 is a dual, bipolar-input operational
amplifier which is well suited for premium audio
external amplifier applications in infotainment and
cluster systems. In audio systems, the main concern
is to ensure a clear, quality output signal which
means minimuzing any noise introduced to the signal.
The OPA1662-Q1 offers low noise density with an
ultra-low distortion of 0.00006% at 1 kHz that
maximizes the signal output. Additionally, this op amp
offers rail-to-rail output swing to within 600 mV with 2-
kΩload. The wide headroom ensures that the output
signal does not clip, and therefore preserves the
audio quality.
the OPA1662-Q1 operates over a very wide supply
range of ±1.5 V to ±18 V, or 3 V to 36 V, on only
1.5 mA of supply current per channel. The wide
supply range enables design flexibility for the device
as it can be integrated from a power amplifier driven
by the battery to being driven from an ADC to DAC
for low-power applications. Additionally, this device
also has a high-output drive capability of ±30 mA and
can act as the sole audio amplifier for low-power
applications, such as for cluster chimes.
Device Information(1)
PART NUMBER PACKAGE BODY SIZE (NOM)
OPA1662-Q1 SOIC (8) 4.90 mm × 3.91 mm
VSSOP (8) 3.00 mm × 3.00 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Input Voltage Noise Density and Input Current
Noise Density vs Frequency THD+N Ratio vs Frequency
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Table of Contents
1 Features.................................................................. 1
2 Applications ........................................................... 1
3 Description ............................................................. 1
4 Revision History..................................................... 2
5 Description Continued .......................................... 3
6 Pin Configuration and Functions......................... 3
7 Specifications......................................................... 3
7.1 Absolute Maximum Ratings ...................................... 3
7.2 ESD Ratings.............................................................. 4
7.3 Recommended Operating Conditions....................... 4
7.4 Thermal Information.................................................. 4
7.5 Electrical Characteristics: VS= ±15 V....................... 4
7.6 Electrical Characteristics: VS= 5 V........................... 5
7.7 Typical Characteristics.............................................. 7
8 Detailed Description............................................ 14
8.1 Overview ................................................................. 14
8.2 Functional Block Diagram....................................... 14
8.3 Feature Description................................................. 14
8.4 Device Functional Modes........................................ 19
9 Application and Implementation ........................ 20
9.1 Application Information............................................ 20
9.2 Typical Application .................................................. 20
10 Power Supply Recommendations ..................... 22
11 Layout................................................................... 22
11.1 Layout Guidelines ................................................. 22
11.2 Layout Example .................................................... 23
11.3 Power Dissipation ................................................. 23
12 Device and Documentation Support ................. 24
12.1 Documentation Support ........................................ 24
12.2 Receiving Notification of Documentation Updates 24
12.3 Community Resources.......................................... 24
12.4 Trademarks........................................................... 24
12.5 Electrostatic Discharge Caution............................ 24
12.6 Glossary................................................................ 24
13 Mechanical, Packaging, and Orderable
Information ........................................................... 24
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision B (October 2012) to Revision C Page
Added ESD Ratings table, Feature Description section, Device Functional Modes,Application and Implementation
section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information section.................................................................................................. 1
Removed Ordering Information table, see POA at the end of the data sheet........................................................................ 1
Changed the Description section............................................................................................................................................ 1
Changes from Revision A (September 2012) to Revision B Page
Changed top-side marking for OPA1662AIDRQ1 from preview to O1662Q in Ordering Information table........................... 1
Changed Grade 1 to Grade 3 in Features.............................................................................................................................. 1
Changes from Original (July 2012) to Revision A Page
Device going from 2-page preview to production status, full-length document included in this revision. .............................. 1
1
2
3
4
8
7
6
5
V+
OUTB
-INB
+INB
OUTA
-INA
+INA
V-
A
B
3
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5 Description Continued
The device also features completely independent circuitry for each of the two channels to enable low crosstalk
and freedom from interactions between each channel, even when overdriven or overloaded. This feature enables
customers to drive two different audio signals with ease of mind that the signals are not affected by each other.
The OPA1662-Q1 offers a wide bandwidth of 22 MHz and high slew rate of 17 V/µs which is applicable as a high
and low side sensing for ripple currents in SMPS devices or motor drives. As a current sensor, the OPA1662-Q1
can be used as peak current mode control, with the op amps offering stability and enabling higher bandwidth for
the system. The OPA1662-Q1 is applicable in body control modules and HEV or EV converters where motors
typically are used.
6 Pin Configuration and Functions
D and DGK Packages
8-Pin SOIC and VSSOP
Top View
Pin Functions
PIN I/O DESCRIPTION
NAME NO.
+IN A 3 I Noninverting input channel A
–IN A 2 I Inverting input channel A
+IN B 5 I Noninverting input channel B
–IN B 6 I Inverting input channel B
OUT_A 1 O Output, channel A
OUT_B 7 O Output, channel B
V– 4 Negative (lowest) power supply
V+ 8 Positive (highest) power supply
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Short-circuit to VS/ 2 (ground in symmetrical dual supply setups), one amplifier per package.
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
Supply voltage, (V+) – (V–) 40 V
Input voltage (V–) – 0.5 (V+) + 0.5 V
Input current (all pins except power-supply pins) ±10 mA
Output short-circuit(2) Continuous
Operating ambient temperature –40 125 °C
Junction temperature, TJ200 °C
Storage temperature, Tstg –65 150 °C
l TEXAS INSTRUMENTS
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(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
7.2 ESD Ratings
VALUE UNIT
V(ESD) Electrostatic discharge Human-body model (HBM), per AEC Q100-002(1) ±2000 V
Charged-device model (CDM), per AEC Q100-011 ±750
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
VSSupply voltage, (V+) – (V–) 3 (±1.5) 36 (±18) V
TAOperating ambient temperature –40 125 °C
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
7.4 Thermal Information
THERMAL METRIC(1)
OPA1662-Q1
UNITD (SOIC) DGK (VSSOP)
8 PINS 8 PINS
RθJA Junction-to-ambient thermal resistance 156.3 225.4 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 85.5 78.8 °C/W
RθJB Junction-to-board thermal resistance 64.9 110.5 °C/W
ψJT Junction-to-top characterization parameter 33.8 14.6 °C/W
ψJB Junction-to-board characterization parameter 64.3 108.5 °C/W
(1) Full-power bandwidth = SR / (2π× VP), where SR = slew rate.
7.5 Electrical Characteristics: VS= ±15 V
TA= 25°C, VCM = VOUT = midsupply, and RL= 2 kΩ(unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
AUDIO PERFORMANCE
THD+N Total harmonic distortion + noise G = 1, f = 1 kHz, VO= 3 VRMS
0.00006%
–124 dB
IMD Intermodulation distortion G = 1, VO= 3 VRMS
SMPTE two-tone, 4:1 (60 Hz
and 7 kHz)
0.00004%
–128 dB
DIM 30 (3-kHz square wave
and 15-kHz sine wave)
0.00004%
–128 dB
CCIF twin-tone (19 kHz and
20 kHz)
0.00004%
–128 dB
FREQUENCY RESPONSE
GBW Gain-bandwidth product G = 1 22 MHz
SR Slew rate G = –1 17 V/µs
Full power bandwidth(1) VO= 1 VP2.7 MHz
Overload recovery time G = –10 1 µs
Channel separation (dual and quad) f = 1 kHz –120 dB
NOISE
enInput voltage noise f = 20 Hz to 20 kHz 2.8 µVPP
Input voltage noise density f = 1 kHz 3.3 nV/Hz
f = 100 Hz 5 nV/Hz
InInput current noise density f = 1 kHz 1 pA/Hz
f = 100 Hz 2 pA/Hz
l TEXAS INSTRUMENTS
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Electrical Characteristics: VS= ±15 V (continued)
TA= 25°C, VCM = VOUT = midsupply, and RL= 2 kΩ(unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
(2) Specified by design and characterization.
(3) One channel at a time.
OFFSET VOLTAGE
VOS Input offset voltage VS= ±1.5 V to ±18 V ±0.5 ±1.5 mV
VS= ±1.5 V to ±18 V, TA= –40°C to 85°(2) 2 8 µV/°C
PSRR Power-supply rejection ratio VS= ±1.5 V to ±18 V 1 3 µV/V
INPUT BIAS CURRENT
IBInput bias current VCM = 0 V 600 1200 nA
IOS Input offset current VCM = 0 V ±25 ±100 nA
INPUT VOLTAGE
VCM Common-mode voltage (V–) + 0.5 (V+) – 1 V
CMRR Common-mode rejection ratio 106 114 dB
INPUT IMPEDANCE
Differential resistance 170 kΩ
Differential capacitance 2 pF
Common-mode resistance 600 kΩ
Common-mode capacitance 2.5 pF
OPEN-LOOP GAIN
AOL Open-loop voltage gain (V–) + 0.6 V VO(V+) – 0.6 V, RL= 2 kΩ106 114 dB
OUTPUT
VOUT Output voltage RL= 2 kΩ(V–) + 0.6 (V+) – 0.6 V
IOUT Output current See Typical Characteristics mA
ZOOpen-loop output impedance See Typical Characteristics Ω
ISC Short-circuit current(3) ±50 mA
CLOAD Capacitive load drive 200 pF
POWER SUPPLY
VSSpecified voltage ±1.5 ±18 V
IQQuiescent current
(per channel)
IOUT = 0 A 1.5 1.8 mA
IOUT = 0 A, TA= –40°C to 85°(2) 2 mA
TEMPERATURE
Specified temperature –40 85 °C
7.6 Electrical Characteristics: VS= 5 V
TA= 25°C, VCM = VOUT = midsupply, and RL= 2 kΩ(unless otherwise noted)
PARAMETERTEST CONDITIONS MIN TYP MAX UNIT
AUDIO PERFORMANCE
THD+N Total harmonic distortion + noise G = 1, f = 1 kHz, VO= 3 VRMS
0.0001%
–120 dB
IMD Intermodulation distortion G = 1, VO= 3 VRMS
SMPTE two-tone, 4:1 (60 Hz
and 7 kHz)
0.00004%
–128 dB
DIM 30 (3-kHz square wave
and 15-kHz sine wave)
0.00004%
–128 dB
CCIF twin-tone (19 kHz and
20 kHz)
0.00004%
–128 dB
l TEXAS INSTRUMENTS
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Electrical Characteristics: VS= 5 V (continued)
TA= 25°C, VCM = VOUT = midsupply, and RL= 2 kΩ(unless otherwise noted)
PARAMETERTEST CONDITIONS MIN TYP MAX UNIT
(1) Full-power bandwidth = SR / (2π× VP), where SR = slew rate.
(2) Specified by design and characterization.
(3) One channel at a time.
FREQUENCY RESPONSE
GBW Gain-bandwidth product G = 1 20 MHz
SR Slew rate G = –1 13 V/µs
Full power bandwidth(1) VO= 1 VP2 MHz
Overload recovery time G = –10 1 µs
Channel separation (dual and quad) f = 1 kHz –120 dB
NOISE
enInput voltage noise f = 20 Hz to 20 kHz 3.3 µVPP
Input voltage noise density f = 1 kHz 3.3 nV/Hz
f = 100 Hz 5 nV/Hz
InInput current noise density f = 1 kHz 1 pA/Hz
f = 100 Hz 2 pA/Hz
OFFSET VOLTAGE
VOS Input offset voltage VS= ±1.5 V to ±18 V ±0.5 ±1.5 mV
VS= ±1.5 V to ±18 V, TA= –40°C to 85°(2) 2 8 µV/°C
PSRR Power-supply rejection ratio VS= ±1.5 V to ±18 V 1 3 µV/V
INPUT BIAS CURRENT
IBInput bias current VCM = 0 V 600 1200 nA
IOS Input offset current VCM = 0 V ±25 ±100 nA
INPUT VOLTAGE
VCM Common-mode voltage (V–) + 0.5 (V+) – 1 V
CMRR Common-mode rejection ratio 86 100 dB
INPUT IMPEDANCE
Differential resistance 170 kΩ
Differential capacitance 2 pF
Common-mode resistance 600 kΩ
Common-mode capacitance 2.5 pF
OPEN-LOOP GAIN
AOL Open-loop voltage gain (V–) + 0.6 V VO(V+) – 0.6 V, RL= 2 kΩ90 100 dB
OUTPUT
VOUT Output voltage RL= 2 kΩ(V–) + 0.6 (V+) – 0.6 V
IOUT Output current See \mA
ZOOpen-loop output impedance See Typical Characteristics Ω
ISC Short-circuit current(3) ±40 mA
CLOAD Capacitive load drive 200 pF
POWER SUPPLY
VSSpecified voltage ±1.5 ±18 V
IQQuiescent current (per channel) IOUT = 0 A 1.4 1.7 mA
IOUT = 0 A, TA= –40°C to 85°(2) 2 mA
TEMPERATURE
Specified temperature –40 85 °C
l TEXAS INSTRUMENTS Twme (ts/aw) vauage Nmse (an 10k Suurce Resls|ance (g2)
10 100 1k 10k 100k 1M 10M 100M
−20
0
20
40
60
80
100
120
140
0
45
90
135
180
Frequency (Hz)
Gain (dB)
Phase (°)
Gain
Phase
CL = 100pF
G005
1
10
100
1k
10k
100 1k 10k 100k 1M
Resistor Noise
OPA166x
OPA165x
Source Resistance ( )W
Voltage Noise (nV/ Hz)
Eo
2= en
2+ (inRS)2+ 4KTRS
G003
RS
EO
0
2
5
8
10
12
15
10k 100k 1M 10M
Frequency (Hz)
Output Voltage (V)
VS = ±15 V
VS = ±5 V
VS = ±1.5 V
G004
1 10 100 1k 10k 100k
0.1
1
10
100
0.1
1
10
100
Frequency (Hz)
Voltage Noise (nV/ Hz)
Current Noise (pA/ Hz)
Voltage Noise
Current Noise
G001
Time (1s/div)
Voltage Noise ( 50nV/div)
G002
7
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7.7 Typical Characteristics
At TA= 25°C, VS= ±15 V, and RL= 2 kΩ(unless otherwise noted)
Figure 1. Input Voltage Noise Density and Input Current
Noise Density vs Frequency
Figure 2. 0.1-Hz to 10-Hz Noise
Figure 3. Voltage Noise vs Source Resistance Figure 4. Maximum Output Voltage vs Frequency
Figure 5. Gain and Phase vs Frequency Figure 6. Closed-Loop Gain vs Frequency
l TEXAS INSTRUMENTS E E a a I I E E a a I I 001 Frequency (HZ) 001 Frequency (HZ)
0.00001
0.0001
0.001
0.01
20 100 1k 10k 20k
Frequency (Hz)
THD+N (%)
RS= 0 W
RS= 30 W
RS= 60 W
RS= 1 kW
VOUT = 3 VRMS
BW = 80 kHz
G008
OPA1662-Q1
+15V
-15V RL
RSOURCE
0.00001
0.0001
0.001
0.01
20 100 1k 10k 100k
Frequency (Hz)
THD+N (%)
RS= 0 W
RS= 30 W
RS= 60 W
RS= 1 kW
VOUT = 3 VRMS
BW = 500 kHz
G010
OPA1662-Q1
+15V
-15V RL
RSOURCE
0.00001
0.0001
0.001
0.01
20 100 1k 10k 100k
Frequency (Hz)
THD+N (%)
G = 10V/V, RL = 600
G = 10V/V, RL = 2k
G = +1V/V, RL = 600
G = +1V/V, RL = 2k
G = −1V/V, RL = 600
G = −1V/V, RL = 2k
VOUT = 3VRMS
BW = 500kHz
G009
0.00001
0.0001
0.001
0.01
20 100 1k 10k 100k
Frequency (Hz)
THD+N (%)
G = 10V/V, RL = 600
G = 10V/V, RL = 2k
G = +1V/V, RL = 600
G = +1V/V, RL = 2k
G = −1V/V, RL = 600
G = −1V/V, RL = 2k
VOUT = 1VRMS
BW = 500kHz
VS = ±2.5V
G039
0.00001
0.0001
0.001
0.01
20 100 1k 10k 20k
Frequency (Hz)
THD+N (%)
G = 10V/V, RL = 600
G = 10V/V, RL = 2k
G = +1V/V, RL = 600
G = +1V/V, RL = 2k
G = −1V/V, RL = 600
G = −1V/V, RL = 2k
VOUT = 3VRMS
BW = 80kHz
G007
0.00001
0.0001
0.001
0.01
20 100 1k 10k 20k
Frequency (Hz)
THD+N (%)
G = 10V/V, RL = 600
G = 10V/V, RL = 2k
G = +1V/V, RL = 600
G = +1V/V, RL = 2k
G = −1V/V, RL = 600
G = −1V/V, RL = 2k
VOUT = 1VRMS
BW = 80kHz
VS = ±2.5V
G038
8
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Typical Characteristics (continued)
At TA= 25°C, VS= ±15 V, and RL= 2 kΩ(unless otherwise noted)
Figure 7. THD+N Ratio vs Frequency Figure 8. THD+N Ratio vs Frequency
Figure 9. THD+N Ratio vs Frequency Figure 10. THD+N Ratio vs Frequency
Figure 11. THD+N Ratio vs Frequency Figure 12. THD+N Ratio vs Frequency
l TEXAS INSTRUMENTS om E a I E n g g 3: x 3: E 'n E l v- :5 g 3: 2 u u
Time (1 s/div)m
Voltage (25 mV/div)
VIN
VOUT
G = +1 V/V
CL= 10 pF
G015
Time (1 s/div)m
Voltage (25 mV/div)
VIN
VOUT
G = +1 V/V
CL= 10 pF
VS= 1.5 V±
G040
−160
−140
−120
−100
−80
100 1k 10k 100k
Frequency (Hz)
Crosstalk (dB)
VOUT = 3 VRMS
Gain = +1 V/V
G013
0
20
40
60
80
100
120
140
100 1k 10k 100k 1M 10M 100M
Frequency (Hz)
CMRR, PSRR (dB)
+PSRR
−PSRR
CMRR
G014
0.00001
0.0001
0.001
0.01
1m 10m 100m 1 10 20
Output Amplitude (Vrms)
THD+N (%)
G = 10V/V, RL = 600
G = 10V/V, RL = 2k
G = +1V/V, RL = 600
G = +1V/V, RL = 2k
G = −1V/V, RL = 600
G = −1V/V, RL = 2k
f = 1 kHz
BW = 80 kHz
RS = 0
G011
Output Amplitude (Vrms)
THD+N (%)
0.1 1 10 2020
1E-5
0.0001
0.001
0.01
D001
G = +1 V/V
DIM 30: 3 kHz - Square Wave, 15 kHz Sine Wave
CCIF Twin Tone: 19 kHz and 20 kHz
SMPTE: Two - Tone 4:1, 60 Hz and 7 kHz
9
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Typical Characteristics (continued)
At TA= 25°C, VS= ±15 V, and RL= 2 kΩ(unless otherwise noted)
Figure 13. THD+N Ratio vs Output Amplitude Figure 14. Intermodulation Distortion vs Output Amplitude
Figure 15. Channel Separation vs Frequency Figure 16. CMRR and PSRR vs Frequency
(Referred to Input)
Figure 17. Small-Signal Step Response Figure 18. Small-Signal Step Response
‘5‘ TEXAS INSTRUMENTS
Time (1 s/div)m
Voltage (250 mV/div)
G = −1 V/V
CL= 10 pF
VS= 1.5 V±
G035
VIN
VOUT
Time (1 s/div)m
Voltage (2.5 V/div)
G018
G = −1 V/V
CL= 10 pF
VIN
VOUT
Time (1 s/div)m
Voltage (2.5 V/div)
VIN
VOUT
G = +1 V/V
CL= 10 pF
RF= 1 kW
G017
Time (1 s/div)m
Voltage (250 mV/div)
VIN
VOUT
G = +1 V/V
CL= 10 pF
VS= 1.5 V±
G032
Time (1 s/div)m
Voltage (25 mV/div)
VIN
VOUT
G = −1 V/V
CL= 10 pF
G041
Time (1 s/div)m
Voltage (25 mV/div)
VIN
VOUT
G016
G = −1 V/V
CL= 10 pF
VS= 1.5 V±
10
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Typical Characteristics (continued)
At TA= 25°C, VS= ±15 V, and RL= 2 kΩ(unless otherwise noted)
Figure 19. Small-Signal Step Response Figure 20. Small-Signal Step Response
Figure 21. Large-Signal Step Response Figure 22. Large-Signal Step Response
Figure 23. Large-Signal Step Response Figure 24. Large-Signal Step Response
l TEXAS INSTRUMENTS Capacuance (pF) an; Capacuance (pF) 5:11 Capacuance (pF) an: § Capacuance (pF) am Capacuam (pF) am
0
5
10
15
20
25
30
35
40
45
50
0 1 2 3 4 5
Capacitance (pF)
Overshoot (%)
VS= 18 V±
VS= 1.5 V±
VOUT = 100 mVPP
G = +1 V/V
CL= 100 pF
G021
OPA1662-Q1
R =
I2 kW
RS
CL
CF
RF= 2 kW
+15 V
-15 V
0
5
10
15
20
25
30
35
40
45
50
0 50 100 150 200 250 300 350 400
Capacitance (pF)
Percent Overshoot (%)
VS = ±18 V
VS = ±1.5 V
G = +1 V/V
VIN = 100 mVPP
G037
0
5
10
15
20
25
30
35
40
45
50
0 50 100 150 200 250 300 350 400
Capacitance (pF)
Overshoot (%)
RS= 0 W
RS= 25 W
RS= 50 W
VOUT = 100 mVPP
G = +1 V/V
VS= 1.5 V±
G034
+15 V
-15 V
RS
CL
OPA1662-Q1
RL
0
5
10
15
20
25
30
35
40
45
50
0 50 100 150 200 250 300 350 400
Capacitance (pF)
Overshoot (%)
RS= 0 W
RS= 25 W
RS= 50 WVOUT = 100 mVPP
G = −1 V/V
VS= 1.5 V±
G033
OPA1662-Q1
R =
I2 kW
RS
CL
RF= 2 kW
+15 V
-15 V
0
5
10
15
20
25
30
35
40
45
50
0 50 100 150 200 250 300 350 400
Capacitance (pF)
Overshoot (%)
RS= 0 W
RS= 25 W
RS= 50 W
VOUT = 100 mVPP
G = +1 V/V
G019
+15 V
-15 V
RS
CL
OPA1662-Q1
RL
0
5
10
15
20
25
30
35
40
45
50
0 50 100 150 200 250 300 350 400
Capacitance (pF)
Overshoot (%)
RS= 0 W
RS= 25 W
RS= 50 W
VOUT = 100 mVPP
G = −1 V/V
G020
OPA1662-Q1
R =
I2 kW
RS
CL
RF= 2 kW
+15 V
-15 V
11
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Typical Characteristics (continued)
At TA= 25°C, VS= ±15 V, and RL= 2 kΩ(unless otherwise noted)
Figure 25. Small-Signal Overshoot vs Capacitive Load Figure 26. Small-Signal Overshoot vs Capacitive Load
Figure 27. Small-Signal Overshoot vs Capacitive Load Figure 28. Small-Signal Overshoot vs Capacitive Load
Figure 29. Small-Signal Overshoot vs Feedback Capacitor Figure 30. Percent Overshoot vs Capacitive Load
l TEXAS INSTRUMENTS .fl—g‘é/ If; .—
1.2
1.3
1.4
1.5
1.6
1.7
1.8
−40 −15 10 35 60 85 110 135
Temperature (°C)
Supply Current (mA)
G025
0
0.5
1
1.5
2
2.5
3
0 4 8 12 16 20 24 28 32 36 40
Supply Voltage (V)
Supply Current (mA)
G026
−1000
−800
−600
−400
−200
0
200
400
−40 −15 10 35 60 85 110 135
Temperature (°C)
Ib and Ios Current (nA)
IOS
IBP
IBN
G023
−800
−600
−400
−200
0
200
−18 −14 −10 −6 −2 2 6 10 14 18
Common−Mode Voltage (V)
Ib and Ios Current (nA)
−Ib
+Ib
Ios
G024
0
10
20
30
40
50
60
70
80
90
0 50 100 150 200 250 300 350 400
Capacitance (pF)
Phase Margin (°)
VS = ±18 V
VS = ±1.5 V
G036
−1
−0.5
0
0.5
1
1.5
2
2.5
3
3.5
4
−40 −15 10 35 60 85 110 135
Temperature (°C)
AOL (µV)
RL = 10 k
RL = 2 k
RL = 600
G022
12
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Typical Characteristics (continued)
At TA= 25°C, VS= ±15 V, and RL= 2 kΩ(unless otherwise noted)
Figure 31. Phase Margin vs Capacitive Load Figure 32. Open-Loop Gain vs Temperature
Figure 33. IBand IOS vs Temperature Figure 34. IBand IOS vs Common-Mode Voltage
Figure 35. Supply Current vs Temperature Figure 36. Supply Current vs Supply Voltage
l TEXAS INSTRUMENTS // / me? ompm Cunem (MN m u cm; N am mm u m
1
10
100
1k
10 100 1k 10k 100k 1M
Frequency (Hz)
Impedance ()
G030
Time (250 s/div)m
Voltage (5 V/div)
VOUT
VIN
G042
Time (0.5 s/div)m
Output Voltage (5V /div)
VIN
VOUT
G = −10 V/V
G029
Time (0.5 s/div)m
Output Voltage (5 V/div)
VIN
VOUT
G = −10 V/V
G031
−20
−15
−10
−5
0
5
10
15
20
20 25 30 35 40 45 50 55 60
Output Current (mA)
Output Volage Swing (V)
G028
−55 C°
−40 C°
−25 C°
0 C°
+25 C°
+85 C°
30
35
40
45
50
55
60
−40 −15 10 35 60 85 110 135
Temperature (°C)
Short Circuit Current (mA)
+Isc
−Isc
G027
13
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Typical Characteristics (continued)
At TA= 25°C, VS= ±15 V, and RL= 2 kΩ(unless otherwise noted)
Figure 37. Short-Circuit Current vs Temperature Figure 38. Output Voltage vs Output Current
Figure 39. Positive Overload Recovery Figure 40. Negative Overload Recovery
Figure 41. Open-Loop Output Impedance vs Frequency Figure 42. No Phase Reversal
l TEXAS INSTRUMENTS R 3T1 Copyngm-zme. Texas \nslrumems \ncarpmama
IN-
Pre-Output Driver OUT
V-
V+
IN+
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8 Detailed Description
8.1 Overview
The OPA1662-Q1 operational amplifier achieves a low 3.3 nV/Hz noise density with an ultra-low distortion of
0.00006% at 1 kHz that makes the device suitable for audio application. This device has a wide supply range
with excellent PSRR, making it a suitable option for applications that are battery powered without regulation.
8.2 Functional Block Diagram
Figure 43. OPA1662-Q1 Simplified Schematic
8.3 Feature Description
8.3.1 Operating Voltage
The OPA1662-Q1 op amp operates from ±1.5-V to ±18-V supplies while maintaining excellent performance. The
OPA1662-Q1 can operate with as little as 3 V between the supplies and up to 36 V between the supplies.
However, some applications do not require equal positive and negative output voltage swing. With the
OPA1662Q1 device, power-supply voltages do not need to be equal. For example, the positive supply could be
set to 25 V with the negative supply at –5 V.
In all cases, the common-mode voltage must be maintained within the specified range. In addition, key
parameters are assured over the specified temperature of TA= –40°C to 85°C. Parameters that vary significantly
with operating voltage or temperature are shown in the Typical Characteristics.
l TEXAS INSTRUMENTS mx Vonage Nmse ("V/J— Source Resxslanoe (12)
1
10
100
1k
10k
100 1k 10k 100k 1M
Resistor Noise
OPA166x
OPA165x
Source Resistance ( )W
Voltage Noise (nV/ Hz)
Eo
2= en
2+ (inRS)2+ 4KTRS
G003
RS
EO
OPA1662-Q1 Output
RF
Input
-
+
RI
15
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Feature Description (continued)
8.3.2 Input Protection
The input terminals of the OPA1662-Q1 are protected from excessive differential voltage with back-to-back
diodes, as Figure 44 illustrates. In most circuit applications, the input protection circuitry has no consequence.
However, in low-gain or G = 1 circuits, fast ramping input signals can forward bias these diodes because the
output of the amplifier cannot respond rapidly enough to the input ramp. If the input signal is fast enough to
create this forward bias condition, the input signal current must be limited to 10 mA or less. If the input signal
current is not inherently limited, an input series resistor (RI) or a feedback resistor (RF) can be used to limit the
signal input current. This resistor degrades the low-noise performance of the OPA1662-Q1 and is examined in
Noise Performance.Figure 44 shows an example configuration when both current-limiting input and feedback
resistors are used.
Figure 44. Pulsed Operation
8.3.3 Noise Performance
Figure 45 shows the total circuit noise for varying source impedances with the op amp in a unity-gain
configuration (no feedback resistor network, and therefore no additional noise contributions).
The OPA1662-Q1 (GBW = 22 MHz, G = 1) is shown with total circuit noise calculated. The op amp itself
contributes both a voltage noise component and a current noise component. The voltage noise is commonly
modeled as a time-varying component of the offset voltage. The current noise is similarly modeled as the time-
varying component of the input bias current and reacts with the source resistance to create a voltage component
of noise. Therefore, the lowest noise op amp for a given application depends on the source impedance. For low
source impedance, current noise is negligible, and voltage noise generally dominates. The low voltage noise of
the OPA1662-Q1 op amp makes them a better choice for low source impedances of less than 1 kΩ.
The equation calculates total circuit noise, where:
• enis the voltage noise
• inis the current noise
• RSis the source impedance
k is Boltzmann’s constant = 1.38 × 1023 J/K
T is the temperature in Kelvins (K)
Figure 45. Noise Performance of the OPA1662-Q1 in Unity-Gain Buffer Configuration
J Fr E i T
R1
R2
EO
R1
R2
EO
RS
VS
RS
VS
A)NoiseinNoninvertingGainConfiguration
B)NoiseinInvertingGainConfiguration
Noiseattheoutput:
Wheree =
S4kTRS
4kTR1
4kTR2
=thermalnoiseofRS
=thermalnoiseofR1
=thermalnoiseofR2
e =
1
e =
2
Noiseattheoutput:
E =
O
21+ R2
R +R
1 S
R2
R +R
1 S
2 22
Wheree =
S4kTRS
4kTR1
4kTR2
=thermalnoiseofRS
=thermalnoiseofR1
=thermalnoiseofR2
e =
1
e =
2
R2
R +R
1 S
2
1+ R2
R1
1+ R2
R1
2
R2
R1
2
e +e +
1 2
2 2
E =
O
2e +
n
2es
2
e +e +
1 2
2 2 es
2
e +
n
2
16
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Feature Description (continued)
8.3.4 Basic Noise Calculations
Design of low-noise op amp circuits requires careful consideration of a variety of possible noise contributors:
noise from the signal source, noise generated in the op amp, and noise from the feedback network resistors. The
total noise of the circuit is the root-sum-square combination of all noise components.
The resistive portion of the source impedance produces thermal noise proportional to the square root of the
resistance. Figure 45 plots this equation. The source impedance is usually fixed; consequently, select the op
amp and the feedback resistors to minimize the respective contributions to the total noise.
Figure 46 illustrates both inverting and noninverting op amp circuit configurations with gain. In circuit
configurations with gain, the feedback network resistors also contribute noise. The current noise of the op amp
reacts with the feedback resistors to create additional noise components. The feedback resistor values can
generally be chosen to make these noise sources negligible. The equations for total noise are shown for both
configurations.
For the OPA1662-Q1 op amp at 1 kHz, en= 3.3 nV/Hz.
Figure 46. Noise Calculation in Gain Configurations
8.3.5 Total Harmonic Distortion Measurements
The OPA1662-Q1 op amp has excellent distortion characteristics. THD + noise is below 0.0006% (G = 1,
VO=3VRMS, BW = 80 kHz) throughout the audio frequency range, 20 Hz to 20 kHz, with a 2-kΩload (see
Figure 7 for characteristic performance).
The distortion produced by the OPA1662-Q1 op amp is below the measurement limit of many commercially
available distortion analyzers. However, a special test circuit (such as Figure 47 shows) can be used to extend
the measurement capabilities.
l TEXAS INSTRUMENTS \N J,
R2
OPA1662-Q1
R1
Signal Gain = 1+
Distortion Gain = 1+
R3V = 3 V
O RMS
Generator
Output
Analyzer
Input
Audio Precision
System Two(1)
with PC Controller
SIGNAL
GAIN
DISTORTION
GAIN R1R2R3
¥
4.99 kW
1 kW
4.99 kW
10 W
49.9 W
+1
-1
101
549 W4.99 kW49.9 W+10 110
101
R2
R1
R2
R II R
1 3
Load
17
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Op amp distortion can be considered an internal error source that can be referred to the input. Figure 47 shows a
circuit that causes the op amp distortion to be gained up (see the table in Figure 47 for the distortion gain factor
for various signal gains). The addition of R3to the otherwise standard noninverting amplifier configuration alters
the feedback factor or noise gain of the circuit. The closed-loop gain is unchanged, but the feedback available for
error correction is reduced by the distortion gain factor, thus extending the resolution by the same amount. The
input signal and load applied to the op amp are the same as with conventional feedback without R3. The value of
R3must be kept small to minimize its effect on the distortion measurements.
The validity of this technique can be verified by duplicating measurements at high gain or high frequency where
the distortion is within the measurement capability of the test equipment. Measurements for this data sheet were
made with an Audio Precision System Two distortion and noise analyzer, which greatly simplifies such repetitive
measurements. The measurement technique can, however, be performed with manual distortion measurement
instruments.
8.3.6 Capacitive Loads
The dynamic characteristics of the OPA1662-Q1 have been optimized for commonly encountered gains, loads,
and operating conditions. The combination of low closed-loop gain and high capacitive loads decreases the
phase margin of the amplifier and can lead to gain peaking or oscillations. As a result, heavier capacitive loads
must be isolated from the output. The simplest way to achieve this isolation is to add a small resistor (RSequal to
50 Ω, for example) in series with the output.
This small series resistor also prevents excess power dissipation if the output of the device becomes shorted.
Figure 25 illustrates a graph of Small-Signal Overshoot vs Capacitive Load for several values of RS. Also see
Applications Bulletin: Feedback Plots Define Op Amp AC Performance for details of analysis techniques and
application circuits.
(1) For measurement bandwidth, see Figure 7 through Figure 12.
Figure 47. Distortion Test Circuit
8.3.7 Electrical Overstress
Designers often ask questions about the capability of an operational amplifier to withstand electrical overstress.
These questions tend to focus on the device inputs, but may involve the supply voltage pins or even the output
pin. Each of these different pin functions have electrical stress limits determined by the voltage breakdown
characteristics of the particular semiconductor fabrication process and specific circuits connected to the pin.
Additionally, internal electrostatic discharge (ESD) protection is built into these circuits to protect them from
accidental ESD events both before and during product assembly.
It is helpful to have a good understanding of this basic ESD circuitry and its relevance to an electrical overstress
event. Figure 48 illustrates the ESD circuits contained in the OPA1662-Q1 (indicated by the dashed line area).
The ESD protection circuitry involves several current-steering diodes connected from the input and output pins
and routed back to the internal power-supply lines, where they meet at an absorption device internal to the
operational amplifier. This protection circuitry is intended to remain inactive during normal circuit operation.
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An ESD event produces a short duration, high-voltage pulse that is transformed into a short duration, high-
current pulse as it discharges through a semiconductor device. The ESD protection circuits are designed to
provide a current path around the operational amplifier core to prevent it from being damaged. The energy
absorbed by the protection circuitry is then dissipated as heat.
When an ESD voltage develops across two or more of the amplifier device pins, current flows through one or
more of the steering diodes. Depending on the path that the current takes, the absorption device may activate.
The absorption device internal to the OPA1662-Q1 triggers when a fast ESD voltage pulse is impressed across
the supply pins. Once triggered, it quickly activates, clamping the ESD pulse to a safe voltage level.
When the operational amplifier connects into a circuit such as that illustrated in Figure 48, the ESD protection
components are intended to remain inactive and not become involved in the application circuit operation.
However, circumstances may arise where an applied voltage exceeds the operating voltage range of a given pin.
If this condition occurs, there is a risk that some of the internal ESD protection circuits may be biased on, and
conduct current. Any such current flow occurs through steering diode paths and rarely involves the absorption
device.
Figure 48 depicts a specific example where the input voltage, VIN, exceeds the positive supply voltage (+VS) by
500 mV or more. Much of what happens in the circuit depends on the supply characteristics. If +VScan sink the
current, one of the upper input steering diodes conducts and directs current to +VS. Excessively high current
levels can flow with increasingly higher VIN. As a result, TI recommends that applications limit the input current to
10 mA.
If the supply is not capable of sinking the current, VIN may begin sourcing current to the operational amplifier, and
then take over as the source of positive supply voltage. The danger in this case is that the voltage can rise to
levels that exceed the operational amplifier absolute maximum ratings. In extreme but rare cases, the absorption
device triggers on while +VSand –VSare applied. If this event happens, a direct current path is established
between the +VSand –VSsupplies. The power dissipation of the absorption device is quickly exceeded, and the
extreme internal heating destroys the operational amplifier.
Another common question involves what happens to the amplifier if an input signal is applied to the input while
the power supplies +VSor –VSare at 0 V. Again, it depends on the supply characteristic while at 0 V, or at a
level below the input signal amplitude. If the supplies appear as high impedance, then the operational amplifier
supply current may be supplied by the input source through the current steering diodes. This state is not a
normal bias condition; the amplifier most likely will not operate normally. If the supplies are low impedance, then
the current through the steering diodes can become quite high. The current level depends on the ability of the
input source to deliver current, and any resistance in the input path.
If there is an uncertainty about the ability of the supply to absorb this current, external Zener diodes may be
added to the supply pins as shown in Figure 48.
The Zener voltage must be selected such that the diode does not turn on during normal operation. However, its
Zener voltage must be low enough so that the Zener diode conducts if the supply pin begins to rise above the
safe operating supply voltage level.
l TEXAS INSTRUMENTS
RF
Op-Amp
Core
RI
RL
V(1)
IN
ID
-In
Out
+In
ESD Current-
Steering Diodes
Edge-Triggered ESD
Absorption Circuit
+VS
+V
-V
-VS
OPA1662-Q1
RS
TVS
TVS
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(1) VIN = +VS+ 500 mV.
Figure 48. Equivalent Internal ESD Circuitry and Its Relation to a Typical Circuit Application (Single
Channel Shown)
8.4 Device Functional Modes
The OPA1662-Q1 has a single functional mode and is operational when the power-supply voltage is greater than
3 V (±1.5 V). The maximum power supply voltage for the OPA1662-Q1 is 36 V (±18 V).
l TEXAS INSTRUMENTS 820 Copyngm © 2me‘ Texas \nslmmems \nwrporaled
I L+
OUT
Audio DAC
with Differential
Current
Outputs
PCM1794A-Q1
OPA1662-Q1
8200 pF
100 W
I L-
OUT
OPA1662-Q1
0.1 Fm
2200 pF
820 W
0.1 Fm
2700 pF
-VA
( 15 V)-
+VA
(+15 V)
680 W620 W
330 W
-VA
( 15 V)-
+VA
(+15 V)
0.1 Fm
0.1 Fm
330 W2700 pF
OPA1662-Q1
0.1 Fm
2200 pF
820 W
0.1 Fm
-VA
( 15 V)-
+VA
(+15 V) 680 W620 W
L Ch
Output
R1
R1 R2
R2
R3 C2
C1
C2
VO
R3
C
R
Copyright © 2016, Texas Instruments Incorporated
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The OPA1662-Q1 is a unity-gain stable, precision dual op amp with very low noise. Applications with noisy or
high-impedance power supplies require decoupling capacitors close to the device pins. In most cases, 0.1-µF
capacitors are adequate. Figure 43 shows a simplified schematic of the OPA1662-Q1 (one channel shown) while
Figure 49 shows an additional application idea.
9.2 Typical Application
Figure 49. Audio DAC Current to Voltage Converter and Output Filter
l TEXAS INSTRUMENTS 1+ 2n}? Rst 2 R1// 2// 3 m ;
Fo
R R C C
1
2
2 2 3 1 2
wo = p =
C
Q R R R R R C
1 1
1/ / 2 / / 3 2
2 3 2
= ´
S S
QQ
2
2
1+ +
wo wo
R R C S R R C C S
R R R
2
2 3
1 2 2 2 3 1 2
1/ / 2 / / 3
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RC S R R C C S
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2
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æ ö
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21
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Typical Application (continued)
9.2.1 Design Requirements
Table 1 lists the design parameters for this example.
Table 1. Design Parameters
PARAMETER EXAMPLE VALUE
Supply voltage ±15 V to ±36 V
Differential input currents 0 mA to 30 mA
Resistors value tolerance 1%
Ceramic capacitor XR5 or XR7 50 V
9.2.2 Detailed Design Procedure
This circuit is designed for converting differential input current into a single ended output voltage. The resistor
values are chosen to be relatively low for minimizing the total circuit noise. The filtering capacitors are chosen to
maintain adequate bandwidth from 10 Hz to 20 kHz for audio signals.
The first stage converts the audio DAC output current into a voltage with a gain calculated by Equation 1:
where
R = 820 Ω
C = 2200 pF
S is Laplace variable (1)
RC filters the audio DAC output ripple and cutoff frequency = = 80 KHz
The second differential stage transfer function is calculated by Equation 2:
(2)
The denominator of this transfer function is a quadratic equation and the
general form is calculated by Equation 3:
where
ωo = 2πFo is the resonance frequency
and Q is the quality factor (3)
The gain peak depends on the quality factor in Equation 4:
(4)
The resonance frequency is calculated by Equation 5:
(5)
These equations help to maintain adequate bandwidth and keep the differential gain flat so the quality factor is
from 0.7 to 1. The resonance frequency must be at least twice the desired bandwidth.
The chosen components give a quality factor of 0.89 and a resonance frequency of 53 KHz.
l TEXAS INSTRUMENTS v0 R R3 1 R1// 2// 3 RR3 D 7 R1 Teksmu fl ] TEkSWD [ ' a 9 cm ka m Pk Pk .4qu .4qu m2 Wk u.) vk Vk .w .w + 01ka Pk . mm,” 3 92 v 1 ~14 v 2 un m cm mm mm, Iaqakm cm Suumv my: my.» “Mm.“ A an \ zuumv an summ' «,Lwa 300qu WW; A an \ mum» m Hun w Nlul2016 m ‘nnv , m... me Im bu °' 21'2n'59 W bn °; zz-zx-zfi
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22
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The overall transfer function is shown in Equation 6:
(6)
The and is 398 mV/mA.
The poles are at 53 KHz and 80 KHz.
9.2.3 Application Curves
CH1 = positive input current IOUTL+ = 1.5 V / 150 Ω
CH2 = negative input current IOUTL– = 1.5 V / 150 Ω
CH3 = output single-ended voltage
Figure 50. Output Voltage at 10 mApp and 10 Hz
CH1 = positive input current IOUTL+ = 1.5 V / 150 Ω
CH2 = negative input current IOUTL– = 1.5 V / 150 Ω
CH3 = output single-ended voltage
Figure 51. Output Voltage at 10 mApp and 20 KHz
10 Power Supply Recommendations
The OPA1662-Q1 is specified for operation from 3 V to 36 V (±1.5 V to 18 V) and at an ambient operating
temperature from –40°C to 85°C. Parameters that can exhibit significant variance with regard to operating
voltage or temperature are presented in Typical Characteristics.
11 Layout
11.1 Layout Guidelines
The OPA1662-Q1 is a unity-gain stable, precision dual op amp with very low noise. To realize the full operational
performance of the device, good high-frequency printed-circuit board (PCB) layout practices are required. Low-
loss, 0.1-µF bypass capacitors must be connected between each supply pin and ground as close to the device
as possible. The bypass capacitor traces must be designed for minimum inductance.
l TEXAS INSTRUMENTS
0.1 PF
8
7
6
5
1
2
3
4
0.1 PF
GND plan
23
OPA1662-Q1
www.ti.com
SLOS805C –JULY 2012REVISED AUGUST 2016
Product Folder Links: OPA1662-Q1
Submit Documentation FeedbackCopyright © 2012–2016, Texas Instruments Incorporated
11.2 Layout Example
Figure 52. Layout Recommendation
11.3 Power Dissipation
The OPA1662-Q1 op amp is capable of driving 2-kΩloads with a power-supply voltage up to ±18 V and full
operating temperature range. Internal power dissipation increases when operating at high supply voltages.
Copper leadframe construction used in the OPA1662-Q1 op amp improves heat dissipation compared to
conventional materials. Circuit board layout can also help minimize junction temperature rise. Wide copper traces
help dissipate the heat by acting as an additional heat sink. Temperature rise can be further minimized by
soldering the devices to the circuit board rather than using a socket.
l TEXAS INSTRUMENTS
24
OPA1662-Q1
SLOS805C –JULY 2012REVISED AUGUST 2016
www.ti.com
Product Folder Links: OPA1662-Q1
Submit Documentation Feedback Copyright © 2012–2016, Texas Instruments Incorporated
12 Device and Documentation Support
12.1 Documentation Support
12.1.1 Related Documentation
For related documentation see the following:
Applications Bulletin: Feedback Plots Define Op Amp AC Performance (SBOA015)
A High-Power High-Fidelity Headphone Amplifier for Current Output Audio DACs Reference Design
(TIDU672)
12.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
12.3 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.4 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
12.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.6 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
I TEXAS INSTRUMENTS Sample: Sample:
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead finish/
Ball material
(6)
MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
OPA1662AIDGKRQ1 ACTIVE VSSOP DGK 8 2500 RoHS & Green NIPDAUAG Level-2-260C-1 YEAR -40 to 85 OUUI
OPA1662AIDRQ1 ACTIVE SOIC D 8 2500 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 O1662Q
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6) Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
I TEXAS INSTRUMENTS
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
Addendum-Page 2
OTHER QUALIFIED VERSIONS OF OPA1662-Q1 :
Catalog: OPA1662
NOTE: Qualified Version Definitions:
Catalog - TI's standard catalog product
I TEXAS INSTRUMENTS ‘3‘ V.'
PACKAGE MATERIALS INFORMATION
www.ti.com 3-Jun-2022
TAPE AND REEL INFORMATION
Reel Width (W1)
REEL DIMENSIONS
A0
B0
K0
W
Dimension designed to accommodate the component length
Dimension designed to accommodate the component thickness
Overall width of the carrier tape
Pitch between successive cavity centers
Dimension designed to accommodate the component width
TAPE DIMENSIONS
K0 P1
B0 W
A0
Cavity
QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE
Pocket Quadrants
Sprocket Holes
Q1 Q1Q2 Q2
Q3 Q3Q4 Q4 User Direction of Feed
P1
Reel
Diameter
*All dimensions are nominal
Device Package
Type Package
Drawing Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0
(mm) B0
(mm) K0
(mm) P1
(mm) W
(mm) Pin1
Quadrant
OPA1662AIDGKRQ1 VSSOP DGK 8 2500 330.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1
OPA1662AIDRQ1 SOIC D 8 2500 330.0 12.4 6.4 5.2 2.1 8.0 12.0 Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 3-Jun-2022
TAPE AND REEL BOX DIMENSIONS
Width (mm)
W
L
H
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
OPA1662AIDGKRQ1 VSSOP DGK 8 2500 366.0 364.0 50.0
OPA1662AIDRQ1 SOIC D 8 2500 356.0 356.0 35.0
Pack Materials-Page 2
‘J
www.ti.com
PACKAGE OUTLINE
C
.228-.244 TYP
[5.80-6.19]
.069 MAX
[1.75]
6X .050
[1.27]
8X .012-.020
[0.31-0.51]
2X
.150
[3.81]
.005-.010 TYP
[0.13-0.25]
0 - 8 .004-.010
[0.11-0.25]
.010
[0.25]
.016-.050
[0.41-1.27]
4X (0 -15 )
A
.189-.197
[4.81-5.00]
NOTE 3
B .150-.157
[3.81-3.98]
NOTE 4
4X (0 -15 )
(.041)
[1.04]
SOIC - 1.75 mm max heightD0008A
SMALL OUTLINE INTEGRATED CIRCUIT
4214825/C 02/2019
NOTES:
1. Linear dimensions are in inches [millimeters]. Dimensions in parenthesis are for reference only. Controlling dimensions are in inches.
Dimensioning and tolerancing per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed .006 [0.15] per side.
4. This dimension does not include interlead flash.
5. Reference JEDEC registration MS-012, variation AA.
18
.010 [0.25] C A B
5
4
PIN 1 ID AREA
SEATING PLANE
.004 [0.1] C
SEE DETAIL A
DETAIL A
TYPICAL
SCALE 2.800
Yl“‘+
www.ti.com
EXAMPLE BOARD LAYOUT
.0028 MAX
[0.07]
ALL AROUND
.0028 MIN
[0.07]
ALL AROUND
(.213)
[5.4]
6X (.050 )
[1.27]
8X (.061 )
[1.55]
8X (.024)
[0.6]
(R.002 ) TYP
[0.05]
SOIC - 1.75 mm max heightD0008A
SMALL OUTLINE INTEGRATED CIRCUIT
4214825/C 02/2019
NOTES: (continued)
6. Publication IPC-7351 may have alternate designs.
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
METAL SOLDER MASK
OPENING
NON SOLDER MASK
DEFINED
SOLDER MASK DETAILS
EXPOSED
METAL
OPENING
SOLDER MASK METAL UNDER
SOLDER MASK
SOLDER MASK
DEFINED
EXPOSED
METAL
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE:8X
SYMM
1
45
8
SEE
DETAILS
SYMM
www.ti.com
EXAMPLE STENCIL DESIGN
8X (.061 )
[1.55]
8X (.024)
[0.6]
6X (.050 )
[1.27] (.213)
[5.4]
(R.002 ) TYP
[0.05]
SOIC - 1.75 mm max heightD0008A
SMALL OUTLINE INTEGRATED CIRCUIT
4214825/C 02/2019
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
SOLDER PASTE EXAMPLE
BASED ON .005 INCH [0.125 MM] THICK STENCIL
SCALE:8X
SYMM
SYMM
1
45
8
MECHANICAL DATA DGK (S—PDSO—GS) PLASTIC SMALL—OUTLINE PACKAGE m1 WW“: {[0 VAX % j 3,010 I 4073329/E 05/06 NO'ES' A AH imec' dimensmrs c'e m m'hmeiers 5 Th: drawing is enmec: :e change within: nciice. Body icnqth Coos mi mciucc maid Hash, protrusions or we tms Mom 'iush, aromons, ov qaw burrs shaH m exceed 015 per end b Budy mm does not wcude inierieud flasi‘ inieriead ‘iush s'mii 'mi exceed 050 pe' we : FuHs wiUHn JEDEC M0487 quulion AA, except 'vievieud ricer INSTRUMENTS w. (i. com
LAND PATTERN DATA DGK (37PD30708) PLASTIC SMALL OUTLINE PACKAGE Exampie Board Layout Exampie stencii Openings Based on a stencii thickness of .127mm L005inch), (See Nate 0) (,0 65) TYP ‘ Li 5 LLLLL L, pm ,,,,, PKG PKG "\ i i 4 — ----- i — ----- i D DU D i i ’ PKG PKG Q G . / Exampie , Non Soldermusk Defined Pad i , , —\ L A ~/ ‘\ Example \ Spider Musk Opening / +1 1‘(0,45) ‘ (See Note E) t 1 (1,45) < ‘="" \pud="" geometry="" ’="" (see="" note="" c)="" \="" +ii¢="" (0,05)="" \="" ah="" around="" «="" ,="" \="" e="" ’="" i="" ‘\-=""> muss/A 11/13 NOTES: A. Ali iinear dimensions are in miilimeters. a. This drawing is subject ta change without natiee, C, Publication |PCi7351 is recommended ior alternate designsu a. Laser cutting apertures with trapezoidui walls and aisa rounding corners w‘iH ofler eetter paste veiease. Customers snouid Contact their board ussembiy site for stencii design recommendations. Rater tn IFS—7525 for other slenci'i recummendutions. Customers should Contact their tmurd fabrication site for solder musk tolerances between and around signal pads. .r'I {I TEXAS INSTRUMENTS www.li.com
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