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|The AUP family is TI's premier solution to the industry’s low-power needs in battery-powered portable applications. This family ensures a very low static and dynamic power consumption across the entire VCC range of 0.8 V to 3.6 V, resulting in an increased battery life. This product also maintains excellent signal integrity.
The SN74AUP2G125 is a dual bus buffer gate designed for 0.8-V to 3.6-V VCC operation. This device features dual line drivers with 3-state outputs. Each output is disabled when the corresponding output-enable (OE) input is high. This device has the input-disable feature, which allows floating input signals.
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
|Extends battery life for portable applications
Can interface with next generation processors
Excellent signal integrity and low noise
WCSP is 70% smaller than SC-70, which makes it ideal for space constrained PCBs
|Available in the Texas Instruments NanoFree™ Package
Low Static-Power Consumption
(ICC = 0.9 µA Max)
Low Dynamic-Power Consumption
(Cpd = 4 pF Typ at 3.3 V)
Low Input Capacitance (CI = 1.5 pF Typ)
Low Noise – Overshoot and Undershoot
<10% of VCC
Input-Disable Feature Allows Floating Input Conditions
Ioff Supports Partial-Power-Down Mode Operation
Input Hysteresis Allows Slow Input Transition and Better Switching Noise Immunity at Input
Wide Operating VCC Range of 0.8 V to 3.6 V
Optimized for 3.3-V Operation
3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation
tpd = 4.6 ns Max at 3.3 V
Suitable for Point-to-Point Applications
Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
ESD Performance Tested Per JESD 22
- 2000-V Human-Body Model (A114-B, Class II)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)
Notebook and Sub-Notebook PCs