Omron's electroforming technology allows designers of test fixtures and integrated chip testing the ability to reduce size and weight of test points by eliminating current pin design construction which consists of four separate piece parts to make up one pin. Omron's electroforming pin probe is a one piece construction whereby separating the spring and relay achieves a stable resistance and greater durability than traditional industry construction.
- Achieves the functions of four parts with one part
- Separating the spring and relay achieves a stable resistance and greater durability
- The electroformed probe pins use a flat structure. This allows you to position the pins at any angle